AD569
REV. A
–3–
AC PERFORMANCE CHARACTERISTICS
These characteristics are included for Design Guidance Only and are not subject to test.
+V
S
= +12 V; –V
S
= –12 V; +V
REF
= +5 V; –V
REF
= –5 V excepts where stated.
Parameter Limit Units Test Conditions/Comments
Output Voltage Settling 5 µs max No Load Applied
(Time to ±0.001% FS 3 µs typ (DAC output measured from falling edge of
LDAC.)
For FS Step) 6 µs max V
OUT
Load = 1 k, C
LOAD
= 1000 pF.
4 µs typ (DAC output measured from falling edge of LDAC. )
Digital-to-Analog Glitch 500 nV-sec typ Measured with V
REF
= 0 V. DAC registers alternatively loaded
Impulse with input codes of 8000
H
and 0FFF
H
(worst-case
transition). Load = 1 k.
Multiplying Feedthrough –100 dB max +V
REF
= 1 V rms 10 kHz sine wave,
–V
REF
= 0 V
Output Noise Voltage 40 nV/ÏHz typ Measured between V
OUT
and –V
REF
Density (1 kHz-1 MHz)
TIMING CHARACTERISTICS
(+V
S
= +12 V, –V
S
= –12 V, V
IH
= 2.4 V, V
IL
= 0.4 V,T
MIN
to T
MAX
)
Parameter Limit Units Test Conditions/Comments
Case A 150 ns Pulse on HBE, LBE, and LDAC
T
HS
= 140 ns min, T
HH
= 10 ns min
t
WC
120 ns min CS Pulse Width
t
SC
60 ns min CS Data Setup Time
t
HC
20 ns min CS Data Hold Time
Case B None
t
WB
70 ns min HBE, LBE Pulse Width
t
SB
80 ns min HBE, LBE Data Setup Time
t
HB
20 ns min HBE, LBE Data Hold Time
t
SCS
120 ns min CS Setup Time
t
HCS
10 ns min CS Hold Time
t
WD
120 ns min LDAC Pulse Width
Case C None
t
WB
120 ns min HBE, LBE Pulse Width
t
SB
80 ns min HBE, LBE Data Setup Time
t
HB
20 ns min HBE, LBE Data Hold Time
t
SCS
120 ns min CS Setup Time
t
HCS
10 ns min CS Hold Time
Figure 2a. AD569 Timing Diagram – Case B
Figure 2b. AD569 Timing Diagram – Case C
Figure 1. AD569 Timing Diagram – Case A
AD569
REV. A
–4–
ABSOLUTE MAXIMUM RATINGS*
(T
A
= +25°C unless otherwise noted)
+V
S
(Pin 1) to GND (Pin 18) . . . . . . . . . . . . . . +18 V, –0.3 V
–V
S
(Pin 28) to GND (Pin 18) . . . . . . . . . . . . . . –18 V, +0.3 V
+V
S
(Pin 1) to –V
S
(Pin 28) . . . . . . . . . . . . . . . +26.4 V, –0.3 V
Digital Inputs
(Pins 4-14, 19-27) to GND (Pin 18) . . . . . . . . . +V
S
, –0.3 V
+V
REF
Force (Pin 3) to +V
REF
Sense (Pin 2) . . . . . . . . ±16.5 V
–V
REF
Force (Pin 15) to –V
REF
Sense (Pin 16) . . . . . . . ±16.5 V
V
REF
Force (Pins 3, 15) to GND (Pin 18) . . . . . . . . . . . . . ±V
S
V
REF
Sense (Pins 2, 16) to GND (Pin 18) . . . . . . . . . . . . . ±V
S
V
OUT
(Pin 17) . . . . . . . . . . . . . . . . . . Indefinite Short to GND
. . . . . . . . . . . . . . . . . . . . . . . . Momentary Short to +V
S,
–V
S
Power Dissipation (Any Package) . . . . . . . . . . . . . . . 1000 mW
Operating Temperature Range
Commercial Plastic (JN, KN, JP, KP Versions) 0°C to +70°C
Industrial Ceramic (AD, BD Versions) . . . .–25°C to +85°C
Extended Ceramic (SD Versions) . . . . . . . –55°C to +125°C
Storage Temperature . . . . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature Range (Soldering, 10 secs) . . . . . . . +300°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
ESD SENSITIVITY
The AD569 features input protection circuitry consisting of large “distributed” diodes and polysilicon
series resistors to dissipate both high-energy discharges (Human Body Model) and fast, low-energy
pulses (Charged Device Model). Per Method 3015.2 of MIL-STD-883C, the AD569 has been
classified as a Category A device.
Proper ESD precautions are strongly recommended to avoid functional damage or performance
degradation. Charges as high as 4000 volts readily accumulate on the human body and test equipment
and discharge without detection. Unused devices must be stored in conductive foam or shunts, and
the foam should be discharged to the destination socket before devices are removed. For further
information on ESD precautions, refer to Analog Devices’ ESD Prevention Manual.
PIN DESIGNATIONS
ORDERING GUIDE
Integral Nonlinearity Differential Nonlinearity Temperature Package
Model
1
+258CT
MIN
–T
MAX
+258CT
MIN
–T
MAX
Range Option
2
AD569JN ±0.04% ±0.04% ±1 LSB ±1 LSB 0°C to +70°C N-28
AD569JP ±0.04% ±0.04% ±1 LSB ±1 LSB 0°C to +70°C P-28A
AD569KN ±0.024% ±0.024% ±1/2 LSB ±1 LSB 0°C to +70°C N-28
AD569KP ±0.024% ±0.024% ±1/2 LSB ±1 LSB 0°C to +70°C P-28A
AD569AD ±0.04% ±0.04% ±1 LSB ±1 LSB –25°C to +85°C D-28
AD569BD ±0.024% ±0.024% ±1/2 LSB ±1 LSB –25°C to +85°C D-28
AD569SD ±0.04% ±0.04% ±1 LSB ±1 LSB –55°C to +125°C D-28
NOTES
1
For details on grade and package offerings screened in accordance with MIL-STD-883, refer to the Analog Devices Military Products Databook
or current AD569/883B data sheet.
2
D = Ceramic DIP; N = Plastic DIP; P = Plastic Leaded Chip Carrier.
WARNING!
ESD SENSITIVE DEVICE
AD569
REV. A
–5–
Figure 3. AD569 Block Diagram
FUNCTIONAL DESCRIPTION
The AD569 consists of two resistor strings, each of which is di-
vided into 256 equal segments (see Figure 3). The 8 MSBs of
the digital input word select one of the 256 segments on the first
string. The taps at the top and bottom of the selected segment
are connected to the inputs of the two buffer amplifiers A1 and
A2. These amplifiers exhibit extremely high CMRR and low
bias current, and thus accurately preserve the voltages at the top
and bottom of the segment. The buffered voltages from the seg-
ment endpoints are applied across the second resistor string,
where the 8LSBs of the digital input word select one of the 256
taps. Output amplifier A3 buffers this voltage and delivers it to
the output.
Buffer amplifiers A1 and A2 leap-frog up the first string to pre-
serve monotonicity at the segment boundaries. For example,
when increasing the digital code from 00FF
H
to 0100
H
, (the first
segment boundary), A1 remains connected to the same tap on
the first resistor, while A2 jumps over it and is connected to the
tap which becomes the top of the next segment. This design
guarantees monotonicity even if the amplifiers have offset volt-
ages. In fact, amplifier offset only contributes to integral linear-
ity error.
CAUTION
It is generally considered good engineering practice to avoid
inserting integrated circuits into powered-up sockets. This
guideline is especially important with the AD569. An empty,
powered-up socket configures external buffer amplifiers in an
open-loop mode, forcing their outputs to be at the positive or
negative rail. This condition may result in a large current surge
between the reference force and sense terminals. This current
surge may permanently damage the AD569.
ANALOG CIRCUIT DETAILS
MONOTONICITY: A DAC is monotonic if the output either
increases or remains constant for increasing digital inputs. All
versions of the AD569 are monotonic over their full operating
temperature range.
DIFFERENTIAL NONLINEARITY: DNL is the measure of
the change in the analog output, normalized to full scale, associ-
ated: with a 1 LSB change in the digital input code. Monotonic
behavior requires that the differential linearity error be less than
1 LSB over the temperature range of interest. For example, for a
±5 V output range, a change of 1 LSB in digital input code
should result in a 152 µV change in the analog output (1 LSB =
10 V/65,536). If the change is actually 38 µV, however, the dif-
ferential linearity error would be –114 µV, or –3/4 LSB. By leap-
frogging the buffer amplifier taps on the first divider, a typical
AD569 keeps DNL within ±38 µV (±1/4 LSB) around each of
the 256 segment boundaries defined by the upper byte of the in-
put word (see Figure 5). Within the second divider, DNL also
typically remains less than ±38 µV as shown in Figure 6. Since
the second divider is independent of absolute voltage, DNL is
the same within the rest of the 256 segments.
OFFSET ERROR: The difference between the actual analog
output and the ideal output (–V
REF
), with the inputs loaded with
all zeros is called the offset error. For the AD569, Unipolar Off-
set is specified with 0 V applied to –V
REF
and Bipolar Offset is
specified with –5 V applied to –V
REF
. Either offset is trimmed by
adjusting the voltage applied to the –V
REF
terminals.
BIPOLAR ZERO ERROR: The deviation of the analog output
from the ideal half-scale output of 0.0000 V when the inputs are
loaded with 8000
H
is called the Bipolar Zero Error. For the
AD569, it is specified with ±5 V applied to the reference
terminals.
Definitions
LINEARITY ERROR: Analog Devices defines linearity error as
the maximum deviation of the actual, adjusted DAC output
from the ideal output (a straight line drawn from 0 to FS–1LSB)
for any bit combination. The AD569’s linearity is primarily lim-
ited by resistor uniformity in the first divider (upper byte of
16-bit input). The plot in Figure 4 shows the AD569’s typical
linearity error across the entire output range to be within
±0.01% of full scale. At 25°C the maximum linearity error for
the AD569JN, AD and SD grades is specified to be ±0.04%,
and ±0.024% for the KN and BD versions.
Figure 4. Typical Linearity

AD569JP-REEL

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Digital to Analog Converters - DAC IC MONO 16-BIT
Lifecycle:
New from this manufacturer.
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