74HC_HCT164_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 16 August 2013 9 of 18
NXP Semiconductors
74HC164-Q100; 74HCT164-Q100
8-bit serial-in, parallel-out shift register
[1] t
pd
is the same as t
PHL
and t
PLH
.
[2] t
t
is the same as t
THL
and t
TLH
.
[3] C
PD
is used to determine the dynamic power dissipation (P
D
in W):
P
D
=C
PD
V
CC
2
f
i
N+ (C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= output load capacitance in pF;
V
CC
= supply voltage in V;
N = number of inputs switching;
(C
L
V
CC
2
f
o
) = sum of outputs.
t
h
hold time DSA, and DSB to CP;
see Figure 9
V
CC
= 4.5 V +4 2- 4 - 4 - ns
f
max
maximum
frequency
for Cp, see Figure 7
V
CC
= 4.5 V 27 55 - 22 - 18 - MHz
V
CC
= 5.0 V; C
L
=15pF - 61 - - - - - MHz
C
PD
power
dissipation
capacitance
per package;
V
I
=GNDtoV
CC
1.5 V
[3]
-40- - - - - pF
Table 7. Dynamic characteristics …continued
GND = 0 V; t
r
= t
f
= 6 ns; C
L
= 50 pF; test circuit, see Figure 10; unless otherwise specified
Symbol Parameter Conditions 25 C 40 C to +85 C 40 C to +125 C Unit
Min Typ Max Min Max Min Max
(1) Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 7. Waveforms showing the clock (CP) to output (Qn) propagation delays, the clock pulse width, the output
transition times and the maximum clock frequency
001aal392
CP input
Qn
output
t
PHL
t
PLH
t
THL
t
TLH
t
W
V
OH
V
I
GND
V
OL
V
M
V
M
V
X
V
Y
1/f
max
Table 8. Measurement points
Type Input Output
V
M
V
M
V
X
V
Y
74HC164-Q100 0.5V
CC
0.5V
CC
0.1V
CC
0.9V
CC
74HCT164-Q100 1.3 V 1.3 V 0.1V
CC
0.9V
CC
74HC_HCT164_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 16 August 2013 10 of 18
NXP Semiconductors
74HC164-Q100; 74HCT164-Q100
8-bit serial-in, parallel-out shift register
(1) Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 8. Waveforms showing the master reset (MR) pulse width, the master reset to output (Qn) propagation
delays and the master reset to clock (CP) removal time
001aac427
MR input
CP input
Qn output
t
PHL
t
W
f
rec
V
M
V
I
GND
V
I
V
OH
V
OL
GND
V
M
V
M
(1) Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
The shaded areas indicate when the input is permitted to change for predictable output performance.
Fig 9. Waveforms showing the data set-up and hold times for Dn inputs
001aac428
GND
GND
t
h
t
su
t
h
t
su
V
M
V
M
V
M
V
I
V
OH
V
OL
V
I
Qn output
CP input
Dn input
74HC_HCT164_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 16 August 2013 11 of 18
NXP Semiconductors
74HC164-Q100; 74HCT164-Q100
8-bit serial-in, parallel-out shift register
Test data is given in Table 9.
Definitions test circuit:
R
T
= termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= load capacitance including jig and probe capacitance.
Fig 10. Test circuit for measuring switching times
001aah768
t
W
t
W
t
r
t
r
t
f
V
M
V
I
negative
pulse
GND
V
I
positive
pulse
GND
10 %
90 %
90 %
10 %
V
M
V
M
V
M
t
f
V
CC
DUT
R
T
V
I
V
O
C
L
G
Table 9. Test data
Type Input Load Test
V
I
t
r
, t
f
C
L
74HC164-Q100 V
CC
6.0 ns 15 pF, 50 pF t
PLH
, t
PHL
74HCT164-Q100 3.0 V 6.0 ns 15 pF, 50 pF t
PLH
, t
PHL

74HCT164PW-Q100J

Mfr. #:
Manufacturer:
Nexperia
Description:
Counter Shift Registers 74HCT164PW-Q100/TSSOP14/REEL 1
Lifecycle:
New from this manufacturer.
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