DLW21SZ491XQ2L

Spec No. JEFL243C-9115B-01 P1/10
MURATA MFG.CO., LTD
Reference Only
Chip Common Mode Choke Coil
DLW21SZ□□□XQ2 Reference Specification [AEC-Q200]
1. Scope
This reference specification applies to Chip Common Mode Choke Coil DLW21SZ_XQ Series for Automotive Electronics
based on AEC-Q200 except for Power train and Safety.
2. Part Numbering
(ex.) DL W 21 S Z 261 X Q 2 L
(1) (2) (3) (4) (5) (6) (7) (8) (9) (10)
(1) Chip Common Mode Choke Coil
(2) Structure (W : Winding Type)
(3) Dimension (L×W)
(4) Type
(5) Category
3. Rating
Customer
Part Number
Murata
Part Number
Common Mode Impedance
(at 100MHz,Under Standard
Testing Condition)
(*1) Refer to below comment
Rated
Voltage
V(DC)
(*1)
Withstanding
Voltage
V(DC)
(*1)
Rated
Current
(mA)
(*1)
DC
Resistance
(Ω max.)
(*1)
Insulation
Resistance
(MΩ min.)
(*1)
ESD
Rank
2:2kV
DLW21SZ181XQ2L
180 Ω ± 25%
20 50
240 0.39
10
2
DLW21SZ181XQ2B
DLW21SZ261XQ2L
260 Ω ± 25%
220 0.59
DLW21SZ261XQ2B
DLW21SZ491XQ2L
490 Ω ± 25% 200 0.77
DLW21SZ491XQ2B
Operating Temperature : -40 to +105°C Storage Temperature : -40 to +105°C
(*) Standard Testing Condition
<
Unless otherwise specified> <In case of doubt>
Temperature : Ordinary Temperature 15 to 35°C Temperature : 20 ± 2°C
Humidity : Ordinary Humidity 25 to 85%(RH) Humidity : 60 to 70%(RH)
Atmospheric Pressure : 86 to106kPa
4. Style and Dimensions
Equivalent Circuits
Unit Mass (Typical value)
0.011g
5. Marking
No Marking.
(1)
(4)
(2)
(3)
No polarity
(6) Impedance (Typ. at 100MHz)
(7) Circuit
(8) Features
(9) Number of Line
(10) Packaging Code L : Taping (
Φ180mm/reel)
B : Bulk
2.0±0.2
1.2±0.2
(0.45)
(1)
(2)
(3)
(4)
(0.4)
(0.4)
(0.45)
(0.17)
1.2±0.2
:
Electrode
() : Reference Value
(in mm)
Spec No. JEFL243C-9115B-01 P2/10
MURATA MFG.CO., LTD
Reference Only
6. Electrical Performance
No. Item Specification Test Method
6.1 Common Mode
Impedance
(Zc)
Meet item 3. Measuring Equipment : KEYSIGHT 4291A or the
equivalent
Measuring Frequency: 100±1MHz (ref.item 8)
6.2 Withstanding
Voltage
Products shall not be damaged. Test Voltage : 2.5 times for Rated Voltage
Time : 1 to 5 seconds
Charge Current : 1 mA max. (ref.item 8)
6.3
DC Resistance
(Rdc)
Meet item 3.
Measuring current : 100mA max. (ref.item 8)
(In case of doubt in the above mentioned standard
condition, measure by 4 terminal method.)
6.4 Insulation
Resistance (I.R.)
Measuring voltage : Rated Voltage
Measuring time : 1 minute max. (ref.item 8)
7. Q200 Requirement
7-1. Performance (based on Table 13 for Ferrite EMI SUPPRESSORS/FILTERS)
AEC-Q200 Rev.D issued June 1. 2010
AEC-Q200
Murata Specification / Deviation
No.
Stress Test Method
3
High
Temperature
Exposure
1000hours at 105 deg C
Set for 24hours at room
temperature, then measured.
Meet Table A after testing.
Table A
4 Temperature Cycling 1000cycles
-55 deg C to +105 deg C
Set for 24hours at room
temperature, then measured.
-40 deg C to +105 deg C
Meet Table A after testing.
5
Destructive
Physical Analysis
Per EIA469
No electrical tests
Not Applicable
7 Biased Humidity 1000hours at 85 deg C,
85%RH
Apply max rated current.
Meet Table A after testing.
(ref.item 8)
8 Operational Life
A
pply 105 deg C
1000hours
Set for 24hours at room
temperature, then measured
Meet Table A after testing.
Apply rated current.
(ref.item 8)
9 External Visual Visual inspection No abnormalities
10 Physical Dimension
Meet ITEM 4
Style and Dimensions
No defects
12 Resistance to Solvents
Per MIL-STD-202 Method
215
Not Applicable
13 Mechanical Shock
Per MIL-STD-202 Method
213
Condition F:
1500g’s(14.7N)/0.5ms/
Half sine
Meet Table A after testing.
Appearance
No damaged
Common Mode
Impedance
Change
within ±20%
I.R.
10MΩ min.
Withstanding
Voltage
No damaged
Spec No. JEFL243C-9115B-01 P3/10
MURATA MFG.CO., LTD
Reference Only
AEC-Q200
Murata Specification / Deviation
No.
Stress Test Method
14
V
ibration
5g's(0.049N) for 20 minutes,
12cycles each of 3 oritentations
T
est from 10-2000Hz.
12cycles each of 3 orientations
Meet Table A after testing.
15 Resistance
to Soldering Heat
No-heating
Solder temperature
2
60C+/-5 deg C
Immersion time 10s
Pre-heating150 to 180C / 90±30s
Meet Table A after testing.
17 ESD
Per AEC-Q200-002
Meet Table A after testing.
ESD Rank: Refer to Item 3. Rating.
18 Solderbilit
y
Per J-STD-002
Method b : Not Applicable
95% of the terminations is to be soldered.
(except partly-exposed wire)
Flux:Ethanol solution of rosin,25(wt)% includes activator equivalent to
0.06 to 0.10(wt)% chlorine
19 Electrical
Characterization
Measured :
Common mode Inductance
No defects
20 Flammabilit
y
Per UL-94
Not Applicable
21 Board Flex
Epoxy-PCB(1.6mm)
Deflection 2mm(min)
60 sec minimum holding time
Meet Table A after testing.
22
T
erminal Strength
Per AEC-Q200-006
force of 17.7N
f
or 60sec
10N for 30s
No defects
30 Electrical
T
ransient
Conduction
Per ISO-7637-2
Not Applicable
8. Terminal to be Tested.
When measuring and suppling the voltage, the following terminal is applied.
No. Item Terminal to be Tested
8.1 Common Mode Impedance
(Measurement Terminal)
8.2 Withstanding Voltage
(Measurement Terminal)
8.3 DC Resistance
(Measurement Terminal)
8.4 Insulation Resistance
(Measurement Terminal)
8.5 Operational Life
(Supply Terminal)
Terminal
Terminal
Terminal
Terminal
Terminal
Terminal
Terminal
Terminal
Terminal
Terminal

DLW21SZ491XQ2L

Mfr. #:
Manufacturer:
Description:
Common Mode Chokes Dual 490Ohm 100MHz 190mA 770mOhm DCR SMD Automotive
Lifecycle:
New from this manufacturer.
Delivery:
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