13
ATF1502AS(L)
0995J–PLD–09/02
Notes: 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
2. I
CC3
refers to the current in the reduced-power mode when macrocell reduced-power is turned on.
DC and AC Operating Conditions
Commercial Industrial
Operating Temperature (Ambient) 0°C-70°C-40°C-85°C
V
CC
(5V) Power Supply 5V ±5% 5V ± 10%
DC Characteristics
Symbol Parameter Condition Min Typ Max Units
I
IL
Input or I/O Low
Leakage Current
V
IN
=V
CC
-2 -10 µA
I
IH
Input or I/O High
Leakage Current
210
I
OZ
Tri-state Output
Off-state Current
V
O
=V
CC
or GND -40 40 µA
I
CC1
Power Supply Current, Standby V
CC
=Max
V
IN
=0,V
CC
Std Mode Com. 60 mA
Ind. 75 mA
“L” Mode Com. 10 µA
Ind. 10 µA
I
CC2
Power Supply Current,
Power-down Mode
V
CC
=Max
V
IN
=0,V
CC
“PD” Mode 1 5 mA
I
CC3
(2)
Reduced-power Mode
Supply Current, Standby
V
CC
=Max
V
IN
=0,V
CC
Std Mode Com. 35 mA
Ind. 40 mA
V
IL
Input Low Voltage -0.3 0.8 V
V
IH
Input High Voltage 2.0 V
CCIO
+0.3 V
V
OL
Output Low Voltage (TTL) V
IN
=V
IH
or V
IL
V
CC
=MIN,I
OL
=12mA
Com. 3.0 0.45 V
Ind. 0.45
Output Low Voltage (CMOS) V
IN
=V
IH
or V
IL
V
CC
=MIN,I
OL
=0.1mA
Com. 0.2 V
Ind. 0.2 V
V
OH
Output High Voltage (TTL) V
IN
=V
IH
or V
IL
V
CC
=MIN,I
OH
=-4.0mA
2.4 V
14
ATF1502AS(L)
0995J–PLD–09/02
Note: 1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
The OGI pin (high-voltage pin during programming) has a maximum capacitance of 12 pF.
Timing Model
Input Test Waveforms and Measurement Levels
t
R
,t
F
=1.5nstypical
Output AC Test Loads
Pin Capacitance
(1)
Typ Max Units Conditions
C
IN
810pF V
IN
=0V;f=1.0MHz
C
I/O
810pF V
OUT
=0V;f=1.0MHz
15
ATF1502AS(L)
0995J–PLD–09/02
AC Characteristics
(1)
Symbol Parameter
-7 -10 -15 -25
UnitsMin Max Min Max Min Max Min Max
t
PD1
Input or Feedback to Non-registered Output 7.5 10 3 15 25 ns
t
PD2
I/O Input or Feedback to Non-registered
Feedback
7931225ns
t
SU
Global Clock Setup Time 6 7 11 20 ns
t
H
Global Clock Hold Time 0 0 0 0 ns
t
FSU
Global Clock Setup Time of Fast Input 3 3 3 5 ns
t
FH
Global Clock Hold Time of Fast Input 0.5 0.5 1 2 MHz
t
COP
Global Clock to Output Delay 4.5 5 8 13 ns
t
CH
Global Clock High Time 3 4 5 7 ns
t
CL
Global Clock Low Time 3 4 5 7 ns
t
ASU
Array Clock Setup Time 3 3 4 5 ns
t
AH
Array Clock Hold Time 2 3 4 6 ns
t
ACOP
Array Clock Output Delay 7.5 10 15 25 ns
t
ACH
Array Clock High Time 3 4 6 10 ns
t
ACL
Array Clock Low Time 3 4 6 10 ns
t
CNT
Minimum Clock Global Period 8 10 13 22 ns
f
CNT
Maximum Internal Global Clock Frequency 125 100 76.9 50 MHz
t
ACNT
Minimum Array Clock Period 8 10 13 22 ns
f
ACNT
Maximum Internal Array Clock Frequency 125 100 76.9 50 MHz
f
MAX
Maximum Clock Frequency 166.7 125 100 60 MHz
t
IN
Input Pad and Buffer Delay 0.5 0.5 2 2 ns
t
IO
I/O Input Pad and Buffer Delay 0.5 0.5 2 2 ns
t
FIN
Fast Input Delay 1 1 2 2 ns
t
SEXP
Foldback Term Delay 4 5 8 12 ns
t
PEXP
Cascade Logic Delay 0.8 0.8 1 2 ns
t
LAD
Logic Array Delay 3 5 6 8 ns
t
LAC
Logic Control Delay 3 5 6 8 ns
t
IOE
Internal Output Enable Delay 2 2 3 4 ns
t
OD1
Output Buffer and Pad Delay
(Slow slew rate = OFF;
V
CC
=5V;C
L
=35pF)
21.5 4 6ns
t
ZX1
Output Buffer Enable Delay
(Slow slew rate = OFF;
V
CCIO
=5.0V;C
L
=35pF)
4.0 5.0 7 10 ns
t
ZX2
Output Buffer Enable Delay
(Slow slew rate = OFF;
V
CCIO
=3.3V;C
L
=35pF)
4.5 5.5 7 10 ns

ATF1502ASL-25AC44

Mfr. #:
Manufacturer:
Microchip Technology / Atmel
Description:
CPLD - Complex Programmable Logic Devices CPLD 32 MACROCELL ISP LO-PWR 5V-25NS
Lifecycle:
New from this manufacturer.
Delivery:
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