7
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FM27C512 524,288-Bit (64K x 8) High Performance CMOS EPROM
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FM27C512 Rev. A
Functional Description
DEVICE OPERATION
The six modes of operation of the EPROM are listed in Table1. It
should be noted that all inputs for the six modes are at TTL levels.
The power supplies required are V
CC
and OE/V
PP
. The OE/V
PP
power supply must be at 12.75V during the three programming
modes, and must be at 5V in the other three modes. The V
CC
power supply must be at 6.5V during the three programming
modes, and at 5V in the other three modes.
Read Mode
The EPROM has two control functions, both of which must be
logically active in order to obtain data at the outputs. Chip Enable
(CE/PGM) is the power control and should be used for device
selection. Output Enable (OE/V
PP
) is the output control and should
be used to gate data to the output pins, independent of device
selection. Assuming that addresses are stable, address access
time (t
ACC
) is equal to the delay from CE to output (t
CE
). Data is
available at the outputs t
OE
after the falling edge of OE, assuming
that CE has been low and addresses have been stable for at least
t
ACC
t
OE
.
Standby Mode
The EPROM has a standby mode which reduces the active power
dissipation by over 99%, from 220 mW to 0.55 mW. The EPROM
is placed in the standby mode by applying a CMOS high signal to
the CE/PGM input. When in standby mode, the outputs are in a
high impedance state, independent of the OE input.
Output Disable
The EPROM is placed in output disable by applying a TTL high
signal to the OE input. When in output disable all circuitry is
enabled, except the outputs are in a high impedance state (TRI-
STATE).
Output OR-Typing
Because the EPROM is usually used in larger memory arrays,
Fairchild has provided a 2-line control function that accommo-
dates this use of multiple memory connections. The 2-line control
function allows for:
1. the lowest possible memory power dissipation, and
2. complete assurance that output bus contention will not
occur.
To most efficiently use these two control lines, it is recommended
that CE/PGM be decoded and used as the primary device select-
ing function, while OE/V
PP
be made a common connection to all
devices in the array and connected to the READ line from the
system control bus.
This assures that all deselected memory devices are in their low
power standby modes and that the output pins are active only
when data is desired from a particular memory device.
Programming
CAUTION: Exceeding 14V on pin 22 (OE/V
PP
) will damage the
EPROM.
Initially, and after each erasure, all bits of the EPROM are in the
1s state. Data is introduced by selectively programming 0s
into the desired bit locations. Although only 0s will be pro-
grammed, both 1s and 0s can be presented in the data word.
The only way to change a 0 to a 1 is by ultraviolet light erasure.
The EPROM is in the programming mode when the OE/V
PP
is at
12.75V. It is required that at least a 0.1 µF capacitor be placed
across V
CC
to ground to suppress spurious voltage transients
which may damage the device. The data to be programmed is
applied 8 bits in parallel to the data output pins. The levels required
for the address and data inputs are TTL.
When the address and data are stable, an active low, TTL program
pulse is applied to the CE/PGM input. A program pulse must be
applied at each address location to be programmed.
The EPROM is programmed with the Turbo Programming Algo-
rithm shown in Figure 1. Each Address is programmed with a
series of 50 µs pulses until it verifies good, up to a maximum of 10
pulses. Most memory cells will program with a single 50 µs pulse.
(The standard National Semiconductor Algorithm may also be
used but it will have longer programming time.)
The EPROM must not be programmed with a DC signal applied to
the CE/PGM input.
Programming multiple EPROM in parallel with the same data can
be easily accomplished due to the simplicity of the programming
requirements. Like inputs of the parallel EPROM may be con-
nected together when they are programmed with the same data.
A low level TTL pulse applied to the CE/PGM input programs the
paralleled EPROM.
Program Inhibit
Programming multiple EPROMs in parallel with different data is
also easily accomplished. Except for CE/PGM all like inputs
(including OE/V
PP
) of the parallel EPROMs may be common. A
TTL low level program pulse applied to an EPROMs CE/PGM
input with OE/V
PP
at 12.75V will program that EPROM. A TTL high
level CE/PGM input inhibits the other EPROMs from being pro-
grammed.
Program Verify
A verify should be performed on the programmed bits to determine
whether they were correctly programmed. The verify is accom-
plished with OE/V
PP
and CE at V
IL
. Data should be verified T
DV
after the falling edge of CE.
AFTER PROGRAMMING
Opaque labels should be placed over the EPROM window to
prevent unintentional erasure. Covering the window will also
prevent temporary functional failure due to the generation of photo
currents.
MANUFACTURER’S IDENTIFICATION CODE
The EPROM has a manufacturers identification code to aid in
programming. When the device is inserted in an EPROM pro-
grammer socket, the programmer reads the code and then
automatically calls up the specific programming algorithm for the
part. This automatic programming control is only possible with
programmers which have the capability of reading the code.
The Manufacturers Identification code, shown in Table 2, specifi-
cally identifies the manufacturer and device type. The code for
FM27C512 is 8F85, where 8F designates that it is made by
Fairchild Semiconductor, and 85 designates a 512K part.
The code is accessed by applying 12V ±0.5V to address pin A9.
Addresses A1A8, A10A16, and all control pins
8
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FM27C512 524,288-Bit (64K x 8) High Performance CMOS EPROM
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FM27C512 Rev. A
Functional Description (Continued)
are held at V
IL
. Address pin A0 is held at V
IL
for the manufacturers
code, and held at V
IH
for the device code. The code is read on the
eight data pins, O0 O 7 . Proper code access is only guaranteed
at 25°C ±5°C.
ERASURE CHARACTERISTICS
The erasure characteristics of the device are such that erasure
begins to occur when exposed to light with wavelengths shorter
than approximately 4000 Angstroms (Å). It should be noted that
sunlight and certain types of fluorescent lamps have wavelengths
in the 3000Å–4000Å range.
The recommended erasure procedure for the EPROM is expo-
sure to short wave ultraviolet light which has a wavelength of
2537Å. The integrated dose (i.e., UV intensity x exposure time) for
erasure should be minimum of 15W-sec/cm
2
.
The EPROM should be placed within 1 inch of the lamp tubes
during erasure. Some lamps have a filter on their tubes which
should be removed before erasure
An erasure system should be calibrated periodically. The distance
from lamp to device should be maintained at one inch. The erasure
time increases as the square of the distance from the lamp (if
distance is doubled the erasure time increases by factor of 4).
Lamps lose intensity as they age. When a lamp is changed, the
distance has changed, or the lamp has aged, the system should
be checked to make certain full erasure is occurring. Incomplete
erasure will cause symptoms that can be misleading. Program-
mers, components, and even system designs have been errone-
ously suspected when incomplete erasure was the problem.
SYSTEM CONSIDERATION
The power switching characteristics of EPROMs require careful
decoupling of the devices. The supply current, I
CC
, has three
segments that are of interest to the system designer: the standby
current level, the active current level, and the transient current
peaks that are produced by voltage transitions on input pins. The
magnitude of these transient current peaks is dependent on the
output capacitance loading of the device. The associated V
CC
transient voltage peaks can be suppressed by properly selected
decoupling capacitors. It is recommended that at least a 0.1 µF
ceramic capacitor be used on every device between V
CC
and
GND. This should be a high frequency capacitor of low inherent
inductance. In addition, at least a 4.7 µF bulk electrolytic capacitor
should be used between V
CC
and GND for each eight devices. The
bulk capacitor should be located near where the power supply is
connected to the array. The purpose of the bulk capacitor is to
overcome the voltage drop caused by the inductive effects of the
PC board traces.
Mode Selection
The modes of operation of the FM27C512 are listed in Table 1. A single 5V power supply is required in the read mode. All inputs are TTL
levels excepts for V
PP
and A9 for device signature.
TABLE 1. Mode Selection
Pins CE/PGM OE/V
PP
V
CC
Outputs
Mode
Read V
IL
V
IL
5.0V D
OUT
Output Disable X (Note 13) V
IH
5.0V High Z
Standby V
IH
X 5.0V High Z
Programming V
IL
12.75V 6.25V D
IN
Program Verify V
IL
V
IL
6.25V D
OUT
Program Inhibit V
IH
12.75V 6.25V High Z
Note 13: X can be V
IL
or V
IH
.
TABLE 2. Manufacturer’s Identification Code
Pins A0 A9 07 06 05 04 03 02 01 00 Hex
(10) (24) (19) (18) (17) (16) (15) (13) (12) (11) Data
Manufacturer Code
V
IL
12V100011118F
Device Code V
IH
12V1000010185
9
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FM27C512 524,288-Bit (64K x 8) High Performance CMOS EPROM
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FM27C512 Rev. A
UV Window Cavity Dual-In-Line Cerdip Package (JQ)
Order Number FM27C512Q
Package Number J28CQ
Physical Dimensions inches (millimeters) unless otherwise noted
0.008-0.012
[0.203-0.305]
TYP
0.090-0.110
[2.286-2.794]
TYP
0.060-0.100
[1.524-2.540]
TYP
0.015-0.021
[0.381-0.533]
TYP
0.033-0.045
[0.838-1.143]
TYP
0.225 [5.715]
MAX TYP
0.125 [3.175]
MIN TYP
GLASS
SEALANT
15
14
28
1
R 0.025
[0.635]
0.290-0.310
[7.366-7.874]
U.V. WINDOW
R 0.030-0.055
[0.762-1.397]
TYP
0.515-0.530
[13.081-13.462]
1.465 MAX
[37.211]
0.050-0.060
[1.270-1.524]
TYP
0.180 [4.572]
MAX
0.010 [0.254]
MAX
0.015-0.060
[0.381-1.524]
TYP
86°-94°
TYP
0.590-0.620
[14.99-15.75]
0.685
+0.025
-0.060
[17.399 ]
+0.635
-1.524
90°-100°
TYP

FM27C512Q90

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
IC EPROM 512K PARALLEL 28CDIP
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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