74HC_HCT174_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 17 April 2013 10 of 16
NXP Semiconductors
74HC174-Q100; 74HCT174-Q100
Hex D-type flip-flop with reset; positive-edge trigger
Table 8. Measurement points
Type Input Output
V
I
V
M
V
M
74HC174-Q100 V
CC
0.5V
CC
0.5V
CC
74HCT174-Q100 3 V 1.3 V 1.3 V
Test data is given in Table 9.
Definitions for test circuit:
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= Load capacitance including jig and probe capacitance.
R
L
= Load resistance.
S1 = Test selection switch
Fig 8. Test circuit for measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aad983
DUT
V
CC
V
CC
V
I
V
O
R
T
R
L
S1
C
L
open
G
Table 9. Test data
Type Input Load S1 position
V
I
t
r
, t
f
C
L
R
L
t
PHL
, t
PLH
74HC174-Q100 V
CC
6ns 15pF, 50 pF 1k open
74HCT174-Q100 3 V 6 ns 15 pF, 50 pF 1 k open
