Broadcom Condential
- 8 -
ACPL-P347/ACPL-W347 Data Sheet
Notes:
1. Derate linearly above 85°C free-air temperature at a rate of 0.3 mA/°C.
2. Maximum pulse width = 10 µs. This value is intended to allow for component tolerances for designs with I/O peak minimum = 1.0A. See applications section for
additional details on limiting I
OH
peak.
3. Derate linearly above 85°C free-air temperature at a rate of 12.5 mW/°C .
4. Derate linearly above 85°C free-air temperature at a rate of 13.75 mW/°C . The maximum LED junction temperature should not exceed 125°C.
5. Maximum pulse width = 10 µs.
6. In this test V
OH
is measured with a DC load current. When driving capacitive loads, V
OH
will approach V
CC
as I
OH
approaches zero amps.
7. Maximum pulse width = 1 ms.
8. Pulse Width Distortion (PWD) is dened as |t
PHL
– t
PLH
| for any given device.
9. Propagation Delay Dierence (PDD) is the dierence between t
PHL
and t
PLH
between any two units under the same test condition.
10. Propagation Delay Skew (t
PSK
) is the dierence in t
PHL
or t
PLH
between any two units under the same test condition.
11. Pin 2 needs to be connected to LED common. Split resistor network in the ratio 1.5:1 with 232Ω at the anode and 154Ω at the cathode.
12. Common mode transient immunity in the high state is the maximum tolerable dV
CM
/dt of the common mode pulse, V
CM
, to assure that the output will remain
in the high state (meaning, V
O
> 15.0V).
13. Common mode transient immunity in a low state is the maximum tolerable dV
CM
/dt of the common mode pulse, V
CM
, to assure that the output will remain in a
low state (meaning, V
O
< 1.0V).
14. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage ≥4500V
RMS
for 1 second (leakage detection current limit,
I
I-O
≤ 5 µA).
15. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage ≥6000V
RMS
for 1 second (leakage detection current limit I
I-O
≤ 5 µA).
16. Device considered a two-terminal device: pins 1, 2, and 3 shorted together and pins 4, 5, and 6 shorted together.
17. The device was mounted on a high conductivity test board as per JEDEC 51-7.