TLP2200F

TLP2200
2014-09-01 4
Switching Characteristics
(unless otherwise specified, Ta = 0~85°C,V
CC
= 4.5~20V,I
F(ON)
= 1.6~5mA,I
F(OFF)
= 0~0.1mA)
Characteristic Symbol
Test
Circuit
Test Condition Min Typ. Max Unit
Propagation delay time to
logic high output level
(Note 5)
t
pLH
1
Without peaking capacitor
C
1
235
ns
With peaking capacitor C
1
400
Propagation delay time to
logic low output level
(Note 5)
t
pHL
Without peaking capacitor
C
1
250
ns
With peaking capacitor C
1
400
Output rise time (1090%) t
r
35 ns
Output fall time (9010%) t
f
20 ns
Output enable time to
logic high
t
pZH
2
ns
Output enable time to
logic low
t
pZL
ns
Output disable time from
logic high
t
pHZ
ns
Output disable time from
logic low
t
pLZ
ns
Common mode transient
immunity at logic high
output (Note 6)
CM
H
3
I
F
= 1.6mA, V
CM
= 50V,
Ta = 25°C
1000 V / μs
Common mode transient
immunity at logic low
output (Note 6)
CM
L
I
F
= 0mA, V
CM
= 50V,
Ta = 25°C
1000
V / μs
(*) All typ. values are at Ta = 25°C, V
CC
= 5V, I
F(ON)
= 3mA unless otherwise specified.
(Note 4) Duration of output short circuit time should not exceed 10ms.
(Note 5) The t
pLH
propagation delay is measured from the 50% point on the leading edge of the input pulse to the
1.3V point on the leading edge of the output pulse.
The t
pHL
propagation delay is measured from the 50% point on the trailing edge of the input pulse to the
1.3V point on the trailing edge of the output pulse.
(Note 6) CM
L
is the maximum rate of rise of the common mode voltage that can be sustained with the output
voltage in the logic low state (V
O
0.8V).
CM
H
is the maximum rate of fall of the common mode voltage that can be sustained with the output
voltage in the logic high state (V
O
2.0V).
TLP2200
2014-09-01 5
Test Circuit 1 t
pHL
,
t
pLH
,
t
r
and t
f
Test Circuit 2 t
pHZ
,
t
pZH
,
t
pLZ
and t
pZL
Output V
O
I
F
(ON)
50%
0m
A
10%
90%
Input I
F
t
p
LH
t
p
HL
V
OH
V
OL
t
r
t
f
1.3V
C
1
is peaking capacitor. The probe and jig
capacitances are included in C
1
.
C
L
is approximately 15pF which includes probe
and stray wiring capacitance.
R
1
2.15k 1.1k 681
I
F
(ON) 1.6mA 3mA 5mA
V
CC
GND
Input
Monitoring
Node
1
2
3
4
8
7
6
5
V
CC
D2
D3
D4
D1
C
L
C1=120
p
F
Output V
O
Monitoring
Node
D1~D4
1S1588
5V
:
619
5k
R
1
Pulse
Generator
t
r
= t
f
= 5ns
V
O
= 5V
Output V
O
I
F
=I
F
(ON)
Input V
E
Output V
O
I
F
=I
F
(OFF)
S1 Open
S2 Closed
S1 Closed
S2 Open
t
P
ZL
1.3
V
0
V
t
P
HZ
t
P
ZH
0.5V
1.3V
t
P
LZ
0.5V
S1 and S2
Closed
3.0V
1.3V
0V
S1 and S2
Closed
V
OH
1.5V
V
OL
~
~
C
L
is approximately 15pF which includes probe
and stray wiring capacitance.
V
CC
GND
Input V
E
Monitoring
Node
1
2
3
4
8
7
6
5
V
CC
D2
D3
D4
D1
C
L
V
O
D1~D4
1S1588
5V
:
619
5k
I
F
Pulse
Generator
Z
O
= 50
t
r
= t
f
= 5ns
S2
S1
TLP2200
2014-09-01 6
Test Circuit 3 Common Mode Transient Immunity
50V
V
CM
0V
90%
10%
t
r
t
f
V
OH
V
O
(min) (*)
Output V
O
V
O
(max) (*)
V
OL
Switch AT A: I
F
= 1.6m
A
(*) See note6
Switch AT B: I
F
= 0m
V
CC
GND
1
2
3
4
8
7
6
5
V
CC
+
0.1μF
B
yp
ass
V
CM
A
Output
V
O
Monitoring
Node
I
F
B
V
FF
Pulse gen.
Z
O
= 50

TLP2200F

Mfr. #:
Manufacturer:
Toshiba
Description:
High Speed Optocouplers IC 3 STAGE OUTPUT
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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