ABT
Parameter Version
1
Version
1
Version
1
Units Test Conditions/Comments
DYNAMIC PERFORMANCE
2
Signal-to-Noise Ratio
3
(SNR) @ +25°C 70 72 70 dB min V
OUT
= 1 kHz Sine Wave, f
SAMPLE
= 83 kHz
T
MIN
to T
MAX
70 71 70 dB min Typically 71.5 dB at +25°C for 0 < V
OUT
< 20 kHz
4
Total Harmonic Distortion (THD) –78 –78 –76 dB max V
OUT
= 1 kHz Sine Wave, f
SAMPLE
= 83 kHz
Typically –84 dB at +25°C for 0 < V
OUT
< 20 kHz
4
Peak Harmonic or Spurious Noise –78 –78 –76 dB max V
OUT
= 1 kHz Sine Wave, f
SAMPLE
= 83 kHz
Typically –84 dB at +25°C for 0 < V
OUT
< 20 kHz
4
DC ACCURACY
Resolution 12 12 12 Bits
Integral Nonlinearity ±1/2 ±1/2 ±1/2 LSB typ
Integral Nonlinearity ±1 ±1 LSB max
Differential Nonlinearity ±0.9 ±0.9 ±0.9 LSB max Guaranteed Monotonic
Bipolar Zero Error ±5 ±5 ±5 LSB max
Positive Full-Scale Error
5
±5 ±5 ±5 LSB max
Negative Full-Scale Error
5
±5 ±5 ±5 LSB max
REFERENCE OUTPUT
6
RO ADC @ +25°C 2.99/3.01 2.99/3.01 2.99/3.01 V min/V max
RO ADC TC ±25 ±25 ±25 ppm/°C typ
RO ADC TC ±40 ±50 ppm/°C max
Reference Load Change (RO DAC vs. I) –1.5 –1.5 –1.5 mV max Reference Load Current Change (0–500 µA)
REFERENCE INPUT
RI DAC Input Range 2.85/3.15 2.85/3.15 2.85/3.15 V min/V max 3 V ± 5%
Input Current 1 1 1 µA max
LOGIC INPUTS (LDAC, TFS, TCLK, DT)
Input High Voltage, V
INH
2.4 2.4 2.4 V min V
DD
= 5 V ± 5%
Input Low Voltage, V
INL
0.8 0.8 0.8 V max V
DD
= 5 V ± 5%
Input Current, I
IN
±10 ±10 ±10 µA max V
IN
= 0 V to V
DD
Input Capacitance, C
IN
7
10 10 10 pF max
ANALOG INPUT
Output Voltage Range ±3 ±3 ±3 V nom
dc Output Impedance 0.3 0.3 0.3 typ
Short-Circuit Current 20 20 20 mA typ
AC CHARACTERISTICS
7
Voltage Output Settling-Time Settling Time to Within ±1/2 LSB of Final Value
Positive Full-Scale Change 3 3 3 µs max Typically 2 µs
Negative Full-Scale Change 3 3 3 µs max Typically 2.5 µs
Digital-to-Analog Glitch Impulse 10 10 10 nV secs typ DAC Code Change All 1s to All 0s
Digital Feedthrough 2 2 2 nV secs typ
V
IN
to V
OUT
Isolation 100 100 100 dB typ V
IN
= ±3 V, 41.5 kHz Sine Wave
POWER REQUIREMENTS As per ADC Section
NOTES
1
Temperature ranges are as follows: A/B Versions, –40°C to +85°C; T Version, –55°C to +125°C.
2
V
OUT
(pk–pk) = ±3 V.
3
SNR calculation includes distortion and noise components.
4
Using external sample and hold.
5
Measured with respect to RI DAC and includes bipolar offset error.
6
For capacitive loads greater than 50 pF a series resistor is required
(see INTERNAL REFERENCE section).
7
Sample tested @ +25°C to ensure compliance.
Specifications subject to change without notice.
ORDERING GUIDE
Relative
Temperature Accuracy Package
Model Range SNR (LSB) Option*
AD7868AN –40°C to +85°C 70 dB ±1/2 typ N-24
AD7868AQ –40°C to +85°C 70 dB ±1/2 typ Q-24
AD7868BN –40°C to +85°C 72 dB ±1 max N-24
AD7868BQ –40°C to +85°C 72 dB ±1 max Q-24
AD7868AR –40°C to +85°C 70 dB ±1/2 typ R-28
AD7868BR –40°C to +85°C 72 dB ±1 max R-28
*N = Plastic DIP; Q = Cerdip; R = SOIC (Small Outline IC).
DAC SECTION
AD7868
–3–
REV. B
(V
DD
= +5 V 6 5%, V
SS
= –5 V 6 5%, AGND = DGND = 0 V, RI DAC = +3 V and decoupled as shown in Figure 2, V
OUT
Load to AGND; R
L
= 2 k, C
L
= 100 pF. All specifications T
MIN
to T
MAX
unless otherwise noted.)
AD7868
–4–
REV. B
Limit at T
MIN
, T
MAX
Limit at T
MIN
, T
MAX
Parameter (A, B Versions) (T Version) Units Conditions/Comments
ADC TIMING
t
1
50 50 ns min CONVST Pulse Width
t
2
3
440 440 ns min RCLK Cycle Time, Internal Clock
t
3
100 100 ns min RFS to RCLK Falling Edge Setup Time
t
4
20 20 ns min RCLK Rising Edge to RFS
100 100 ns max
t
5
4
155 155 ns max RCLK to Valid Data Delay, C
L
= 35 pF
t
6
4 4 ns min Bus Relinquish Time after RCLK
100 100 ns max
t
13
5
2 RCLK +200 to 2 RCLK +200 to ns typ CONVST to RFS Delay
3 RCLK + 200 3 RCLK + 200
DAC TIMING
t
7
50 50 ns min TFS to TCLK Falling Edge
t
8
75 100 ns min TCLK Falling Edge to TFS
t
9
6
150 200 ns min TCLK Cycle Time
t
10
30 40 ns min Data Valid to TCLK Setup Time
t
11
75 100 ns min Data Valid to TCLK Hold Time
t
12
40 40 ns min LDAC Pulse Width
NOTES
1
Timing specifications are sample tested at +25°C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a
voltage level of 1.6 V.
2
Serial timing is measured with a 4.7 k pull-up resistor on DR and RFS and a 2 k pull-up resistor on RCLK . The capacitance on all three output is 35 pF.
3
When using internal clock, RCLK mark/space ratio (measured from a voltage level of 1.6 V) range is 40/60 to 60/40. For external clock, RCLK mark/space ratio =
external clock mark/space ratio.
4
DR will drive higher capacitance loads but this will add to t
5
since it increases the external RC time constant (4.7 k/C
L
) and hence the time to reach 2.4 V.
5
Time 2 RCLK to 3 RCLK depends on conversion start to ADC clock synchronization.
6
TCLK mark/space ratio is 40/60 to 60/40.
TIMING CHARACTERISTICS
1, 2
WARNING!
ESD SENSITIVE DEVICE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7868 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
ABSOLUTE MAXIMUM RATINGS*
(T
A
= +25°C unless otherwise noted)
V
DD
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
SS
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –7 V
AGND to DGND . . . . . . . . . . . . . . . . . –0.3 V to V
DD
+0.3 V
V
OUT
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . V
SS
to V
DD
V
IN
to AGND . . . . . . . . . . . . . . . . V
SS
–0.3 V to V
DD
+ 0.3 V
RO ADC to AGND . . . . . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
RO DAC to AGND . . . . . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
RI DAC to AGND . . . . . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
Digital Inputs to AGND . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
Digital Outputs to AGND . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
Operating Temperature Range
A, B Versions . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
T Version . . . . . . . . . . . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . +300°C
Power Dissipation (Any Package) to +75°C . . . . . . . . 450 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . . . 10 mW/°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those listed in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
DIP
RO ADC
DGND
TCLK
DT
RI DAC
AGND
CONTROL
CLK
RCLK
DR
DGND
AGND
RO DAC
NC
V
DD
NC = NO CONNECT
24
23
22
21
20
19
18
17
16
15
14
13
1
2
3
4
5
6
7
8
10
11
12
9
AD7868
TOP VIEW
(Not to Scale)
CONVST
RFS
V
SS
V
OUT
V
IN
TFS
LDAC
V
DD
V
SS
SOIC
RO ADC
DGND
TCLK
DT
RI DAC
AGND
CONTROL
CLK
RCLK
DR
DGND
AGND
RO DAC
NC
V
DD
NC = NO CONNECT
1
7
8
9
24
23
22
21
20
19
18
17
16
15
14
12
13
AD7868
TOP VIEW
(Not to Scale)
CONVST
RFS
V
SS
V
OUT
V
IN
TFS
LDAC
10
11
3
4
5
6
2
28
27
26
25
NC
NC
NC
NC
V
DD
V
SS
PIN CONFIGURATIONS
(V
DD
= +5 V 6 5%, V
SS
= –5 V 6 5%, AGND = DGND = 0 V)
AD7868
–5–
REV. B
PIN FUNCTION DESCRIPTION
DIP Pin
Number Mnemonic Function
POWER SUPPLY
7 & 23 V
DD
Positive Power Supply, 5 V ± 5%. Both V
DD
pins must be tied together.
10 & 22 V
SS
Negative Power Supply, –5 V ± 5%. Both V
SS
pins must be tied together.
8 & 19 AGND Analog Ground. Both AGND pins must be tied together.
6 &17 DGND Digital Ground. Both DGND pins must be tied together.
ANALOG SIGNAL AND REFERENCE
21 V
IN
ADC Analog Input. The ADC input range is ±3 V.
9V
OUT
Analog Output Voltage from DAC. This output comes from a buffer amplifier. The range is
bipolar, ±3 V with RI DAC = +3 V.
20 RO ADC Voltage Reference Output. The internal ADC 3 V reference is provided at this pin. This output may be
used as a reference for the DAC by connecting it to the RI DAC input. The external load capability of
this reference is 500 µA.
11 RO DAC DAC Voltage Reference Output. This is one of two internal voltage references. To operate the DAC
with this internal reference, RO DAC should be connected to RI DAC. The external load capability of
the reference is 500 µA.
12 RI DAC DAC Voltage Reference Input. The voltage reference for the DAC must be applied to this pin. It is
internally buffered before being applied to the DAC. The nominal reference voltage for correct
operation of the AD7868 is 3 V.
ADC INTERFACE AND CONTROL
2 CLK Clock Input. An external TTL-compatible clock may be applied to this input. Alternatively, tying pin to
V
SS
enables the internal laser-trimmed oscillator.
3
RFS Receive Frame Synchronization, Logic Output. This is an active low open-drain output which provides
a framing pulse for serial data. An external 4.7 k pull-up resistor is required on
RFS.
4 RCLK Receive Clock, Logic Output. RCLK is the gated serial clock output which is derived from the internal
or external ADC clock. If the CONTROL input is at V
SS
the clock runs continuously. With the
CONTROL input at DGND the RCLK output is gated off (three-stated) after serial transmission is
complete. RCLK is an open-drain output and requires an external 2 k pull-up resistor.
5 DR Receive Data, Logic Output. This is an open-drain data output used in conjunction with
RFS and
RCLK to transmit data from the ADC. Serial data is valid on the falling edge of RCLK when
RFS is
low. An external 4.7 k resistor is required on the DR output.
1
CONVST Convert Start, Logic Input. A low to high transition on this input puts the track-and-hold amplifier into
the hold mode and starts an ADC conversion. This input in asynchronous to the CLK input.
24 CONTROL Control, Logic Input. With this pin at 0 V, the RCLK is noncontinuous. With this pin at –5 V, the
RCLK is continuous. Note, tying this pin to V
DD
places the part in a factory test mode where normal
operation is not exhibited.
DAC INTERFACE AND CONTROL
14
TFS Transmit Frame Synchronization, Logic Input. This is a frame or synchronization signal for the DAC
with serial data expected after the falling edge of this signal.
15 DT Transmit Data, Logic Input. This is the data input which is used in conjunction with
TFS and TCLK
to transfer serial data to the input latch.
16 TCLK Transmit Clock, Logic Input. Serial data bits are latched on the falling edge of TCLK when
TFS is low.
13
LDAC Load DAC, Logic Input. A new word is transferred into the DAC latch from the input latch on the
falling edge of this signal.
18 NC No Connect.

AD7868BR-REEL

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
IC I/O PORT 12BIT ANLG 28-SOIC
Lifecycle:
New from this manufacturer.
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