IDT71124S12YI8

APRIL 2013APRIL 2013
APRIL 2013APRIL 2013
APRIL 2013
DSC-3514/11
1
©2013 Integrated Device Technology, Inc.
Features
128K x 8 advanced high-speed CMOS static RAM
JEDEC revolutionary pinout (center power/GND) for
reduced noise.
Equal access and cycle times
Commercial: 12/15/20ns
Industrial: 15/20ns
One Chip Select plus one Output Enable pin
Bidirectional inputs and outputs directly TTL-compatible
Low power consumption via chip deselect
Available in a 32-pin 400 mil Plastic SOJ.
Functional Block Diagram
Description
The IDT71124 is a 1,048,576-bit high-speed static RAM organized as
128K x 8. It is fabricated using high-performance, high-reliability CMOS
technology. This state-of-the-art technology, combined with innovative
circuit design techniques, provides a cost-effective solution for high-speed
memory needs. The JEDEC centerpower/GND pinout reduces noise
generation and improves system performance.
The IDT71124 has an output enable pin which operates as fast as 6ns,
with address access times as fast as 12ns available. All bidirectional inputs
and outputs of the IDT71124 are TTL-compatible and operation is from
a single 5V supply. Fully static asynchronous circuitry is used; no clocks
or refreshes are required for operation.
The IDT71124 is packaged in a 32-pin 400 mil Plastic SOJ.
ADDRESS
DECODER
1,048,576-BIT
MEMORY ARRAY
I/O CONTROL
A
0
A
16
3514 drw 01
8
8
I/O
0
-I/O
7
8
CONTROL
LOGIC
WE
OE
CS
,
CMOS Static RAM
1 Meg (128K x 8-Bit)
Revolutionary Pinout
IDT71124
6.42
2
IDT71124 CMOS Static RAM
1 Meg (128K x 8-bit) Revolutionary Pinout Commercial and Industrial Temperature Ranges
Capacitance
(TA = +25°C, f = 1.0MHz)
Symbol Parameter
(1 )
Conditions Max. Unit
C
IN
Input Capacitance V
IN
= 3dV 8 pF
C
I/O
I/O Capacitance V
OUT
= 3dV 8 pF
3514 tbl 03
Recommended DC Operating
Conditions
NOTE:
1. This parameter is guaranteed by device characterization, but is not production tested.
Symbol Parameter Min. Typ. Max. Unit
V
CC
Supply Voltage 4.5 5.0 5.5 V
GND Ground 0 0 0 V
V
IH
Input High Voltage 2.2
____
V
CC
+0.5 V
V
IL
Input Low Voltage -0.5
(1)
____
0.8 V
3514 tbl 05
Grade Temperature GND V
CC
Commercial 0°C to +70°C 0V 5.0V ± 10%
Industrial –40°C to +85°C 0V 5.0V ± 10%
3514 tbl 04
Recommended Operating
Temperature and Supply Voltage
Pin Configuration
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational sections of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliabilty.
2. VTERM must not exceed Vcc + 0.5V.
Truth Table
(1,2)
SOJ
Top View
5
6
7
8
9
10
11
12
A
0
A1
A2
1
2
3
4
32
31
30
29
28
27
26
25
24
23
22
21
A15
A3
CS
I/O
1
VCC
A14
OE
I/O
7
I/O6
GND
I/O
5
3514 drw 02
GND
13 20
14 19
15 18
16
A
7
17
I/O2
I/O3
WE
A
4
A5
A6
A12
A11
A10
A9
A8
SO32-3
I/O0
A16
A13
VCC
I/O4
,
NOTES:
1. H = VIH, L = VIL, x = Don't care.
2. VLC = 0.2V, VHC = VCC -0.2V.
3. Other inputs VHC or VLC.
CS OE WE I/O Function
LLHDATA
OUT
Read Data
LXLDATA
IN
Write Data
L H H High-Z Output Disabled
H X X High-Z Deselected - Standby (I
SB
)
V
HC
(3 )
X X High-Z Deselected - Standby (I
SB1
)
3514 tbl 01
Absolute Maximum Ratings
(1)
Symbol Rating Value Unit
V
TERM
(2)
Terminal Voltage with
Respect to GND
-0.5 to +7.0
(2 )
V
T
A
Operating Temperature 0 to +70
o
C
T
BIAS
Temperature
Under Bias
-55 to +125
o
C
T
STG
Storage
Temperature
-55 to +125
o
C
P
T
Power Dissipation 1.25 W
I
OUT
DC Output Current 50 mA
3514 tbl 02
6.42
IDT 71124 CMOS Static RAM
1 Meg (128K x 8-bit) Revolutionary Pinout Commercial and Industrial Temperature Ranges
3
3514 drw 03
480Ω
255Ω30pF
DATA
OUT
5V
.
*Including jig and scope capacitance.
Figure 2. AC Test Load
(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)
Figure 1. AC Test Load
AC Test Conditions
DC Electrical Characteristics
(1)
(VCC = 5.0V ± 10%, VLC = 0.2V, VHC = VCC – 0.2V)
3514 drw 04
480Ω
255Ω5pF*
DATA
OUT
5V
.
DC Electrical Characteristics
(VCC = 5.0V ± 10%, Commercial and Industrial Temperature Ranges)
Symbol Parameter Test Conditions Min. Max. Unit
|I
LI
| Input Leakage Current V
CC
= Max., V
IN
= GND to V
CC
___
A
|I
LO
| Output Leakage Current V
CC
= Max., CS = V
IH
, V
OUT
= GND to V
CC
___
A
V
OL
Output Low Voltage I
OL
= 8mA, V
CC
= Min.
___
0.4 V
V
OH
Output High Voltage I
OH
= –4mA, V
CC
= Min. 2.4
___
V
3514 tbl 06
NOTES:
1. All values are maximum guaranteed values.
2. fMAX = 1/tRC (all address inputs are cycling at fMAX); f = 0 means no address input lines are changing.
71124S12 71124S15 71124S20
Symbol Parameter Com'l. Com'l. Ind. Com'l. Ind. Unit
I
CC
Dynamic Operating Current
CS <
V
IL
, Outputs Open, V
CC
= Max., f = f
MAX
(2)
160 155 155 140 140 mA
I
SB
Standby Power Supply Current (TTL Level)
CS >
V
IH
, Outputs Open, V
CC
= Max., f = f
MAX
(2)
40 40 40 40 40 mA
I
SB1
Full Standby Power Supply Current (CMOS Level)
CS >
V
HC
, Outputs Open, V
CC
= Max., f = 0
(2)
V
IN
< V
LC
or V
IN
> V
HC
10 10 10 10 10 mA
3514 tbl 07
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
GND to 3.0V
3ns
1.5V
1.5V
See Figure 1 and 2
3514 tbl 08
AC Test Loads

IDT71124S12YI8

Mfr. #:
Manufacturer:
Description:
IC SRAM 1M PARALLEL 32SOJ
Lifecycle:
New from this manufacturer.
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