© 2001 Fairchild Semiconductor Corporation DS011657 www.fairchildsemi.com
December 1993
Revised January 2001
SCAN182245A Non-Inverting Transceiver with 25
Series Resistor Outputs
SCAN182245A
Non-Inverting Transceiver
with 25
Series Resistor Outputs
General Description
The SCAN182245A is a high performance BiCMOS bidi-
rectional line driver featuring separate data inputs orga-
nized into dual 9-bit bytes with byte-oriented output enable
and direction control signals. This device is compliant with
IEEE 1149.1 Standard Test Access Port and Boundary
Scan Architecture with the incorporation of the defined
boundary-scan test logic and test access port consisting of
Test Data Input (TDI), Test Data Out (TDO), Test Mode
Select (TMS), and Test Clock (TCK).
Features
High performance BiCMOS technology
25
series resistors in outputs eliminate the need for
external terminating resistors
Dual output enable control signals
3-STATE outputs for bus-oriented applications
25 mil pitch SSOP (Shrink Small Outline Package)
IEEE 1149.1 (JTAG) Compliant
Includes CLAMP, IDCODE and HIGHZ instructions
Additional instructions SAMPLE-IN, SAMPLE-OUT and
EXTEST-OUT
Power Up 3-STATE for hot insert
Member of Fairchild’s SCAN Products
Ordering Code:
Devices also available in Tape and Reel. Specify by appending the suffix letter X to the ordering code.
Connection Diagram Pin Descriptions
Order Number
Package
Number
Package Description
SCAN182245ASSC MS56A 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
SCAN182245AMTD MTD56 56-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide
Pin Names Description
A1
(08)
Side A1 Inputs or 3-STATE Outputs
B1
(08)
Side B1 Inputs or 3-STATE Outputs
A2
(08)
Side A2 Inputs or 3-STATE Outputs
B2
(08)
Side B2 Inputs or 3-STATE Outputs
G1
, G2 Output Enable Pins (Active LOW)
DIR1, DIR2 Direction of Data Flow Pins
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SCAN182245A
Truth Tables
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance
Note 1: Inactive-to-Active transition must occur to enable outputs upon power-up.
Functional Description
The SCAN182245A consists of two sets of nine non-invert-
ing bidirectional buffers with 3-STATE outputs and is
intended for bus-oriented applications. Direction pins (DIR1
and DIR2) LOW enables data from B Ports to A Ports,
when HIGH enables data from A Ports to B Ports. The Out-
put Enable pins (G1
and G2) when HIGH disables both A
and B Ports by placing them in a high impedance condition.
Block Diagrams
A1, B1, G1 and DIR1
Note: BSR stands for Boundary Scan Register.
A2, B2, G2 and DIR2
Note: BSR stands for Boundary Scan Register.
Tap Controller
Inputs
A1
(0–8)
B1
(0–8)
G1
(Note 1)
DIR1
LLH
H
LLL
L
LHH
H
LHL
L
HXZZ
Inputs
A2
(0–8)
B2
(0–8)
G2
(Note 1)
DIR2
LLH
H
LLL
L
LHH
H
LHL
L
HXZZ
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SCAN182245A
Description of BOUNDARY-SCAN Circuitry
The scan cells used in the BOUNDARY-SCAN register are
one of the following two types depending upon their loca-
tion. Scan cell TYPE1 is intended to solely observe system
data, while TYPE2 has the additional ability to control sys-
tem data.
Scan cell TYPE1 is located on each system input pin while
scan cell TYPE2 is located at each system output pin as
well as at each of the two internal active-high output enable
signals. AOE controls the activity of the A-outputs while
BOE controls the activity of the B-outputs. Each will acti-
vate their respective outputs by loading a logic high.
The BYPASS register is a single bit shift register stage
identical to scan cell TYPE1. It captures a fixed logic low.
Bypass Register Scan Chain Definition
Logic 0
SCAN182245A Product IDCODE
(32-Bit Code per IEEE 1149.1)
The INSTRUCTION register is an 8-bit register which cap-
tures the default value of 10000001 (SAMPLE/PRELOAD)
during the CAPTURE-IR instruction command. The benefit
of capturing SAMPLE/PRELOAD as the default instruction
during CAPTURE-IR is that the user is no longer required
to shift in the 8-bit instruction for SAMPLE/PRELOAD. The
sequence of: CAPTURE-IR
EXIT1-IR UPDATE-IR
will update the SAMPLE/PRELOAD instruction. For more
information refer to the section on instruction definitions.
Instruction Register Scan Chain Definition
MSB
LSB
Scan Cell TYPE1
Scan Cell TYPE2
Versio
n
Entity
Part Manufacture
r
Required
Number ID by 1149.1
0000 111111 000000000
0
00000001111 1
MSB MSB
Instruction Code Instruction
00000000 EXTEST
10000001 SAMPLE/PRELOAD
10000010 CLAMP
00000011 HIGH-Z
01000001 SAMPLE-IN
01000010 SAMPLE-OUT
00100010 EXTEST-OUT
10101010 IDCODE
11111111 BYPASS
All Others BYPASS

SCAN182245ASSC

Mfr. #:
Manufacturer:
ON Semiconductor / Fairchild
Description:
Bus Transceivers Non-Inverting Trans
Lifecycle:
New from this manufacturer.
Delivery:
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Payment:
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