©2011 Silicon Storage Technology, Inc. DS25111A 12/11
4
32 Mbit Multi-Purpose Flash Plus
SST39VF3201B / SST39VF3202B
Data Sheet
A
Microchip Technology Company
Figure 3: pin assignments for 48-ball TFBGA
Table 1: Pin Description
Symbol Pin Name Functions
A
MS
1
-A
0
1. A
MS
= Most significant address
A
MS
=A
20
for SST39VF320xB
Address Inputs To provide memory addresses.
During Sector-Erase A
MS
-A
11
address lines will select the sector.
During Block-Erase A
MS
-A
15
address lines will select the block.
DQ
15
-DQ
0
Data Input/output To output data during Read cycles and receive input data during Write cycles.
Data is internally latched during a Write cycle.
The outputs are in tri-state when OE# or CE# is high.
WP# Write Protect To protect the top/bottom boot block from Erase/Program operation when
grounded.
RST# Reset To reset and return the device to Read mode.
CE# Chip Enable To activate the device when CE# is low.
OE# Output Enable To gate the data output buffers.
WE# Write Enable To control the Write operations.
V
DD
Power Supply To provide power supply voltage: 2.7-3.6V
V
SS
Ground
NC No Connection Unconnected pins.
T1.0 25111
1384 4-tfbga B1K P2.0
ABCDEFGH
6
5
4
3
2
1
TOP VIEW (balls facing down)
A13
A9
WE#
NC
A7
A3
A12
A8
RST#
WP#
A17
A4
A14
A10
NC
A18
A6
A2
A15
A11
A19
A20
A5
A1
A16
DQ7
DQ5
DQ2
DQ0
A0
NC
DQ14
DQ12
DQ10
DQ8
CE#
DQ15
DQ13
V
DD
DQ11
DQ9
OE#
V
SS
DQ6
DQ4
DQ3
DQ1
V
SS
©2011 Silicon Storage Technology, Inc. DS25111A 12/11
5
32 Mbit Multi-Purpose Flash Plus
SST39VF3201B / SST39VF3202B
Data Sheet
A
Microchip Technology Company
Device Operation
Commands are used to initiate the memory operation functions of the device. Commands are written
to the device using standard microprocessor write sequences. A command is written by asserting WE#
low while keeping CE# low. The address bus is latched on the falling edge of WE# or CE#, whichever
occurs last. The data bus is latched on the rising edge of WE# or CE#, whichever occurs first.
The SST39VF320xB also have the Auto Low Power mode which puts the device in a near standby
mode after data has been accessed with a valid Read operation. This reduces the I
DD
active read cur-
rent from typically 9 mA to typically 4 µA. The Auto Low Power mode reduces the typical I
DD
active
read current to the range of 2 mA/MHz of Read cycle time. The device exits the Auto Low Power mode
with any address transition or control signal transition used to initiate another Read cycle, with no
access time penalty. Note that the device does not enter Auto-Low Power mode after power-up with
CE# held steadily low, until the first address transition or CE# is driven high.
Read
The Read operation of the SST39VF320xB is controlled by CE# and OE#, both have to be low for the
system to obtain data from the outputs. CE# is used for device selection. When CE# is high, the chip is
deselected and only standby power is consumed. OE# is the output control and is used to gate data
from the output pins. The data bus is in high impedance state when either CE# or OE# is high. Refer to
the Read cycle timing diagram for further details (Figure 5).
Word-Program Operation
The SST39VF320xB are programmed on a word-by-word basis. Before programming, the sector
where the word exists must be fully erased. The Program operation is accomplished in three steps.
The first step is the three-byte load sequence for Software Data Protection. The second step is to load
word address and word data. During the Word-Program operation, the addresses are latched on the
falling edge of either CE# or WE#, whichever occurs last. The data is latched on the rising edge of
either CE# or WE#, whichever occurs first. The third step is the internal Program operation which is ini-
tiated after the rising edge of the fourth WE# or CE#, whichever occurs first. The Program operation,
once initiated, will be completed within 10 µs. See Figure 6 and Figure 7 for WE# and CE# controlled
Program operation timing diagrams and Figure 21 for flowcharts. During the Program operation, the
only valid reads are Data# Polling and Toggle Bit. During the internal Program operation, the host is
free to perform additional tasks. Any commands issued during the internal Program operation are
ignored. During the command sequence, WP# should be statically held high or low.
Sector/Block-Erase Operation
The Sector- (or Block-) Erase operation allows the system to erase the device on a sector-by-sector (or
block-by-block) basis. The SST39VF320xB offer both Sector-Erase and Block-Erase mode. The sector
architecture is based on uniform sector size of 2 KWord. The Block-Erase mode is based on uniform
block size of 32 KWord. The Sector-Erase operation is initiated by executing a six-byte command
sequence with Sector-Erase command (50H) and sector address (SA) in the last bus cycle. The Block-
Erase operation is initiated by executing a six-byte command sequence with Block-Erase command
(30H) and block address (BA) in the last bus cycle. The sector or block address is latched on the falling
edge of the sixth WE# pulse, while the command (50H or 30H) is latched on the rising edge of the sixth
WE# pulse. The internal Erase operation begins after the sixth WE# pulse. The End-of-Erase opera-
tion can be determined using either Data# Polling or Toggle Bit methods. See Figure 11 and Figure 12
©2011 Silicon Storage Technology, Inc. DS25111A 12/11
6
32 Mbit Multi-Purpose Flash Plus
SST39VF3201B / SST39VF3202B
Data Sheet
A
Microchip Technology Company
for timing waveforms and Figure 25 for the flowchart. Any commands issued during the Sector- or
Block-Erase operation are ignored. When WP# is low, any attempt to Sector- (Block-) Erase the pro-
tected block will be ignored. During the command sequence, WP# should be statically held high or low.
Erase-Suspend/Erase-Resume Commands
The Erase-Suspend operation temporarily suspends a Sector- or Block-Erase operation thus allowing
data to be read from any memory location, or program data into any sector/block that is not suspended
for an Erase operation. The operation is executed by issuing one byte command sequence with Erase-
Suspend command (B0H). The device automatically enters read mode typically within 10 µs after the
Erase-Suspend command had been issued. Valid data can be read from any sector or block that is not
suspended from an Erase operation. Reading at address location within erase-suspended sectors/
blocks will output DQ
2
toggling and DQ
6
at ‘1’. While in Erase-Suspend mode, a Word-Program opera-
tion is allowed except for the sector or block selected for Erase-Suspend.
To resume Sector-Erase or Block-Erase operation which has been suspended the system must issue
Erase Resume command. The operation is executed by issuing one byte command sequence with
Erase Resume command (30H) at any address in the last Byte sequence.
Chip-Erase Operation
The SST39VF320xB provide a Chip-Erase operation, which allows the user to erase the entire mem-
ory array to the “1” state. This is useful when the entire device must be quickly erased.
The Chip-Erase operation is initiated by executing a six-byte command sequence with Chip-Erase
command (10H) at address 555H in the last byte sequence. The Erase operation begins with the rising
edge of the sixth WE# or CE#, whichever occurs first. During the Erase operation, the only valid read is
Toggle Bit or Data# Polling. See Table 6 for the command sequence, Figure 10 for timing diagram, and
Figure 25 for the flowchart. Any commands issued during the Chip-Erase operation are ignored. When
WP# is low, any attempt to Chip-Erase will be ignored. During the command sequence, WP# should
be statically held high or low.
Write Operation Status Detection
The SST39VF320xB provide two software means to detect the completion of a Write (Program or
Erase) cycle, in order to optimize the system write cycle time. The software detection includes two sta-
tus bits: Data# Polling (DQ
7
) and Toggle Bit (DQ
6
). The End-of-Write detection mode is enabled after
the rising edge of WE#, which initiates the internal Program or Erase operation.
The actual completion of the nonvolatile write is asynchronous with the system; therefore, either a
Data# Polling or Toggle Bit read may be simultaneous with the completion of the write cycle. If this
occurs, the system may possibly get an erroneous result, i.e., valid data may appear to conflict with
either DQ
7
or DQ
6
. In order to prevent spurious rejection, if an erroneous result occurs, the software
routine should include a loop to read the accessed location an additional two (2) times. If both reads
are valid, then the device has completed the Write cycle, otherwise the rejection is valid.

SST39VF3202B-70-4I-B3KE-T

Mfr. #:
Manufacturer:
Microchip Technology
Description:
NOR Flash 32M (2Mx16) 70ns 2.7-3.6V Industrial
Lifecycle:
New from this manufacturer.
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