ADG506ATQ

ADG506A/ADG507A
–4–
REV. C
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the ADG506A/ADG507A feature proprietary ESD protection circuitry, permanent
damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper
ESD precautions are recommended to avoid performance degradation or loss of functionality.
ABSOLUTE MAXIMUM RATINGS
1
(T
A
= 25°C unless otherwise noted)
V
DD
to V
SS
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44 V
V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 V
V
SS
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –25 V
Analog Inputs
2
Voltage at S, D . . . . . . . . . . . . . . . . . . . . . . . V
SS
– 2 V to V
DD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . + 2 V or
. . . . . . . . . . . . . . . . . . . . . . 20 mA, Whichever Occurs First
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 20 mA
Pulsed Current S or D
1 ms Duration, 10% Duty Cycle . . . . . . . . . . . . . . . . 40 mA
Digital Inputs
2
Voltage at A, EN . . . . . . . . . . . . . . . . . . . . . . . . . . V
SS
– 4 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . to V
DD
+ 4 V or
. . . . . . . . . . . . . . . . . . . . . . 20 mA, Whichever Occurs First
Power Dissipation (Any Package)
Up to +75°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 470 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . 6 mW/°C
Operating Temperature
Commercial (K Version) . . . . . . . . . . . . . . 40°C to +85°C
Industrial (B Version) . . . . . . . . . . . . . . . . 40°C to +85°C
Extended (T Version) . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . . +300°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2
Overvoltage at A, EN, S or D will be clamped by diodes. Current should be limited
to the Maximum Rating above.
PIN CONFIGURATIONS
DIP, SOIC
14
13
12
11
17
16
15
20
19
18
10
9
8
1
2
3
4
7
6
5
TOP VIEW
(Not to Scale)
28
27
26
25
24
23
22
21
ADG506A
NC = NO CONNECT
V
DD
S7
S8
V
SS
D
NC
NC
S16
S4
S5
S6
S15
S14
S13
S12
S11
S10
S1
S2
S3
S9
GND
NC
A3
EN
A2
A1
A0
LCCC
28 271
2
3426
25
21
22
23
24
19
20
5
6
7
8
9
10
11
12
13 14 15 16 17 18
TOP VIEW
(Not to Scale)
NC = NO CONNECT
S7A
S6A
S5A
S4A
S3A
S2A
S1A
GND
NC
A1
A0
S8B
NC
DB
V
DD
DA
S8A
EN
S7B
S6B
S5B
S4B
S3B
S2B
S1B
V
SS
ADG507A
A2
NC
PLCC
7
8
9
10
11
5
6
28 27 261234
21
22
23
24
25
19
20
12
13
14 15 16 17 18
TOP VIEW
(Not to Scale)
PIN 1
IDENTIFIER
S7B
S6B
S5B
S4B
S3B
S7A
S6A
S5A
S4A
S3A
NC = NO CONNECT
ADG507A
S2B
S1B
S2A
S1A
NC
V
DD
A2
A1
A0
V
SS
GND
NC
EN
DB
DA
NC
S8A
S8B
PLCC
7
8
9
10
11
5
6
28 27 261234
21
22
23
24
25
19
20
12
13
14 15 16 17 18
TOP VIEW
(Not to Scale)
PIN 1
IDENTIFIER
S15
S14
S13
S12
S11
S7
S6
S5
S4
S3
NC = NO CONNECT
ADG506A
S10
S9
S2
S1
NC
NC
V
DD
D
A3
A2
A1
A0
V
SS
S8
GND
NC
EN
S16
DIP, SOIC, TSSOP
14
13
12
11
17
16
15
20
19
18
10
9
8
1
2
3
4
7
6
5
TOP VIEW
(Not to Scale)
28
27
26
25
24
23
22
21
ADG507A
NC = NO CONNECT
V
DD
S7A
S8A
V
SS
DA
DB
NC
S8B
S4A
S5A
S6A
S7B
S6B
S5B
S4B
S3B
S2B
S1A
S2A
S3A
S1B
GND
NC
NC
EN
A2
A1
A0
LCCC
28 271
2
3426
25
21
22
23
24
19
20
5
6
7
8
9
10
11
12
13 14 15 16 17 18
TOP VIEW
(Not to Scale)
NC = NO CONNECT
S7
S6
S5
S4
S3
S2
S1
GND
NC
A3
A1
A0
EN
S15
S14
S13
S12
S11
S10
S9
S16
NC
NC
V
DD
D
V
SS
S8
ADG506A
A2
WARNING!
ESD SENSITIVE DEVICE
ADG506A/ADG507A
–5–
REV. C
Typical Performance Characteristics–
The multiplexers are guaranteed functional with reduced single or dual supplies down to 4.5 V.
Figure 1. R
ON
as a Function of V
D
(V
S
): Dual Supply
Voltage, T
A
= +25
°
C
Figure 2. Leakage Current as a Function of Temperature
(Note: Leakage Currents Reduce as the Supply Voltages
Reduce)
Figure 3. t
TRANSITION
vs. Supply Voltage: Dual and Single
Supplies, T
A
= + 25
°
C (Note: For V
DD
and /V
SS
/ < 10 V; V1 =
V
DD
/V
SS
, V2 = V
SS
/V
DD
. See Test Circuit 6)
Figure 4. R
ON
as a Function of V
D
(V
S
) Single Supply
Voltage, T
A
= +25
°
C
Figure 5. Trigger Levels vs. Power Supply Voltage, Dual
or Single Supply, T
A
= +25
°
C
Figure 6. I
DD
vs. Supply Voltage: Dual or Single Supply,
T
A
= +25
°
C
ADG506A/ADG507A
–6–
REV. C
–Test Circuits
Note: All Digital Input Signal Rise and Fall Times Measured from 10% to 90% of 3 V. t
R
= t
F
= 20 ns.
Test Circuit 6. Switching Time of Multiplexer, t
TRANSITION
Test Circuit 7. Break-Before-Make Delay, t
OPEN
Test Circuit 1. R
ON
Test Circuit 2. I
S
(OFF)
Test Circuit 3. I
D
(OFF)
Test Circuit 4. I
D
(ON)
Test Circuit 5. I
DIFF

ADG506ATQ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Multiplexer Switch ICs 16:1 280 Ohm CMOS IC
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union