74AUP2G86 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 24 January 2013 9 of 21
NXP Semiconductors
74AUP2G86
Low-power dual 2-input EXCLUSIVE-OR gate
[1] All typical values are measured at nominal V
CC
.
[2] t
pd
is the same as t
PLH
and t
PHL
.
[3] C
PD
is used to determine the dynamic power dissipation (P
D
in W).
P
D
= C
PD
V
CC
2
f
i
N + (C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= output load capacitance in pF;
V
CC
= supply voltage in V;
N = number of inputs switching;
(C
L
V
CC
2
f
o
) = sum of the outputs.
12. Waveforms
C
L
= 5 pF, 10 pF, 15 pF and 30 pF
C
PD
power dissipation
capacitance
f = 1 MHz; V
I
= GND to V
CC
[3]
V
CC
= 0.8 V - 2.7 - - - - pF
V
CC
= 1.1 V to 1.3 V - 2.9 - - - - pF
V
CC
= 1.4 V to 1.6 V - 3.0 - - - - pF
V
CC
= 1.65 V to 1.95 V - 3.1 - - - - pF
V
CC
= 2.3 V to 2.7 V - 3.6 - - - - pF
V
CC
= 3.0 V to 3.6 V - 4.2 - - - - pF
Table 8. Dynamic characteristics
…continued
Voltages are referenced to GND (ground = 0 V); for test circuit see Figure 9.
Symbol Parameter Conditions 25 C 40 C to +125 C Unit
Min Typ
[1]
Max Min Max
(85 C)
Max
(125 C)
Measurement points are given in Table 9.
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 8. The data input (nA or nB) to output (nY) propagation delays
mna224
nA, nB input
nY output
t
PLH
t
PHL
GND
V
I
V
M
V
M
V
OH
V
OL
Table 9. Measurement points
Supply voltage Output Input
V
CC
V
M
V
M
V
I
t
r
= t
f
0.8 V to 3.6 V 0.5 V
CC
0.5 V
CC
V
CC
3.0 ns
74AUP2G86 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 24 January 2013 10 of 21
NXP Semiconductors
74AUP2G86
Low-power dual 2-input EXCLUSIVE-OR gate
[1] For measuring enable and disable times R
L
= 5 k.
For measuring propagation delays, set-up and hold times and pulse width R
L
= 1 M.
Test data is given in Table 10
.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to the output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 9. Test circuit for measuring switching times
001aac521
DUT
R
T
V
I
V
O
V
EXT
V
CC
R
L
5 kΩ
C
L
G
Table 10. Test data
Supply voltage Load V
EXT
V
CC
C
L
R
L
[1]
t
PLH
, t
PHL
t
PZH
, t
PHZ
t
PZL
, t
PLZ
0.8 V to 3.6 V 5 pF, 10 pF, 15 pF and 30 pF 5 k or 1 M open GND 2 V
CC
74AUP2G86 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 24 January 2013 11 of 21
NXP Semiconductors
74AUP2G86
Low-power dual 2-input EXCLUSIVE-OR gate
13. Package outline
Fig 10. Package outline SOT765-1 (VSSOP8)
UNIT
A
1
A
max.
A
2
A
3
b
p
LH
E
L
p
wyv
ceD
(1)
E
(2)
Z
(1)
θ
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC JEITA
mm
0.15
0.00
0.85
0.60
0.27
0.17
0.23
0.08
2.1
1.9
2.4
2.2
0.5
3.2
3.0
0.4
0.1
8°
0°
0.13 0.10.20.4
DIMENSIONS (mm are the original dimensions)
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
0.40
0.15
Q
0.21
0.19
SOT765-1 MO-187
02-06-07
w M
b
p
D
Z
e
0.12
14
8
5
θ
A
2
A
1
Q
L
p
(A
3
)
detail X
A
L
H
E
E
c
v M
A
X
A
y
2.5 5 mm0
scale
VSSOP8: plastic very thin shrink small outline package; 8 leads; body width 2.3 mm
SOT765-1
1
pin 1 index

74AUP2G86GS,115

Mfr. #:
Manufacturer:
Nexperia
Description:
Logic Gates OR 4.6 V 20 mA
Lifecycle:
New from this manufacturer.
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