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N74F299D,623

P1-P3P4-P6P7-P9P10-P12
Philips Semiconductors Product data
74F2998-bit universal shift/storage register (3-State)
2003 Feb 05
4
LOGIC DIAGRAM
R
D
Q
Q7
I/O7
S0
D
CP
R
D
Q
I/O6
D
CP
R
D
Q
I/O5
D
CP
R
D
Q
I/O4
D
CP
R
D
Q
I/O3
D
CP
R
D
Q
I/O2
D
CP
R
D
Q
I/O1
D
CP
R
D
Q
I/O0
D
CP
Q0
MR
CP
DS0
S1
OE1
OE
0
DS7
SF00868
18
2
3
19
1
11
12
9
V
CC
= Pin 20
GND = Pin 10
17
16
4
15
5
14
6
13
7
8
Philips Semiconductors Product data
74F2998-bit universal shift/storage register (3-State)
2003 Feb 05
5
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free-air temperature range.)
SYMBOL PARAMETER RATING UNIT
V
CC
Supply voltage –0.5 to +7.0 V
V
IN
Input voltage –0.5 to +7.0 V
I
IN
Input current –30 to +5 mA
V
OUT
Voltage applied to output in HIGH output state –0.5 to +V
CC
V
I
O
Current a
pp
lied to out
p
ut in LOW out
p
ut state
Q0, Q7 40 mA
I
OUT
C
u
rrent
applied
to
o
u
tp
u
t
in
LOW
o
u
tp
u
t
state
I/On 48 mA
T
amb
Operating free-air temperature range 0 to +70 °C
T
stg
Storage temperature –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER LIMITS UNIT
MIN NOM MAX
V
CC
Supply voltage 4.5 5.0 5.5 V
V
IH
HIGH-level input voltage 2.0 V
V
IL
LOW-level input voltage 0.8 V
I
IK
Input clamp current –18 mA
I
O
HIGH level out
p
ut current
Q0, Q7 –1 mA
I
OH
HIGH
-
le
v
el
o
u
tp
u
t
c
u
rrent
I/On –3 mA
I
O
LOW level out
p
ut current
Q0, Q7 20 mA
I
OL
LOW
-
le
v
el
o
u
tp
u
t
c
u
rrent
I/On 24 mA
T
amb
Operating free-air temperature range 0 70 °C
Philips Semiconductors Product data
74F2998-bit universal shift/storage register (3-State)
2003 Feb 05
6
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST
CONDITIONS
1
MIN TYP
2
MAX
UNIT
Q0 Q7
I
O
=1mA
±10%V
CC
2.5 V
V
O
p
Q0
,
Q7
V
CC
= MIN,
V MAX
I
OH
= –
1
mA
±5%V
CC
2.7 3.4 V
V
OH
-
v
u
u
v
I/On
V
IL
=
MAX
,
V
IH
= MIN
I
O
=3mA
±10%V
CC
2.4 V
I/On
IH
I
OH
= –
3
mA
±5%V
CC
2.7 3.3 V
V
O
LOW level out
p
ut voltage
V
CC
= MIN,
V MAX
I
O
= MAX
±10%V
CC
0.35 0.50 V
V
OL
LOW
-
le
v
el
o
u
tp
u
t
v
oltage
V
IL
=
MAX
,
V
IH
= MIN
I
OL
=
MAX
±5%V
CC
0.35 0.50 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
–0.73 –1.2 V
I
I
Input current at maximum
others V
CC
= MAX, V
I
= 7.0 V 100 µA
input voltage
I/On V
CC
= 5.5V, V
I
= 5.5 V 1 mA
I
IH
HIGH-level input current
except
I/On
V
CC
= MAX, V
I
= 2.7 V 20 µA
I
p
S0, S1
V
CC
= MAX V =05V
–1.2 mA
I
IL
-
v
u
u
others
V
CC
=
MAX
,
V
I
=
0
.
5
V
–0.6 mA
I
IH
+
I
OZH
Off-state output current,
HIGH-level voltage applied
I/On
V
CC
= MAX, V
O
= 2.7 V 70 µA
I
IL
+
I
OZL
Off-state output current
LOW-level voltage applied
I/On
only
V
CC
= MAX, V
O
= 0.5 V –0.6 mA
I
OS
Short-circuit output current
3
V
CC
= MAX –60 –150 mA
I
CCH
55 60 mA
I
CC
Supply current (total) I
CCL
V
CC
= MAX 70 90 mA
I
CCZ
65 95 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5 V, T
amb
= 25 °C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
P1-P3P4-P6P7-P9P10-P12

N74F299D,623

Mfr. #:
Buy N74F299D,623
Manufacturer:
NXP Semiconductors
Description:
Counter Shift Registers OCTAL SHIFT/STORAGE
Lifecycle:
New from this manufacturer.
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