MAX3372E–MAX3379E/MAX3390E–MAX3393E
±15kV ESD-Protected, 1µA, 16Mbps, Dual/Quad
Low-Voltage Level Translators in UCSP
13
Maxim Integrated
CHARGE-CURRENT-
LIMIT RESISTOR
DISCHARGE
RESISTANCE
STORAGE
CAPACITOR
C
s
100pF
R
C
1MΩ R
D
1500Ω
HIGH-
VOLTAGE
DC
SOURCE
DEVICE-
UNDER-
TEST
Figure 3a. Human Body ESD Test Model
I
P
100%
90%
36.8%
t
RL
TIME
t
DL
CURRENT WAVEFORM
PEAK-TO-PEAK RINGING
(NOT DRAWN TO SCALE)
I
r
10%
0
0
AMPERES
Figure 3b. Human Body Current Waveform
±15kV ESD Protection
As with all Maxim devices, ESD-protection structures are
incorporated on all pins to protect against electrostatic
discharges encountered during handling and assembly.
The I/O V
CC
lines have extra protection against static
electricity. Maxim’s engineers have developed state-of-
the-art structures to protect these pins against ESD of
±15kV without damage. The ESD structures withstand
high ESD in all states: normal operation, three-state
output mode, and powered down. After an ESD event,
Maxim’s E versions keep working without latchup,
whereas competing products can latch and must be
powered down to remove latchup.
ESD protection can be tested in various ways. The I/O
V
CC
lines of this product family are characterized for
protection to the following limits:
1) ±15kV using the Human Body Model
2) ±8kV using the Contact Discharge method specified
in IEC 1000-4-2
3) ±10kV using IEC 1000-4-2’s Air-Gap Discharge
method
ESD Test Conditions
ESD performance depends on a variety of conditions.
Contact Maxim for a reliability report that documents
test setup, test methodology, and test results.
Human Body Model
Figure 3a shows the Human Body Model and Figure 3b
shows the current waveform it generates when dis-
charged into a low impedance. This model consists of
a 100pF capacitor charged to the ESD voltage of inter-
est, which is then discharged into the test device
through a 1.5kΩ resistor.
IEC 1000-4-2
The IEC 1000-4-2 standard covers ESD testing and
performance of finished equipment; it does not specifi-
cally refer to integrated circuits. The MAX3372E–
MAX3379E and MAX3390E–MAX3393E help to design
equipment that meets Level 3 of IEC 1000-4-2, without
the need for additional ESD-protection components.
The major difference between tests done using the
Human Body Model and IEC 1000-4-2 is higher peak
current in IEC 1000-4-2, because series resistance is
lower in the IEC 1000-4-2 model. Hence, the ESD with-
stand voltage measured to IEC 1000-4-2 is generally
lower than that measured using the Human Body Model.
Figure 4a shows the IEC 1000-4-2 model, and Figure 4b
shows the current waveform for the ±8kV, IEC 1000-4-2,
Level 4, ESD contact-discharge test.
The air-gap test involves approaching the device with a
charged probe. The contact-discharge method con-
nects the probe to the device before the probe
is energized.
Machine Model
The Machine Model for ESD tests all pins using a
200pF storage capacitor and zero discharge resis-
tance. Its objective is to emulate the stress caused by
contact that occurs with handling and assembly during
manufacturing. Of course, all pins require this protec-
tion during manufacturing, not just inputs and outputs.
Therefore, after PCB assembly, the Machine Model is
less relevant to I/O ports.
Applications Information
Power-Supply Decoupling
To reduce ripple and the chance of transmitting incor-
rect data, bypass V
L
and V
CC
to ground with a 0.1µF
capacitor. See the
Typical Operating Circuit.
To ensure
full ±15kV ESD protection, bypass V
CC
to ground with a
1µF capacitor. Place all capacitors as close to the
power-supply inputs as possible.
I
2
C Level Translation
The MAX3373E–MAX3376E, MAX3378E/MAX3379E
and MAX3390E–MAX3393E level-shift the data present
on the I/O lines between +1.2V and +5.5V, making
them ideal for level translation between a low-voltage
ASIC and an I
2
C device. A typical application involves
interfacing a low-voltage microprocessor to a 3V or 5V
D/A converter, such as the MAX517.
Push-Pull vs. Open-Drain Driving
All devices in the MAX3372E–MAX3379E and
MAX3390E–MAX3393E family may be driven in a push-
pull configuration. The MAX3373E–MAX3376E/
MAX3378E/MAX3379E and MAX3390E–MAX3393E
include internal 10kΩ resistors that pull up I/O V
L_
and
I/O V
CC_
to their respective power supplies, allowing
operation of the I/O lines with open-drain devices. See
the
Timing Characteristics
table for maximum data rates
when using open-drain drivers.
MAX3372E–MAX3379E/MAX3390E–MAX3393E
±15kV ESD-Protected, 1µA, 16Mbps, Dual/Quad
Low-Voltage Level Translators in UCSP
14
Maxim Integrated
t
r
= 0.7ns to 1ns
30ns
60ns
t
100%
90%
10%
I
PEAK
I
Figure 4b. IEC 1000-4-2 ESD Generator Current Waveform
CHARGE-CURRENT-
LIMIT RESISTOR
DISCHARGE
RESISTANCE
STORAGE
CAPACITOR
C
s
150pF
R
C
50MΩ to 100MΩ R
D
330Ω
HIGH-
VOLTAGE
DC
SOURCE
DEVICE-
UNDER-
TEST
Figure 4a. IEC 1000-4-2 ESD Test Model
MAX3378E–MAX3383E
THREE-STATE
I/O V
L_
DATA
DATA
I/O V
CC_
0.1µF0.1µF
1µF
+3.3V+1.8V
V
CC
+3.3V
SYSTEM
+1.8V
SYSTEM
CONTROLLER
V
L
Typical Operating Circuit
MAX3372E–MAX3379E/MAX3390E–MAX3393E
±15kV ESD-Protected, 1µA, 16Mbps, Dual/Quad
Low-Voltage Level Translators in UCSP
15
Maxim Integrated
MAX3372E/MAX3373E
THREE-STATE
I/O V
L2
I/O V
L1
DATADATA
I/O V
CC2
I/O V
CC1
0.1µF0.1µF 1µF
+3.3V+1.8V
V
CC
+3.3V
SYSTEM
+1.8V
SYSTEM
CONTROLLER
V
L
MAX3374E
THREE-STATE
I V
L2
I V
L1
DATADATA
O V
CC1
O V
CC2
0.1µF0.1µF 1µF
+3.3V+1.8V
V
CC
+3.3V
SYSTEM
+1.8V
SYSTEM
CONTROLLER
V
L
Applications Circuits

MAX3379EETD+

Mfr. #:
Manufacturer:
Maxim Integrated
Description:
Translation - Voltage Levels Low Vltg Level Translators
Lifecycle:
New from this manufacturer.
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