MAX3344E/MAX3345E
±15kV ESD-Protected USB Transceivers
in UCSP with USB Detect
10 ______________________________________________________________________________________
Table 3a. Truth Table Transmit (SUSP = 0, OE = 0, ENUM = X)
INPUT OUTPUT
MODE VPO VMO D+ D- RCV VPI VMI RESULT
00001001LOGIC 0
00100RCV* 0 0 SE0
01010110LOGIC 1
01100RCV* 0 0 SE0
10000RCV* 0 0 SE0
10101001LOGIC 0
11010110LOGIC 1
11111X11
UNDEFINED
Table 3b. Truth Table Receive (SUSP = 0, OE = 1, ENUM = X)
INPUT OUTPUT
D+ D- RCV
VPI
VMI
RESULT
00RCV* 0 0 SE0
01001LOGIC 0
10110LOGIC 1
11X11UNDEFINED
INPUT OUTPUT
D+ D- RCV
VPI VMI
RESULT
00000VPI/VMI ACTIVE
01001VPI/VMI ACTIVE
10010VPI/VMI ACTIVE
11011VPI/VMI ACTIVE
*Timing specifications are not guaranteed for D+ and D-.
Table 3c. Truth Table Transmit in Suspend* (SUSP = 1, OE = 0, ENUM = X)
INPUT OUTPUT
MODE VPO VMO D+ D- RCV VPI VMI RESULT
00001001LOGIC 0
00100000SE0
01010010LOGIC 1
01100000SE0
10000000SE0
10101001LOGIC 0
11010010LOGIC 1
11111011
UNDEFINED
Table 3d. Truth Table Receive in Suspend* (SUSP = 1, OE = 1, MODE = X, VPO/VMO = X,
ENUM = X)
*Timing specifications are not guaranteed for D+ and D-.
*RCV denotes the signal level on output RCV just before SE0 state occurs. This level is stable during the SE0 period.
*RCV denotes the signal level on output RCV just before SE0 state occurs. This level is stable during the SE0 period.
IEC 1000-4-2
The IEC 1000-4-2 standard covers ESD testing and per-
formance of finished equipment; it does not specifically
refer to integrated circuits. The MAX3344E/MAX3345E
help the user design equipment that meets level 4 of IEC
1000-4-2, without the need for additional ESD-protection
components.
The major difference between tests done using the
Human Body Model and IEC 1000-4-2 is a higher peak
current in IEC 1000-4-2, because series resistance is
lower in the IEC 1000-4-2 model. Hence, the ESD with-
stand voltage measured to IEC 1000-4-2 is generally
lower than that measured using the Human Body Model.
Figure 1c shows the IEC 1000-4-2 model.
The Air-Gap Discharge Method involves approaching
the device with a charged probe. The Contact
Discharge Method connects the probe to the device
before the probe is energized.
Machine Model
The Machine Model for ESD tests all pins using a 200pF
storage capacitor and zero discharge resistance. Its
objective is to emulate the stress caused by contact that
occurs with handling and assembly during manufactur-
ing. All pins require this protection during manufactur-
ing. Therefore, after PC board assembly, the Machine
Model is less relevant to I/O ports.
Applications Information
External Components
External Resistors
Two external 23.7 ±1% to 27.4 ±1%, 1/2W resistors
are required for USB connection. Place the resistors
in between the MAX3344E/MAX3345E and the USB
connector on the D+ and D- lines (see the Typical
Operating Circuit).
External Capacitors
Use three external capacitors for proper operation. Use
a 0.1µF ceramic for decoupling V
L
, a 1µF ceramic for
decoupling V
CC
, and a 1.0µF (min) ceramic or plastic
filter capacitor on VTRM. Return all capacitors to GND.
UCSP Applications Information
For the latest application details on UCSP construction,
dimensions, tape carrier information, printed circuit board
techniques, bump-pad layout, and recommended reflow
temperature profile, as well as the latest information on
reliability testing results, refer to the Application Note
UCSP—A Wafer-Level Chip-Scale Package available on
Maxim’s website at www.maxim-ic.com/ucsp.
MAX3344E/MAX3345E
±15kV ESD-Protected USB Transceivers
in UCSP with USB Detect
______________________________________________________________________________________ 11
Chip Information
TRANSISTOR COUNT: 2162
PROCESS: BiCMOS
MAX3344E/MAX3345E
±15kV ESD-Protected USB Transceivers
in UCSP with USB Detect
12 ______________________________________________________________________________________
t
PHL(RCV)
t
PLH(RCV)
t
PHL(SE)
t
PLH(SE)
t
PLH(SE)
t
PHL(SE)
D+
D-
RCV
VPI
VMI
D+/D- RISE/FALL TIMES 8ns, V
L
= 1.65V, 2.5V, 3.3V
3V
0V
V
L
V
L
/2
V
L
/2
V
L
/2
0V
V
L
0V
V
L
0V
Figure 5. D+/D- to RCV, VPI, VMI Propagation Delays
(c) LOAD FOR ENABLE AND DISABLE TIME, D+/D-
(a) LOAD FOR VPI, VMI, AND RCV
VMI OR VPI OR RCV
MAX3344E
MAX3345E
25pF
TEST POINT
D+ OR D-
20023.7
MAX3344E
MAX3345E
50pF
GND
OR V
CC
+
-
TEST POINT
D+
D-
USB_DET
23.7
C
L
= 50pF
C
L
= 50pF
15k
1.5k
3.3V
MAX3344E
MAX3345E
TEST POINT
(b) LOAD FOR D+, D-, AND USB_DET
23.7
15k
TEST POINT
25pF
Figure 6. Test Circuits

MAX3344EEUE+

Mfr. #:
Manufacturer:
Maxim Integrated
Description:
USB Interface IC ESD-Protected USB Tcvr
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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