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CAT1641YI-28-GT3

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18
CAT1640, CAT1641
http://onsemi.com
4
SPECIFICATIONS
Table 4. ABSOLUTE MAXIMUM RATINGS
Parameters Ratings Units
Temperature Under Bias –40 to +85 °C
Storage Temperature –65 to +105 °C
Voltage on any Pin with Respect to Ground (Note 1) −0.5 to V
CC
+ 2.0 V
V
CC
with Respect to Ground −0.5 to +7.0 V
Package Power Dissipation Capability (T
A
= 25°C) 1.0 W
Lead Soldering Temperature (10 seconds) 300 °C
Output Short Circuit Current (Note 1) 100 mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Output shorted for no more than one second. No more than one output shorted at a time.
Table 5. D.C. OPERATING CHARACTERISTICS
V
CC
= +3.0 V to +5.5 V and over the recommended temperature conditions unless otherwise specified.
Symbol
Parameter Test Conditions Min Typ Max Units
I
LI
Input Leakage Current V
IN
= GND to V
CC
−2 10
mA
I
LO
Output Leakage Current V
IN
= GND to V
CC
−10 10
mA
I
CC1
Power Supply Current (Write) f
SCL
= 400 kHz
V
CC
= 5.5 V
3 mA
I
CC2
Power Supply Current (Read) f
SCL
= 400 kHz
V
CC
= 5.5 V
1 mA
I
SB
Standby Current V
CC
= 5.5 V
V
IN
= GND or V
CC
40
mA
V
IL
(Note 3) Input Low Voltage −0.5 0.3 x V
CC
V
V
IH
(Note 3) Input High Voltage 0.7 x V
CC
V
CC
+ 0.5 V
V
OL
Output Low Voltage
(SDA, RESET)
I
OL
= 3 mA
V
CC
= 3.0 V
0.4 V
V
OH
Output High Voltage
(RESET)
I
OH
= −0.4 mA
V
CC
= 3.0 V
V
CC
− 0.75 V
V
TH
Reset Threshold
CAT164x−45
(V
CC
= 5.0 V)
4.50 4.75
V
CAT164x−42
(V
CC
= 5.0 V)
4.25 4.50
CAT164x−30
(V
CC
= 3.3 V)
3.00 3.15
CAT164x−28
(V
CC
= 3.3 V)
2.85 3.00
CAT164x−25
(V
CC
= 3.0 V)
2.55 2.70
V
RVALID
(Note 2) Reset Output Valid V
CC
Voltage 1.00 V
V
RT
(Note 2) Reset Threshold Hysteresis 15 mV
2. This parameter is tested initially and after a design or process change that affects the parameter. Not 100% tested.
3. V
IL
min and V
IH
max are reference values only and are not tested.
CAT1640, CAT1641
http://onsemi.com
5
Table 6. CAPACITANCE
T
A
= 25°C, f = 1.0 MHz, V
CC
= 5 V
Symbol
Test Test Conditions Max Units
C
OUT
(Note 1) Output Capacitance V
OUT
= 0 V 8 pF
C
IN
(Note 1) Input Capacitance V
IN
= 0 V 6 pF
Table 7. AC CHARACTERISTICS
V
CC
= 3.0 V to 5.5 V and over the recommended temperature conditions, unless otherwise specified.
Memory Read & Write Cycle (Note 2)
Symbol
Parameter Min Max Units
f
SCL
Clock Frequency 400 kHz
t
SP
Input Filter Spike Suppression (SDA, SCL) 100 ns
t
LOW
Clock Low Period 1.3
ms
t
HIGH
Clock High Period 0.6
ms
t
R
(Note 1) SDA and SCL Rise Time 300 ns
t
F
(Note 1) SDA and SCL Fall Time 300 ns
t
HD;
STA
Start Condition Hold Time 0.6
ms
t
SU;
STA
Start Condition Setup Time (for a Repeated Start) 0.6
ms
t
HD;
DAT
Data Input Hold Time 0 ns
t
SU;
DAT
Data Input Setup Time 100 ns
t
SU;
STO
Stop Condition Setup Time 0.6
ms
t
AA
SCL Low to Data Out Valid 900 ns
t
DH
Data Out Hold Time 50 ns
t
BUF
(Note 1) Time the Bus must be Free Before a New Transmission Can Start 1.3
ms
t
WC
(Note 3) Write Cycle Time (Byte or Page) 5 ms
1. This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested.
2. Test Conditions according to “AC Test Conditions” table.
3. The write cycle time is the time from a valid stop condition of a write sequence to the end of the internal program/erase cycle. During the
write cycle, the bus interface circuits are disabled, SDA is allowed to remain high and the device does not respond to its slave address.
CAT1640, CAT1641
http://onsemi.com
6
Table 8. RESET CIRCUIT AC CHARACTERISTICS
Symbol Parameter Test Conditions Min Typ Max Units
t
PURST
Reset Timeout Note 2 130 200 270 ms
t
RDP
V
TH
to RESET output Delay Note 3 5
ms
t
GLITCH
V
CC
Glitch Reject Pulse Width Notes 4 and 5 30 ns
MR Glitch Manual Reset Glitch Immunity Note 5 100 ns
t
MRW
MR Pulse Width Note 5 5
ms
Table 9. POWER−UP TIMING (Notes 5 and 6)
Symbol
Parameter Test Conditions Min Typ Max Units
t
PUR
Power−Up to Read Operation 270 ms
t
PUW
Power−Up to Write Operation 270 ms
Table 10. AC TEST CONDITIONS
Parameter Test Conditions
Input Pulse Voltages 0.2 V
CC
to 0.8 V
CC
Input Rise and Fall Times 10 ns
Input Reference Voltages 0.3 V
CC
, 0.7 V
CC
Output Reference Voltages 0.5 V
CC
Output Load Current Source: I
OL
= 3 mA; C
L
= 100 pF
Table 11. RELIABILITY CHARACTERISTICS
Symbol Parameter Reference Test Method Min Max Units
N
END
(Note 5) Endurance MIL−STD−883, Test Method 1033 1,000,000 Cycles/Byte
T
DR
(Note 5) Data Retention MIL−STD−883, Test Method 1008 100 Years
V
ZAP
(Note 5) ESD Susceptibility MIL−STD−883, Test Method 3015 2000 Volts
I
LTH
(Notes 5 & 7) Latch−Up JEDEC Standard 17 100 mA
1. Test Conditions according to “AC Test Conditions” table.
2. Power−up, Input Reference Voltage V
CC
= V
TH
, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
3. Power−Down, Input Reference Voltage V
CC
= V
TH
, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
4. V
CC
Glitch Reference Voltage = V
THmin
; Based on characterization data
5. This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested.
6. t
PUR
and t
PUW
are the delays required from the time V
CC
is stable until the specified memory operation can be initiated.
7. Latch−up protection is provided for stresses up to 100 mA on input and output pins from −1 V to V
CC
+ 1 V.
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18

CAT1641YI-28-GT3

Mfr. #:
Buy CAT1641YI-28-GT3
Manufacturer:
ON Semiconductor
Description:
Supervisory Circuits CPU SUP W/64K EEPROM
Lifecycle:
New from this manufacturer.
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