Test circuits THBT15011, THBT20011, THBT27011
4/11 Doc ID 3767 Rev 9
2 Test circuits
2.1 Test procedure for test circuit 1 for I
BO
and V
BO
parameters
Figure 4. Test circuit 1 for I
BO
and V
BO
parameters
Pulse test duration (t
p
= 20 ms):
● For bidirectional devices switch K is closed.
● For unidirectional devices switch K is open.
V
OUT
selection:
● For device with V
BO
< 200 V, V
OUT
= 250 V
RMS
, R1 = 140 Ω.
● For device with V
BO
≥ 200 V, V
OUT
= 480 V
RMS
, R2 = 240 Ω.
2.2 Test procedure for test circuit 2 for dynamic I
H
parameter
Figure 5. Test circuit 2 for dynamic I
H
parameter
This is a go no-go test, which can confirm the holding current (I
H
) level.
Procedure
1. Adjust the current level at the I
H
value by short circuiting the AK of the D.U.T.
2. Fire the D.U.T. with a surge current I
PP
= 10A, 10/1000µs.
3. The D.U.T. will come back off-state within 50 ms maximum.
220V 50Hz
1/4
R1 = 140Ω
R2 = 240Ω
K
ton = 20ms
IBO
measurement
VBO
measurement
Vout
DUT
R
V
BAT
= - 48 V
Surge generator
D.U.T
