STW29NK50ZD

P1-P3 P4-P6 P7-P9 P10-P10

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STW29NK50ZD

Figure 16: Unclamped Inductive Load Test Cir-

cuit

Figure 17: Switching Times Test Circuit For

Resistive Load

Figure 18: Test Circuit For Inductive Load

Switching and Diode Recovery Times

Figure 19: Unclamped Inductive Wafeform

Figure 20: Gate Charge Test Circuit

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STW29NK50ZD

8/10

DIM.

mm. inch

MIN. TYP MAX. MIN. TYP. MAX.

A 4.85 5.15 0.19 0.20

A1 2.20 2.60 0.086 0.102

b 1.0 1.40 0.039 0.055

b1 2.0 2.40 0.079 0.094

b2 3.0 3.40 0.118 0.134

c 0.40 0.80 0.015 0.03

D 19.85 20.15 0.781 0.793

E 15.45 15.75 0.608 0.620

e5.45 0.214

L 14.20 14.80 0.560 0.582

L1 3.70 4.30 0.14 0.17

L2 18.50 0.728

øP 3.55 3.65 0.140 0.143

øR 4.50 5.50 0.177 0.216

S5.50 0.216

TO-247 MECHANICAL DATA

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STW29NK50ZD

Table 10: Revision History

Date Revision Description of Changes

05-Feb-2004 1 First Release.

06-Dec-2004 2 Some electrical value changed

20-Jul-2005 3 Complete version

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P1-P3 P4-P6 P7-P9 P10-P10

STW29NK50ZD

Mfr. #:

Buy STW29NK50ZD

Manufacturer:

STMicroelectronics

Description:

MOSFET N-CHANNEL MOSFET

Lifecycle:

New from this manufacturer.

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STW29NK50ZD