Detailed Description
The MAX1185 uses a nine-stage, fully-differential,
pipelined architecture (Figure 1) that allows for high-
speed conversion while minimizing power consumption.
Samples taken at the inputs move progressively through
the pipeline stages every half-clock cycle. Including the
delay through the output latch, the total clock-cycle
latency is five clock cycles.
1.5-bit (2-comparator) flash ADCs convert the held input
voltages into a digital code. The digital-to-analog con-
verters (DACs) convert the digitized results back into
analog voltages, which are then subtracted from the
original held input signals. The resulting error signals
are then multiplied by two and the residues are passed
along to the next pipeline stages, where the process is
repeated until the signals have been processed by all
nine stages. Digital error correction compensates for
ADC comparator offsets in each of these pipeline
stages and ensures no missing codes.
Both input channels are sampled on the rising edge of
the clock and the resulting data is multiplexed at the
output. CHA data is updated on the rising edge (five
clock cycles later) and CHB data is updated on the
falling edge (5.5 clock cycles later) of the clock signal.
The A/B indicator follows the clock signal with a typical
delay time of 6ns and remains high when CHA data is
updated and low when CHB data is updated.
Input Track-and-Hold (T/H) Circuits
Figure 2 displays a simplified functional diagram of the
input track-and-hold (T/H) circuits in both track and hold
mode. In track mode, switches S1, S2a, S2b, S4a, S4b,
S5a, and S5b are closed. The fully differential circuits
sample the input signals onto the two capacitors (C2a
and C2b) through switches S4a and S4b. S2a and S2b
set the common mode for the amplifier input, and open
simultaneously with S1, sampling the input waveform.
Switches S4a and S4b are then opened before switches
S3a and S3b connect capacitors C1a and C1b to the out-
put of the amplifier and switch S4c is closed. The result-
ing differential voltages are held on capacitors C2a and
C2b. The amplifiers are used to charge capacitors C1a
and C1b to the same values originally held on C2a and
C2b. These values are then presented to the first stage
quantizers and isolate the pipelines from the fast-chang-
ing inputs. The wide input bandwidth T/H amplifiers allow
the MAX1185 to track and sample/hold analog inputs of
high frequencies (> Nyquist). Both ADC inputs (INA+,
INB+, INA-, and INB-) can be driven either differentially or
single-ended. Match the impedance of INA+ and INA- as
well as INB+ and INB- and set the common-mode volt-
age to midsupply (V
DD
/2) for optimum performance.
MAX1185
Dual 10-Bit, 20Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
10 ______________________________________________________________________________________
Pin Description (continued)
PIN NAME FUNCTION
41 D6A/B
Three-State Digital Output, Bit 6. Depending on status of A/B, output data reflects channel A
or channel B data.
42 D7A/B
Three-State Digital Output, Bit 7. Depending on status of A/B, output data reflects channel A
or channel B data.
43 D8A/B
Three-State Digital Output, Bit 8. Depending on status of A/B, output data reflects channel A
or channel B data.
44 D9A/B
Three-State Digital Output, Bit 9 (MSB). Depending on status of A/B, output data reflects
channel A or channel B data.
45 REFOUT
Internal Reference Voltage Output. May be connected to REFIN through a resistor or a
resistor-divider.
46 REFIN Reference Input. V
REFIN
= 2 x (V
REFP
- V
REFN
). Bypass to GND with a > 1nF capacitor.
47 REFP
Positive Reference Input/Output. Conversion range is ± (V
REFP
- V
REFN
). Bypass to GND with
a > 0.1µF capacitor.
48 REFN
Negative Reference Input/Output. Conversion range is ± (V
REFP
- V
REFN
). Bypass to GND with
a > 0.1µF capacitor.
EP Exposed Pad. Connect to analog ground.
MAX1185
Dual 10-Bit, 20Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
______________________________________________________________________________________ 11
T/H
V
OUT
x2
Σ
FLASH
ADC
DAC
1.5 BITS
10
V
INA
V
IN
STAGE 1 STAGE 2
DIGITAL CORRECTION LOGIC
STAGE 8 STAGE 9
2-BIT FLASH
ADC
T/H
T/H
V
OUT
x2
Σ
FLASH
ADC
DAC
1.5 BITS
10
V
INB
V
IN
STAGE 1 STAGE 2
DIGITAL CORRECTION LOGIC
STAGE 8 STAGE 9
2-BIT FLASH
ADC
T/H
OUTPUT
MULTIPLEXER
10
D0A/B–D9A/B
Figure 1. Pipelined Architecture—Stage Blocks
S3b
S3a
COM
S5b
S5a
INB+
INB-
S1
OUT
OUT
C2a
C2b
S4c
S4a
S4b
C1b
C1a
INTERNAL BIAS
INTERNAL BIAS
COM
HOLD
HOLD
CLK
INTERNAL
NONOVERLAPPING
CLOCK SIGNALS
TRACK
TRACK
S2a
S2b
S3b
S3a
COM
S5b
S5a
INA+
INA-
S1
OUT
OUT
C2a
C2b
S4c
S4a
S4b
C1b
C1a
INTERNAL BIAS
INTERNAL BIAS
COM
S2a
S2b
MAX1185
Figure 2. MAX1185 T/H Amplifiers
MAX1185
Dual 10-Bit, 20Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
12 ______________________________________________________________________________________
Analog Inputs and Reference
Configurations
The full-scale range of the MAX1185 is determined by the
internally generated voltage difference between REFP
(V
DD
/2 + V
REFIN
/4) and REFN (V
DD
/2 - V
REFIN
/4). The
full-scale range for both on-chip ADCs is adjustable
through the REFIN pin, which is provided for this purpose.
REFOUT, REFP, COM (V
DD
/2), and REFN are internally
buffered low-impedance outputs.
The MAX1185 provides three modes of reference operation:
• Internal reference mode
• Buffered external reference mode
• Unbuffered external reference mode
In internal reference mode, connect the internal refer-
ence output REFOUT to REFIN through a resistor (e.g.,
10kΩ) or resistor-divider, if an application requires a
reduced full-scale range. For stability and noise filtering
purposes, bypass REFIN with a > 10nF capacitor to
GND. In internal reference mode, REFOUT, COM, REFP,
and REFN become low-impedance outputs.
In buffered external reference mode, adjust the reference
voltage levels externally by applying a stable and accu-
rate voltage at REFIN. In this mode, COM, REFP, and
REFN become outputs. REFOUT may be left open or con-
nected to REFIN through a > 10kΩ resistor.
In unbuffered external reference mode, connect REFIN to
GND. This deactivates the on-chip reference buffers for
REFP, COM, and REFN. With their buffers shut down,
these nodes become high impedance and may be driven
through separate, external reference sources.
Clock Input (CLK)
The MAX1185’s CLK input accepts CMOS-compatible
clock signals. Since the interstage conversion of the
device depends on the repeatability of the rising and
falling edges of the external clock, use a clock with low jit-
ter and fast rise and fall times (< 2ns). In particular, sam-
pling occurs on the rising edge of the clock signal,
requiring this edge to provide lowest possible jitter. Any
significant aperture jitter would limit the SNR performance
of the on-chip ADCs as follows:
SNR
dB
= 20 x log
10
(1/[2π x f
IN
x t
AJ
])
where f
IN
represents the analog input frequency and t
AJ
is the time of the aperture jitter.
Clock jitter is especially critical for undersampling appli-
cations. The clock input should always be considered as
an analog input and routed away from any analog input
or other digital signal lines.
The MAX1185 clock input operates with a voltage thresh-
old set to V
DD
/2. Clock inputs with a duty cycle other
than 50%, must meet the specifications for high and low
periods as stated in the
Electrical Characteristics
.
System Timing Requirements
Figure 3 shows the relationship between clock and
analog input, A/B indicator, and the resulting CHA/CHB
data output. CHA and CHB data are sampled on the
rising edge of the clock signal. Following the rising
edge of the 5th clock cycles, the digitized value of the
original CHA sample is presented at the output, fol-
lowed one half-clock cycle later by the digitized value
of the original CHB sample.
A channel selection signal (A/B indicator) allows the user
to determine which output data represents which input
channel. With A/B = 1, digitized data from CHA is present
at the output and with A/B = 0 digitized data from CHB is
present.
Digital Output Data, Output Data Format
Selection (T/B), Output Enable (
OE
), Channel
Selection (A/B)
All digital outputs, D0A/B–D9A/B (CHA or CHB data) and
A/B are TTL/CMOS logic-compatible. The output coding
can be chosen to be either offset binary or two’s comple-
ment (Table 1) controlled by a single pin (T/B). Pull T/B
low to select offset binary and high to activate two’s com-
plement output coding. The capacitive load on the digital
outputs D0A/B–D9A/B should be kept as low as possible
(< 15pF), to avoid large digital currents that could feed
back into the analog portion of the MAX1185, thereby
degrading its dynamic performance. Using buffers on
the digital outputs of the ADCs can further isolate the
digital outputs from heavy capacitive loads. To further
improve the dynamic performance of the MAX1185,
small-series resistors (e.g., 100Ω) may be added to the
digital output paths close to the MAX1185.
Figure 4 displays the timing relationship between output
enable and data output valid as well as power-
down/wake-up and data output valid.
Power-Down (PD) and Sleep
(SLEEP) Modes
The MAX1185 offers two power-save modes—sleep
and full power-down mode. In sleep mode (SLEEP = 1),
only the reference bias circuit is active (both ADCs are
disabled), and current consumption is reduced to
2.8mA.
To enter full power-down mode, pull PD high. With OE
simultaneously low, all outputs are latched at the last
value prior to the power-down. Pulling OE high forces
the digital outputs into a high-impedance state.

MAX1185ECM+TD

Mfr. #:
Manufacturer:
Maxim Integrated
Description:
Analog to Digital Converters - ADC 10-Bit 2Ch 20Msps High Speed ADC
Lifecycle:
New from this manufacturer.
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