NX3P2902B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2018. All rights reserved.
Product data sheet Rev. 2 — 22 February 2018 9 of 15
NXP Semiconductors
NX3P2902B
Logic controlled high-side power switch
12.1 Waveforms and test circuits
Measurement points are given in Table 11.
Logic level: V
OH
is the typical output voltage that occurs with the output load.
Fig 12. Switching times
DDD
(1LQSXW
9287RXWSXW
W
RII
*1'
9
0
9
;
9
<
9
2+
*1'
W
RQ
W
7/+
W
7+/
W
HQ
W
GLV
,
Table 11. Measurement points
Supply voltage EN Input Output
V
I(VIN)
V
M
t
r
, t
f
V
M
V
X
V
Y
1.1 V to 3.6 V 0.5 V
I(EN)
100 ns 0.5 V
OH
0.9 V
OH
0.1 V
OH
Test data is given in Table 12.
Definitions test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
V
EXT
= External voltage for measuring switching times.
Fig 13. Test circuit for measuring switching times
DDD
(1
9287 9,1
9
(;7
*
&
/
5
/
9
,
Table 12. Test data
Supply voltage EN Input Load
V
EXT
V
I(EN)
C
L
R
L
1.1 V to 3.6 V 1.8 V 1 F 500