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5962-8958101PA

P1-P3P4-P6P7-P9P10-P12P13-P13
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-89581
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
G
SHEET
4
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at http://quicksearch.dla.mil
or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
case operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-89581
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
G
SHEET
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/ 2/ 3/
-55°C ≤ T
A
≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Unit
Min
Max
Quiescent supply current
I
SY
No load
1
All
1.4
mA
2,3
2.0
M,D,P,L,R
1
01
1.4
M,D,P,L
1
05
1.4
Output adjustment range
∆V
TRIM
R
P
= 10 kΩ, 4/
T
A
= +25°C
1
All
±3.0
%
Output voltage
V
OUT
I
L
= 0 mA
1
01,03,
05
9.97
10.03
V
02,04
9.95
10.05
2,3
01,03,
05
9.955
10.045
02,04
9.905
10.095
M,D,P,L,R
1
01
9.94
10.06
M,D,P,L
1
05
9.94
10.06
Short circuit current
I
OS
V
O
= 0 V, T
A
= +25°C 4/
1
01,03,
05
+15
+60
mA
Sink current
I
S
T
A
= +25°C 4/
1
All
-0.3
mA
Load regulation
LD reg
I
L
= 0 mA to 10 mA 5/ 6/
1
01,03,
05
0.008
%/mA
02,04
0.010
M,D,P,L,R
1
01
0.015
M,D,P,L
1
05
0.015
I
L
= 0 mA to 8 mA 5/ 6/
2,3
01,03,
05
0.012
02,04
0.015
Line regulation
LN reg
V
IN
= 13 V to 33 V 5/
1
All
0.01
%/V
2,3
0.015
M,D,P,L,R
1
01
0.03
M,D,P,L
1
05
0.03
Load current
I
L
T
A
= +25°C 4/ 7/
1
All
10
mA
2,3
8
Output voltage noise
e
np-p
0.1 Hz to 10 Hz 4/
4
01,02,
05
30
µVp-p
03,04
150
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-89581
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
G
SHEET
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions 1/ 2/ 3/
-55°C ≤ T
A
≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Unit
Min
Max
Output voltage
temperature coefficient
T
CVO
-55°C ≤ T
A
≤ +125°C 4/ 8/
5,6
01,03,
05
±8.5
ppm/°C
02,04
±25
1/ V
IN
= 15 V, unless otherwise specified. No external components required.
2/ Device type 01 supplied to this drawing meets all levels M, D, P, L, and R of irradiation however this device is only tested at
the R level. Device type 05 supplied to this drawing meets all all levels P and L of irradiation however this device is only
tested at the L level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing
post irradiation electrical measurements for any RHA level, T
A
= +25°C.
3/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,
method 1019, condition A for device type 01. Device type 05 has been tested at the low dose rate.
4/ Not tested post irradiation. Refer to section 6.7 Application notes for more external trim details.
5/ Line and load regulation specifications include the effect of self-heating.
6/ LD
reg
= (∆V
OUT
/ ∆I
OUT
) / V
OUT
x 100 = % / mA.
7/ Minimum load current guaranteed by load regulation test.
8/ TCV
O
= ABS (( V
MAX
– V
MIN
) / 10 V) x (1/180°C) x (10
6
) where –55°C ≤ T
A
≤ +125°C.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of
MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 59 (see MIL-PRF-38535, appendix A).
P1-P3P4-P6P7-P9P10-P12P13-P13

5962-8958101PA

Mfr. #:
Buy 5962-8958101PA
Manufacturer:
Analog Devices Inc.
Description:
Voltage References 10V PREC VOLT REFERENCE IC
Lifecycle:
New from this manufacturer.
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