STY60NM60

1/8July 2003
STY60NM60
N-CHANNEL 600V - 0.050- 60A Max247
Zener-Protected MDmesh™Power MOSFET
TYPICAL R
DS
(on) = 0.050
HIGH dv/dt AND AVALANCHE CAPABILITIES
IMPROVED ESD CAPABILITY
LOW INPUT CAPACITANCE AND GATE
CHARGE
LOW GATE INPUT RESISTANCE
TIGHT PROCESS CONTROL
INDUSTRY’S LOWEST ON-RESISTANCE
DESCRIPTION
The MDmesh™ is a new revolutionary MOSFET
technology that associates the Multiple Drain pro-
cess with the Company’s PowerMESH™ horizontal
layout. The resulting product has an outstanding low
on-resistance, impressively high dv/dt and excellent
avalanche characteristics. The adoption of the
Company’s proprietary strip technique yields overall
dynamic performance that is significantly better than
that of similar competition’s products.
APPLICATIONS
The MDmesh™ family is very suitable for increasing
power density of high voltage converters allowing
system miniaturization and higher efficiencies.
ORDERING INFORMATION
TYPE V
DSS
R
DS(on)
I
D
STY60NM60 600V < 0.055 60 A
SALES TYPE MARKING PACKAGE PACKAGING
STY60NM60 Y60NM60 Max247 TUBE
Max247
1
2
3
INTERNAL SCHEMATIC DIAGRAM
STY60NM60
2/8
ABSOLUTE MAXIMUM RATINGS
(•)Pulse width limited by safe operating area
(1) I
SD
60A, di/dt 400 A/µs, V
DD
V
(BR)DSS
,T
j
T
JMAX.
THERMAL DATA
AVALANCHE CHARACTERISTICS
GATE-SOURCE ZENER DIODE
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
Symbol Parameter Value Unit
V
DS
Drain-source Voltage (V
GS
=0)
600 V
V
DGR
Drain-gate Voltage (R
GS
=20k)
600 V
V
GS
Gate- source Voltage ±30 V
I
D
Drain Current (continuous) at T
C
= 25°C
60 A
I
D
Drain Current (continuous) at T
C
= 100°C
37.8 A
I
DM
( )
Drain Current (pulsed) 240 A
P
TOT
Total Dissipation at T
C
= 25°C
560 W
V
ESD(G-S)
Gate source ESD(HBM-C=100pF, R=15KΩ) 6KV
Derating Factor 4.5 W/°C
dv/dt (1) Peak Diode Recovery voltage slope 15 V/ns
T
stg
Storage Temperature –65 to 150 °C
T
j
Max. Operating Junction Temperature 150 °C
Rthj-case Thermal Resistance Junction-case Max 0.22 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 30 °C/W
T
l
Maximum Lead Temperature For Soldering Purpose 300 °C
Symbol Parameter Max Value Unit
I
AR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by T
j
max)
30 A
E
AS
Single Pulse Avalanche Energy
(starting T
j
= 25 °C, I
D
=I
AR
,V
DD
=35V)
1.4 J
Symbol Parameter Test Conditions Min. Typ. Max. Unit
BV
GSO
Gate-Source Breakdown
Voltage
Igs=± 1mA (Open Drain) 30 V
3/8
STY60NM60
ELECTRICAL CHARACTERISTICS (T
CASE
= 25 °C UNLESS OTHERWISE SPECIFIED)
ON/OFF
DYNAMIC
SWITCHING ON
SWITCHING OFF
SOURCE DRAIN DIODE
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source
Breakdown Voltage
I
D
= 250 µA, V
GS
= 0 600 V
I
DSS
Zero Gate Voltage
Drain Current (V
GS
=0)
V
DS
= Max Rating
10 µA
V
DS
= Max Rating, T
C
= 125°C
100 µA
I
GSS
Gate-body Leakage
Current (V
DS
=0)
V
GS
= ± 20V ±10 µA
V
GS(th)
Gate Threshold Voltage
V
DS
=V
GS
,I
D
= 250 µA
34
5V
R
DS(on)
Static Drain-source On
Resistance
V
GS
=10V,I
D
= 30 A 0.050 0.055
Symbol Parameter Test Conditions Min. Typ. Max. Unit
g
fs
(1) Forward Transconductance V
DS
=I
D(on)
xR
DS(on)max,
I
D
=30A
35 S
C
iss
C
oss
C
rss
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V
DS
=25V,f=1MHz,V
GS
= 0 7300
2000
40
pF
pF
pF
R
G
Gate Input Resistance f=1 MHz Gate DC Bias = 0
Test Signal Level = 20mV
Open Drain
1.8
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(on)
t
r
Turn-on Delay Time
Rise Time
V
DD
=300V,I
D
=30A
R
G
= 4.7 V
GS
=10V
(see test circuit, Figure 3)
55
95
ns
ns
Q
g
Q
gs
Q
gd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V
DD
=470V,I
D
=60A,
V
GS
=10V
178
44.5
95
266 nC
nC
nC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
r(Voff)
t
f
t
c
Off-voltage Rise Time
Fall Time
Cross-over Time
V
DD
= 400 V, I
D
=60A,
R
G
=4.7Ω, V
GS
=10V
(see test circuit, Figure 5)
130
76
105
ns
ns
ns
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
(2)
Source-drain Current
Source-drain Current (pulsed)
60
240
A
A
V
SD
(1)
Forward On Voltage
I
SD
=60A,V
GS
=0
1.5 V
t
rr
Q
rr
I
RRM
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
I
SD
= 60 A, di/dt = 100 A/µs,
V
DD
=30V,T
j
= 150°C
(see test circuit, Figure 5)
600
14
48
ns
µC
A

STY60NM60

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
MOSFET N-Ch 600 Volt 60 Amp
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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