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M74HCT373TTR

P1-P3P4-P6P7-P9P10-P11
M74HCT373
4/11
DC SPECIFICATIONS
Symbol Parameter
Test Condition Value
Unit
V
CC
(V)
T
A
= 25°C
-40 to 85°C -55 to 125°C
Min. Typ. Max. Min. Max. Min. Max.
V
IH
High Level Input
Voltage
4.5
to
5.5
2.0 2.0 2.0 V
V
IL
Low Level Input
Voltage
4.5
to
5.5
0.8 0.8 0.8 V
V
OH
High Level Output
Voltage
4.5
I
O
=-20 µA
4.4 4.5 4.4 4.4
V
I
O
=-6.0 mA
4.18 4.31 4.13 4.10
V
OL
Low Level Output
Voltage
4.5
I
O
=20 µA
0.0 0.1 0.1 0.1
V
I
O
=6.0 mA
0.17 0.26 0.33 0.40
I
I
Input Leakage
Current
5.5
V
I
= V
CC
or GND
± 0.1 ± 1 ± 1 µA
I
OZ
High Impedance
Output Leakage
Current
5.5
V
I
= V
IH
or V
IL
V
O
= V
CC
or GND
± 0.5 ± 5 ± 10 µA
I
CC
Quiescent Supply
Current
5.5
V
I
= V
CC
or GND
44080µA
∆ I
CC
Additional Worst
Case Supply
Current
5.5 Per Input pin
V
I
= 0.5V or
V
I
= 2.4V
Other Inputs at
V
CC
or GND
I
O
= 0
2.0 2.9 3.0 mA
Obsolete Product(s) - Obsolete Product(s)
M74HCT373
5/11
AC ELECTRICAL CHARACTERISTICS (C
L
= 50 pF, Input t
r
= t
f
= 6ns)
CAPACITIVE CHARACTERISTICS
1) C
PD
is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I
CC(opr)
= C
PD
x V
CC
x f
IN
+ I
CC
/8 (per Flip
Flop) and the C
PD
when n pcs of Flip Flop operate, can be gained by the following equation: C
PD(TOTAL)
= 32 + 34 x n (pF)
Symbol Parameter
Test Condition Value
Unit
V
CC
(V)
C
L
(pF)
T
A
= 25°C
-40 to 85°C -55 to 125°C
Min. Typ. Max. Min. Max. Min. Max.
t
TLH
t
THL
Output Transition
Time
4.5 50 7 12 15 18 ns
t
PLH
t
PHL
Propagation Delay
Time
(LE - Q)
4.5
50 20 30 38 45
ns
150 24 37 46 56
t
PLH
t
PHL
Propagation Delay
Time
(D - Q)
4.5
50 19 30 38 45
ns
150 23 36 45 54
t
PZL
t
PZH
High Impedance
Output Enable
Time
4.5
50
R
L
= 1 KΩ
20 30 38 45 ns
150 24 37 46 56
t
PLZ
t
PHZ
High Impedance
Output Disable
Time
4.5 50
R
L
= 1 KΩ
20 30 38 45 ns
t
W(H)
Minimum Pulse
Width (LE)
4.5 50 8 15 19 22 ns
t
s
Minimum Set-up
Time
4.5 50 4 10 13 15 ns
t
h
Minimum Hold
Time
4.5 50 5 5 8 ns
Symbol Parameter
Test Condition Value
Unit
V
CC
(V)
T
A
= 25°C
-40 to 85°C -55 to 125°C
Min. Typ. Max. Min. Max. Min. Max.
C
IN
Input Capacitance
5101010pF
C
PD
Power Dissipation
Capacitance (note
1)
66 pF
Obsolete Product(s) - Obsolete Product(s)
M74HCT373
6/11
TEST CIRCUIT
C
L
= 50pF/150pF or equivalent (includes jig and probe capacitance)
R
1
= 1KΩ or equivalent
R
T
= Z
OUT
of pulse generator (typically 50Ω)
WAVEFORM 1: LE TO Qn PROPAGATION DELAYS, LE MINIMUM PULSE WIDTH, Dn TO LE SETUP
AND HOLD TIMES (f=1MHz; 50% duty cycle)
TEST SWITCH
t
PLH
, t
PHL
Open
t
PZL
, t
PLZ
V
CC
t
PZH
, t
PHZ
GND
Obsolete Product(s) - Obsolete Product(s)
P1-P3P4-P6P7-P9P10-P11

M74HCT373TTR

Mfr. #:
Buy M74HCT373TTR
Manufacturer:
STMicroelectronics
Description:
IC LATCH OCT D TYPE 3ST 20TSSOP
Lifecycle:
New from this manufacturer.
Delivery:
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