830584AGILFT

830584I Datasheet
©2015 Integrated Device Technology, Inc December 16, 20154
Symbol Parameter Test Conditions Minimum Typical
Maximum Units
f
clk
Clock Frequency; NOTE 1 0 140 MHz
tp
LH
Propagation Delay, Low to High;
NOTE 2
1.8 2.5 3 ns
tp
HL
Propagation Delay, High to Low;
NOTE 2
1.8 2.4 3 ns
tsk(o) Output Skew; NOTE 3, 4 50 100 ps
tsk(p) Pulse Skew 140MHz 170 ps
tsk(pr) Process Skew 200 300 ps
tsk(pp) Part-to-Part Skew; NOTE 4, 5 250 400 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter section
140MHz, Integration Range:
10kHz – 20MHz
0.15 ps
T
high
CLK High Time
66MHz 6 ns
140MHz 3 ns
T
low
CLK Low Time
66MHz 6 ns
140MHz 3 ns
t
R
Output Rise Slew Rate
0.2V
DD
to 0.6V
DD
1.5 2.7 4 V/ns
t
F
Output Fall Slew Rate
0.6V
DD
to 0.2V
DD
1.5 2.7 4 V/ns
All typical values are at respective nominal V
DD
.
This symbol is according to PCI-X terminology.
NOTE 1: Switching characteristics over recommended ranges of supply voltages and operating free-air temperature,
C
L
= 10pF, V
DD
= 3.3V ± 0.3V.
NOTE 2: Measured from V
DD
/2 of the input to V
DD
/2 of the output.
NOTE 3: Defi ned as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DD
/2.
NOTE 4: This parameter is defi ned in accordance with JEDEC Standard 65.
NOTE 5: Defi ned as skew between outputs on different devices operating a the same supply voltages and
with equal load conditions. Using the same type of input on each device, the output is measured at V
DD
/2.
TABLE 5. AC CHARACTERISTICS, V
DD
= 3.3V ± 0.3V, TA = -40°C TO 85°C
830584I Datasheet
©2015 Integrated Device Technology, Inc December 16, 20155
ADDITIVE PHASE JITTER
The spectral purity in a band at a specifi c offset from the fundamental
compared to the power of the fundamental is called the dBc Phase
Noise. This value is normally expressed using a Phase noise plot
and is most often the specifi ed plot in many applications. Phase
noise is defi ned as the ratio of the noise power present in a 1Hz
band at a specifi ed offset from the fundamental frequency to the
power value of the fundamental. This ratio is expressed in decibels
As with most timing specifi cations, phase noise measurements has
issues relating to the limitations of the equipment. Often the noise
oor of the equipment is higher than the noise fl oor of the device.
(dBm) or a ratio of the power in the 1Hz band to the power in the
fundamental. When the required offset is specifi ed, the phase noise
is called a dBc value, which simply means dBm at a specifi ed offset
from the fundamental. By investigating jitter in the frequency domain,
we get a better understanding of its effects on the desired application
over the entire time record of the signal. It is mathematically possible
to calculate an expected bit error rate given a phase noise plot.
This is illustrated above. The device meets the noise fl oor of what
is shown, but can actually be lower. The phase noise is dependent
on the input source and measurement equipment.
OFFSET FROM CARRIER FREQUENCY (HZ)
SSB PHASE NOISE dBc/HZ
Input/Output Additive Phase Jitter at
140MHz (12kHz – 20MHz) = 0.15ps typical
830584I Datasheet
©2015 Integrated Device Technology, Inc December 16, 20156
PARAMETER MEASUREMENT INFORMATION
PART-TO-PART SKEW
OUTPUT SKEW3.3V CORE/3.3V OUTPUT LOAD AC TEST CIRCUIT
PROPAGATION DELAY
OUTPUT RISE/FALL SLEW RATES CLOCK WAVEFORM
OUTPUT DUTY CYCLE/PULSE WIDTH/PERIOD

830584AGILFT

Mfr. #:
Manufacturer:
IDT
Description:
Clock Buffer LVCMOS 4 OUT FANOUT
Lifecycle:
New from this manufacturer.
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