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MTCST-YH1-P03

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P30P31-P33P34-P35
Tyco Electronics Corporation
300 Constitutional Drive
Menlo Park, CA 94025 USA
No: C-6111
Rev: G
Date: November 5, 1993
Page: 25 of 35
If this document is printed it becomes uncontrolled. Check for the latest revision.
4.5 Test Procedures.
4.5.1 Test Conditions. Unless otherwise specified, all tests shall be performed at ambient
pressure, and relative humidity as specified in the general requirements of MIL-STD-
1344 with an ambient temperature of 25 ± 5°C. Where conditioning at the maximum
rated temperature is specified, the temperature tolerances shall be minus 0°C and plus
5°C.
4.5.1.1 Connector Assembly Preparation. When terminated connectors are specified for
testing, the contacts shall be terminated in accordance with the applicable specification
control drawing. Wire or cable lengths shall be approximately 3 feet (1 meter).
Connectors shall be assembled in accordance with the applicable Raychem engineering
standard (ES). Cable clamps shall be installed, if provided for.
4.5.2 Visual Examination (see 3.1, 3.4, 3.5, 3.7.3.8). Connector components and assemblies
shall be visually examined at 4X magnification.
4.5.3 Insulation Resistance (see 3.6.1). Connector assemblies shall be tested in accordance
with MIL-STD-1344, Method 3003. All contacts shall be tested. Insulation resistance
shall be measured a) between adjacent contacts in the insert and b) between contacts
and the shell (ground). Alternate contacts may be bussed together to facilitate testing,
and passing values obtained in this manner may be used to indicate compliance on a
pin-to-pin basis. When insulation resistance at maximum rated temperature is specified,
the connector assemblies shall be conditioned in an oven at the maximum rated
temperature for 30 minutes, and the measurements shall be made while the connector
assemblies are at the maximum rated temperature.
4.5.4 Dielectric Withstanding Voltage.
4.5.4.1 Dielectric Withstanding Voltage at Sea Level (see 3.6.2).
Connector assemblies shall
be tested in accordance with MIL-STD-1344, Method 3001. All contacts shall be
tested. Test voltage shall be 60 Hz ac applied a) between adjacent contacts in the same
insert and b) between contacts and the shell (ground). Alternate contacts may be bussed
together to facilitate testing, and passing values obtained in this manner may be used to
indicate compliance on a pin-to-pin basis. The shell and all contacts not connected to
the test voltage shall be grounded. The magnitude of the test voltage shall be as
specified in Table XIII.
Table XIII. Test Voltages
Connector Series Terminated Wire Type Test Voltage
V rms
MTC50 All types 750
MTC100 Round wires 1500
Flat conductor cable 1000
Tyco Electronics Corporation
300 Constitutional Drive
Menlo Park, CA 94025 USA
No: C-6111
Rev: G
Date: November 5, 1993
Page: 26 of 35
If this document is printed it becomes uncontrolled. Check for the latest revision.
4.5.4.2 Dielectric Withstanding Voltage at Altitude (see 3.6.2). Mated and unmated connector
assemblies shall be tested as specified in 4.5.4.1, except that the test voltages and
altitude pressure equivalents shall be as specified in Table XIV.
Table XIV. Test Voltages And Altitudes
Altitude Pressure Test Voltage V ms
Equivalent MTC100 Series MTC50 Series
Unmated Mated Unmated Mated
50,000 ft – 87.5 torr
(15.2 km – 11.7 kPA)
550
1000
350
700
70,000 ft – 33.5 torr
(21.3 km – 4.47 kPa)
375
700
250
500
110,000 ft – 5.74 torr
(33.5 km – 0.765 kPa)
200
400
200
400
4.5.5 Contact Resistance (see 3.6.3).
4.5.5.1 Contact Resistance at Specified Current (Room Temperature). Mated connector
assemblies shall be tested in accordance with MIL-STD-1344, Method 3004. At least
20 percent of the contacts in each connector assembly shall be tested.
4.5.5.2 Contact Resistance at Specified Current (Maxamum Rated Temperature). Mated
connector assemblies shall be conditioned in an oven at the maximum rated
temperature for 30 minutes. Measurements shall be made as detailed in 4.5.5.1, while
the connector assemblies are at the maximum rated temperature.
4.5.5.3 Low Signal Level Contact Resistance.
Mated connector assemblies shall be tested in
accordance with MIL-STD-1344, Method 3002. At least 20 percent of the contacts in
each connector assembly shall be tested.
4.5.6 Shell to Shell Conductivity (see 3.6.4).
Mated connector assemblies with conductive
shell finish shall be tested by applying a direct current of 1 ± 0.1 ampere from the rear
corner of one shell to the opposite rear corner of the other shell. Measure the voltage
drop between the mated surfaces of the shells by applying the voltmeter probes on the
flat surfaces at the middle of the rear edge of the shells. Probes used to make voltage
measurements shall have spherical ends with 0.050 inch (1.3 mm) minimum radius and
shall not puncture or damage the shell finish.
Tyco Electronics Corporation
300 Constitutional Drive
Menlo Park, CA 94025 USA
No: C-6111
Rev: G
Date: November 5, 1993
Page: 27 of 35
If this document is printed it becomes uncontrolled. Check for the latest revision.
4.5.7 Electrical Engagement (see 3.6.5). Mated connector assemblies shall be wired to
provide a series circuit through all contacts of the mated connector. A suitable power
source and indicator shall be provided such that the point at which the series circuit is
completed, during normal connector mating, can be established. Connector halves shall
be held flat against a smooth, flat surface and mated by alternately turning each
jackscrew one half turn. The mating operation shall be stopped at the first indication of
a completed circuit, and the plug-to-receptacle shell spacing shall be measured along
the centerline of the connectors. The mating operation shall then be continued until the
connector halves are completely mated at a jackscrew torque of 9 lbf-inch (1.0 N-m),
and the shell spacing shall again be measured. Electrical engagement shall be the
difference between the two measurements.
4.5.8 Contact Engagement and Separation Forces (see 3.6.6). Contacts shall be tested in
accordance with MIL-STD-1344, Method 2014, Procedure 1. Test blades shall be as
shown in Figure 2. Contacts shall be conditioned by inserting and withdrawing the
maximum-thickness test blade. For qualification inspection, at least 20 percent of the
contacts in each connector assembly shall be tested.
4.5.9 Durability (see 3.6.7). Terminated connector assemblies shall be mated and unmated
500 times at a rate not to exceed 300 cycles per hour and in a manner simulating actual
service. The test may be performed by hand or by mechanical means. For the MTC50
series it is permissable to shake or blow particulate debris from the threads or interface
surfaces at intervals of not less than 50 cycles. If necessary, a soft bristle brush
moistened with isopropyl alcohol may likewise be used at similar intervals.
4.5.10 Solder Termination Tensile Strength (see 3.6.8). Tensile strength testing shall be
performed at room temperature and at the maximum rated temperature.
4.5.10.1 Round Wire Termination Tensile Strength (see 3.6.8.1).
Terminated inserts shall be
placed in a tensile testing device and sufficient force applied to individual wires to
separate the wires from the terminals or break the wires. Wires shall be gripped 3.0 ±
0.5 inches (76 ± 13 mm) from the termination area. The speed of head travel of the
tensile tester shall be 1.0 ± 0.25 inch (25 ± 6 mm) per minute. Conductor breakage
outside the soldered termination at less than the tensile loads shown in Table VIII shall
not constitute failure. At least 20 percent of the wire terminations of each insert shall be
tested.
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P30P31-P33P34-P35

MTCST-YH1-P03

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TE Connectivity
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Rack & Panel Connectors MTCST-YH1-P03
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