N74F534D,623

Philips Semiconductors Product specification
74F534Octal D flip-flop, inverting (3-State)
2000 Aug 01
4
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL PARAMETER RATING UNIT
V
CC
Supply voltage –0.5 to +7.0 V
V
IN
Input voltage –0.5 to +7.0 V
I
IN
Input current –30 to +5.0 mA
V
OUT
Voltage applied to output in High output state –0.5 to +V
CC
V
I
OUT
Current applied to output in Low output state 48 mA
T
amb
Operating free-air temperature range 0 to +70 °C
T
stg
Storage temperature –65 to +125 °C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
SYMBOL
PARAMETER
MIN TYP MAX
UNIT
V
CC
Supply voltage 4.5 5.0 5.5 V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level input voltage 0.8 V
I
IK
Input clamp current –18 mA
I
OH
High-level output current –3 mA
I
OL
Low-level output current 24 mA
T
amb
Operating free-air temperature range 0 70 °C
Philips Semiconductors Product specification
74F534Octal D flip-flop, inverting (3-State)
2000 Aug 01
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST
CONDITIONS
1
MIN TYP
2
MAX
UNIT
V
O
High level out
p
ut voltage
V
CC
= MIN
,
V
IL
= MAX
,
±10%V
CC
2.4 V
V
OH
High
-
le
v
el
o
u
tp
u
t
v
oltage
V
CC
MIN,
V
IL
MAX,
V
IH
= MIN, I
OH
= MAX
±5%V
CC
2.7 3.3 V
V
O
Low level out
p
ut voltage
V
CC
= MIN
,
V
IL
= MAX
,
±10%V
CC
0.35 0.50 V
V
OL
Lo
w-
le
v
el
o
u
tp
u
t
v
oltage
V
CC
MIN,
V
IL
MAX,
V
IH
= MIN, I
OL
= MAX
±5%V
CC
0.35 0.50 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
–0.73 –1.2 V
I
I
Input current at
maximum input voltage
V
CC
= MAX, V
I
= 7.0V 100 µA
I
IH
High-level input current V
CC
= MAX, V
I
= 2.7V 20 µA
I
IL
Low-level input current V
CC
= MAX, V
I
= 0.5V –0.6 mA
I
OZH
Off-state output current,
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V 50 µA
I
OZL
Off-state output current,
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V –50 µA
I
OS
Short-circuit output current
3
V
CC
= MAX –60 –150 mA
I
CC
Supply current (total) V
CC
= MAX OE=4.5V, Dn=GND 51 86 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL PARAMETER
TEST
CONDITIONS
T
amb
= +25°C
V
CC
= +5V
C
L
= 50pF, R
L
= 500
T
amb
= 0°C to +70°C
V
CC
= +5V ± 10%
C
L
= 50pF, R
L
= 500
UNIT
MIN TYP MAX MIN MAX
f
MAX
Maximum Clock frequency Waveform 1 150 165 135 MHz
t
PLH
t
PHL
Propagation delay
CP to Qn
Waveform 1
3.0
3.0
4.5
4.5
7.0
7.0
2.5
2.5
7.5
7.5
ns
t
PZH
t
PZL
Output Enable time
to High or Low level
Waveform 3
Waveform 4
2.0
2.0
4.5
5.0
7.5
7.5
2.0
2.0
8.5
8.5
ns
t
PHZ
t
PLZ
Output Disable time
from High or Low level
Waveform 3
Waveform 4
2.0
2.0
3.5
3.5
6.5
5.5
2.0
2.0
7.5
6.5
ns
AC SETUP REQUIREMENTS
LIMITS
SYMBOL PARAMETER
TEST
CONDITIONS
T
amb
= +25°C
V
CC
= +5V
C
L
= 50pF, R
L
= 500
T
amb
= 0°C to +70°C
V
CC
= +5.0V ± 10%
C
L
= 50pF, R
L
= 500
UNIT
MIN TYP MAX MIN MAX
t
s
(H)
t
s
(L)
Setup time,
Dn to CP
Waveform 2
2.0
2.0
2.5
2.5
ns
t
h
(H)
t
h
(L)
Hold time,
Dn to CP
Waveform 2
0
0
0
0
ns
t
w
(H)
t
w
(L)
CP pulse width,
High or Low
Waveform 1
3.0
3.5
3.5
4.0
ns
Philips Semiconductors Product specification
74F534Octal D flip-flop, inverting (3-State)
2000 Aug 01
6
AC WAVEFORMS
For all waveforms, V
M
= 1.5V
The shaded areas indicate when the input is permitted to change for predictable output performance.
t
W
(H)
CP
Q
n
V
M
V
M
V
M
V
M
V
M
1/f
MAX
t
W
(L)
t
PLH
t
PHL
SF00989
Waveform 1. Propagation Delay, Clock and Enable Inputs
to Output, Enable, Clock Pulse Widths,
and Maximum Clock Frequency
t
h
(H)t
s
(H)
CP
SF00191
V
M
V
M
V
M
V
M
V
M
V
M
t
h
(L)t
s
(L)
Dn
Waveform 2. Data Setup and Hold Times
V
M
V
M
V
M
t
PHZ
t
PZH
OE
Qn
V
OH
-0.3V
0V
SF00994
Waveform 3. 3-State Output Enable Time to High Level
and Output Disable Time from High Level
V
M
V
M
V
M
t
PLZ
t
PZL
OE
Qn
V
OL
+0.3V
SF00995
Waveform 4. 3-State Output Enable Time to Low Level
and Output Disable Time from Low Level
TEST CIRCUIT AND WAVEFORM
t
w
90%
V
M
10%
90%
V
M
10%
90%
V
M
10%
90%
V
M
10%
NEGATIVE
PULSE
POSITIVE
PULSE
t
w
AMP (V)
0V
0V
t
THL
(
t
f
)
INPUT PULSE REQUIREMENTS
rep. rate
t
w
t
TLH
t
THL
1MHz 500ns
2.5ns 2.5ns
Input Pulse Definition
V
CC
family
74F
D.U.T.
PULSE
GENERATOR
R
L
C
L
R
T
V
IN
V
OUT
Test Circuit for 3-State Outputs
DEFINITIONS:
R
L
= Load resistor;
see AC electrical characteristics for value.
C
L
= Load capacitance includes jig and probe capacitance;
see AC electrical characteristics for value.
R
T
= Termination resistance should be equal to Z
OUT
of
pulse generators.
t
THL
(
t
f
)
t
TLH
(
t
r
)
t
TLH
(
t
r
)
AMP (V)
amplitude
3.0V
1.5V
V
M
R
L
7.0V
SF00777
TEST SWITCH
t
PLZ
closed
t
PZL
closed
All other open
SWITCH POSITION

N74F534D,623

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
IC FF D-TYPE SNGL 8BIT 20SO
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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