FM27C256V150

7
www.fairchildsemi.com
FM27C256 262,144-Bit (32K x 8) High Performance CMOS EPROM
www.fairchildsemi.com
FM27C256 Rev. A
Functional Description
DEVICE OPERATION
The six modes of operation of the EPROM are listed in Table 1. It
should be noted that all inputs for the six modes are at TTL levels.
The power supplies required are V
CC
and V
PP
. The V
PP
power
supply must be at 12.75V during the three programming modes,
and must be at 5V in the other three modes. The V
CC
power supply
must be at 6.5V during the three programming modes, and at 5V
in the other three modes.
Read Mode
The EPROM has two control functions, both of which must be
logically active in order to obtain data at the outputs. Chip Enable
(CE/PGM) is the power control and should be used for device
selection. Output Enable (OE) is the output control and should be
used to gate data to the output pins, independent of device
selection. Assuming that addresses are stable, address access
time (t
ACC
) is equal to the delay from CE to output (t
CE
). Data is
available at the outputs t
OE
after the falling edge of OE, assuming
that CE/PGM has been low and addresses have been stable for
at least t
ACC
t
OE
.
Standby Mode
The EPROM has a standby mode which reduces the active power
dissipation by over 99%, from 385 mW to 0.55 mW. The EPROM
is placed in the standby mode by applying a CMOS high signal to
the CE/PGM input. When in standby mode, the outputs are in a
high impedance state, independent of the OE input.
Output Disable
The EPROM is placed in output disable by applying a TTL high
signal to the OE input. When in output disable all circuitry is
enabled, except the outputs are in a high impedance state (TRI-
STATE).
Output OR-Typing
Because the EPROM is usually used in larger memory arrays,
Fairchild has provided a 2-line control function that accommo-
dates this use of multiple memory connections. The 2-line control
function allows for:
1. the lowest possible memory power dissipation, and
2. complete assurance that output bus contention will not
occur.
To most efficiently use these two control lines, it is recommended
that CE/PGM be decoded and used as the primary device select-
ing function, while OE be made a common connection to all
devices in the array and connected to the READ line from the
system control bus. This assures that all deselected memory
devices are in their low power standby modes and that the output
pins are active only when data is desired from a particular memory
device.
Programming
CAUTION: Exceeding 14V on pin 1 (V
PP
) will damage the EPROM.
Initially, and after each erasure, all bits of the EPROM are in the
1s state. Data is introduced by selectively programming 0s
into the desired bit locations. Although only 0s will be pro-
grammed, both 1s and 0s can be presented in the data word.
The only way to change a 0 to a 1 is by ultraviolet light erasure.
The EPROM is in the programming mode when the V
PP
power
supply is at 12.75V and OE is at V
IH
. It is required that at least a
0.1 µF capacitor be placed across V
PP
, V
CC
to ground to suppress
spurious voltage transients which may damage the device. The
data to be programmed is applied 8 bits in parallel to the data
output pins. The levels required for the address and data inputs
are TTL.
When the address and data are stable, an active low, TTL program
pulse is applied to the CE/PGM input. A program pulse must be
applied at each address location to be programmed. The EPROM
is programmed with the Turbo Programming Algorithm shown in
Figure 1. Each Address is programmed with a series of 50 µs
pulses until it verifies good, up to a maximum of 10 pulses. Most
memory cells will program with a single 50 µs pulse. (The standard
National Semiconductor Algorithm may also be used but it will
have longer programming time.)
The EPROM must not be programmed with a DC signal applied to
the CE/PGM input.
Programming multiple EPROM in parallel with the same data can
be easily accomplished due to the simplicity of the programming
requirments. Like inputs of the parallel EPROM may be connected
together when they are programmed with the same data. A low
level TTL pulse applied to the CE/PGM input programs the
paralleled EPROM.
Program Inhibit
Programming multiple EPROMs in parallel with different data is
also easily accomplished. Except for CE/PGM, all like inputs
(including OE) of the parallel EPROMs may be common. A TTL
low level program pulse applied to an EPROMs CE/PGM input
with V
PP
at 12.75V will program that EPROM. A TTL high level CE/
PGM input inhibits the other EPROMs from being programmed.
Program Verify
A verify should be performed on the programmed bits to determine
whether they were correctly programmed. The verify may be
performed with V
PP
at 12.75V. V
PP
must be at V
CC
, except during
programming and program verify.
AFTER PROGRAMMING
Opaque labels should be placed over the EPROM window to
prevent unintentional erasure. Covering the window will also
prevent temporary functional failure due to the generation of photo
currents.
MANUFACTURER’S IDENTIFICATION CODE
The EPROM has a manufacturers identification code to aid in
programming. When the device is inserted in an EPROM pro-
grammer socket, the programmer reads the code and then
automatically calls up the specific programming algorithm for the
part. This automatic programming control is only possible with
programmers which have the capability of reading the code.
The Manufacturers Identification code, shown in Table 2, specifi-
cally identifies the manufacturer and device type. The code for
FM27C256 is 8F04, where 8F designates that it is made by
Fairchild Semiconductor, and 04 designates a 256K part.
The code is accessed by applying 12V ±0.5V to address pin A9.
Addresses A1A8, A10A16, and all control pins are held at V
IL
.
Address pin A0 is held at V
IL
for the manufacturers code, and held
at V
IH
for the device code. The code is read on the eight data pins,
O0 O7. Proper code access is only guaranteed at 25°C to ±5°C.
8
www.fairchildsemi.com
FM27C256 262,144-Bit (32K x 8) High Performance CMOS EPROM
www.fairchildsemi.com
FM27C256 Rev. A
Functional Description (Continued)
ERASURE CHARACTERISTICS
The erasure characteristics of the device are such that erasure
begins to occur when exposed to light with wavelengths shorter
than approximately 4000 Angstroms (Å). It should be noted that
sunlight and certain types of fluorescent lamps have wavelengths
in the 3000Å–4000Å range.
The recommended erasure procedure for the EPROM is expo-
sure to short wave ultraviolet light which has a wavelength of
2537Å. The integrated dose (i.e., UV intensity x exposure time) for
erasure should be a minimum of 15W-sec/cm
2
.
The EPROM should be placed within 1 inch of the lamp tubes
during erasure. Some lamps have a filter on their tubes which
should be removed before erasure
An erasure system should be calibrated periodically. The distance
from lamp to device should be maintained at one inch. The erasure
time increases as the square of the distance from the lamp (if
distance is doubled the erasure time increases by factor of 4).
Lamps lose intensity as they age. When a lamp is changed, the
distance has changed, or the lamp has aged, the system should
be checked to make certain full erasure is occurring. Incomplete
erasure will cause symptoms that can be misleading. Program-
mers, components, and even system designs have been errone-
ously suspected when incomplete erasure was the problem.
SYSTEM CONSIDERATION
The power switching characteristics of EPROMs require careful
decoupling of the devices. The supply current, I
CC,
has three
segments that are of interest to the system designer: the standby
current level, the active current level, and the transient current
peaks that are produced by voltage transitions on input pins. The
magnitude of these transient current peaks is dependent of the
output capacitance loading of the device. The associated V
CC
transient voltage peaks can be suppressed by properly selected
decoupling capacitors. It is recommended that at least a 0.1 µF
ceramic capacitor be used on every device between V
CC
and
GND. This should be a high frequency capacitor of low inherent
inductance. In addition, at least a 4.7 µF bulk electrolytic capacitor
should be used between V
CC
and GND for each eight devices. The
bulk capacitor should be located near where the power supply is
connected to the array. The purpose of the bulk capacitor is to
overcome the voltage drop caused by the inductive effects of the
PC board traces.
Mode Selection
The modes of operation of FM27C256 listed in Table 1. A single 5V power supply is required in the read mode. All inputs are TTL levels
except for V
PP
and A9 for device signature.
TABLE 1. Modes Selection
Pins CE/PGM OE V
PP
V
CC
Outputs
Mode
Read V
IL
V
IL
V
CC
5.0V D
OUT
Output Disable X V
IH
V
CC
5.0V High-Z
(Note 16)
Standby V
IH
XV
CC
5.0V High-Z
Programming V
IL
VIH 12.75V 6.25V D
IN
Program Verify V
IH
V
IL
12.75V 6.25V D
OUT
Program Inhibit V
IH
V
IH
12.75V 6.25V High-Z
Note 16: X can be V
IL
or V
IH
.
TABLE 2. Manufacturer’s Identification Code
Pins A0A9O7O6O5O4O3O2O1O0Hex
(10) (24) (19) (18) (17) (16) (15) (13) (12) (11) Data
Manufacturer Code
V
IL
12V100011118F
Device Code V
IH
12V0000010004
9
www.fairchildsemi.com
FM27C256 262,144-Bit (32K x 8) High Performance CMOS EPROM
www.fairchildsemi.com
FM27C256 Rev. A
Physical Dimensions inches (millimeters) unless otherwise noted
1.450
[36.83]
MAX
28
1
15
14
R 0.025
[0.64]
R 0.030-0.055
[0.76 - 1.40]
TYP
0.280 ±0.010
[7.11 ±0.25]
UV WINDOW
0.600
[15.24]
MAX
Glass
0.520 ± 0.006
[13.21 ±0.15]
0.175
MAX
0.060-0.100
TYP
0.050-0.060
TYP
0.015-0.021
TYP
86°-94°
TYP
0.150 MIN
TYP
0.015 -0.060
TYP
0.090-0.110
TYP
0.005 MIN
TYP
0.225 MAX TYP
0.125 MIN
TYP
0.590-0.620
[14.99 - 15.75]
Glass
Sealant
95° ±5°
TYP
0.685
+0.025
-0.060
17.40
+0.64
-1.52
0.010 ±0.002
[0.25 ±0.05]
TYP
UV Window Cavity Dual-In-Line CerDIP Package (Q)
Order Number FM27C256QXXX
Package Number J28AQ

FM27C256V150

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
IC EPROM 256K PARALLEL 32PLCC
Lifecycle:
New from this manufacturer.
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