OP270 Data Sheet
Rev. F | Page 12 of 20
APPLICATIONS INFORMATION
VOLTAGE AND CURRENT NOISE
The OP270 is a very low noise dual op amp, exhibiting a typical
voltage noise density of only 3.2 nV/√Hz at 1 kHz. Because the
voltage noise is inversely proportional to the square root of the
collector current, the exceptionally low noise characteristic of
the OP270 is achieved in part by operating the input transistors
at high collector currents. Current noise, however, is directly
proportional to the square root of the collector current. As a
result, the outstanding voltage noise density performance of the
OP270 is gained at the expense of current noise performance,
which is normal for low noise amplifiers.
To obtain the best noise performance in a circuit, it is vital to
understand the relationships among voltage noise (e
n
), current
noise (i
n
), and resistor noise (e
t
).
TOTAL NOISE AND SOURCE RESISTANCE
The total noise of an op amp can be calculated by
222
)()()(
tsnnn
eRieE
where:
E
n
is the total input-referred noise.
e
n
is the op amp voltage noise.
i
n
is the op amp current noise.
e
t
is the source resistance thermal noise.
R
S
is the source resistance.
The total noise is referred to the input and at the output is
amplified by the circuit gain.
Figure 32 shows the relationship between total noise at 1 kHz
and source resistance. When R
S
is less than 1 kΩ, the total noise
is dominated by the voltage noise of the OP270. As R
S
rises
above 1 kΩ, total noise increases and is dominated by resistor
noise rather than by the voltage or current noise of the OP270.
When R
S
exceeds 20 kΩ, the current noise of the OP270
becomes the major contributor to total noise.
00352-033
100
10
1
100 1k 10k 100k
TOTAL NOISE (nV/
Hz)
SOURCE RESISTANCE ()
RESISTOR
NOISE ONLY
OP200
OP270
Figure 32. Total Noise vs. Source Resistance
(Including Resistor Noise) at 1 kHz
Figure 33 also shows the relationship between total noise and
source resistance, but at 10 Hz. Total noise increases more
quickly than shown in Figure 32 because current noise is
inversely proportional to the square root of frequency. In
Figure 33, the current noise of the OP270 dominates the total
noise when R
S
is greater than 5 kΩ.
Figure 32 and Figure 33 show that to reduce total noise, source
resistance must be kept to a minimum. In applications with a
high source resistance, the OP200, with lower current noise
than the OP270, can provide lower total noise.
00352-034
100
10
1
100 1k 10k 100k
TOTAL NOISE (nV/
Hz)
SOURCE RESISTANCE ()
RESISTOR
NOISE ONLY
OP200
OP270
Figure 33. Total Noise vs. Source Resistance
(Including Resistor Noise) at 10 Hz
Figure 34 shows peak-to-peak noise vs. source resistance over
the 0.1 Hz to 10 Hz range. At low values of R
S
, the voltage noise
of the OP270 is the major contributor to peak-to-peak noise,
with current noise becoming the major contributor as R
S
increases. The crossover point between the OP270 and the
OP200 for peak-to-peak noise is at a source resistance of 17 kΩ.
00352-035
1k
100
10
100
1k
10k 100k
PEAK-TO-PEAK NOISE (nV)
SOURCE RESISTANCE ()
RESISTOR
NOISE ONLY
OP200
OP270
Figure 34. Peak-to-Peak Noise (0.1 Hz to 10 Hz) vs. Source Resistance
(Including Resistor Noise)
Data Sheet OP270
Rev. F | Page 13 of 20
For reference, typical source resistances of some signal sources are listed in Table 4.
Table 4. Typical Source Resistances
Device Source Impedance Comments
Strain Gage <500 Ω Typically used in low frequency applications.
Magnetic Tapehead, Microphone <1500 Ω
Low I
B
is very important to reduce self-magnetization problems when
direct coupling is used. OP270 I
B
can be disregarded.
Magnetic Phonograph Cartridge <1500 Ω
Low I
B
is important to reduce self-magnetization problems in direct-coupled
applications. OP270 does not introduce any self-magnetization problems.
Linear Variable Differential Transformer <1500 Ω
Used in rugged servo-feedback applications. The bandwidth of interest is
400 Hz to 5 kHz.
00325-036
OP270
DUT
R1
5
R2
5
R3
1.24k
OP27E
R5
909
R4
200
R13
5.9k
R12
10k
OP27E
OP42E
R9
306
R10
65.4k
R11
65.4k
R8
10k
C1
2µF
C4
0.22µF
D1, D2
1N4148
R6
600
C2
0.032µF
C3
0.22µF
C5
1µF
R14
4.99k
e
OUT
GAIN = 50,000
V
S
= ±15V
Figure 35. Peak-to-Peak Voltage Noise Test Circuit (0.1 Hz to 10 Hz)
OP270 Data Sheet
Rev. F | Page 14 of 20
NOISE MEASUREMENTS
Peak-to-Peak Voltage Noise
The circuit of Figure 35 is a test setup for measuring peak-to-
peak voltage noise. To measure the 200 nV peak-to-peak noise
specification of the OP270 in the 0.1 Hz to 10 Hz range, the
following precautions must be observed:
The device has to be warmed up for at least five minutes.
As shown in the warm-up drift curve (see Figure 8), the
offset voltage typically changes 2 μV due to increasing chip
temperature after power-up. In the 10 sec measurement
interval, these temperature-induced effects can exceed tens
of nanovolts.
For similar reasons, the device has to be well shielded from
air currents. Shielding also minimizes thermocouple effects.
Sudden motion in the vicinity of the device can also feed
through to increase the observed noise.
The test time to measure noise of 0.1 Hz to 10 Hz should
not exceed 10 sec. As shown in the noise-tester frequency
response curve of Figure 36, the 0.1 Hz corner is defined by
only one pole. The test time of 10 sec acts as an additional
pole to eliminate noise contribution from the frequency
band below 0.1 Hz.
A noise voltage density test is recommended when measuring
noise on several units. A 10 Hz noise voltage density mea-
surement correlates well with a 0.1 Hz to 10 Hz peak-to-peak
noise reading because both results are determined by the
white noise and the location of the 1/f corner frequency.
Power should be supplied to the test circuit by well bypassed
low noise supplies, such as batteries. Such supplies will min-
imize output noise introduced via the amplifier supply pins.
00352-037
100
60
80
0
20
40
GAIN (dB)
FREQUENCY (Hz)
0.01 0.1 1 10 100
Figure 36. 0.1 Hz to 10 Hz Peak-to-Peak Voltage Noise
Test Circuit Frequency Response
Noise Measurement—Noise Voltage Density
The circuit of Figure 37 shows a quick and reliable method for
measuring the noise voltage density of dual op amps. The first
amplifier is in unity gain, with the final amplifier in a noninverting
gain of 101. Because the noise voltages of the amplifiers are
uncorrelated, they add in rms to yield
2
2
101
nB
nA
OUT
eee
The OP270 is a monolithic device with two identical amplifiers.
Therefore, the noise voltage densities of the amplifiers match,
giving
nn
OUT
eee 21012101
2
00325-038
e
OUT
(nV/Hz) 101 (2e
n
)
V
S
= ±15V
TO SPECTRUM ANALYZER
e
OUT
R1
100
R2
10k
1/2
OP270
1/2
OP270
Figure 37. Noise Voltage Density Test Circuit
Noise Measurement—Current Noise Density
The test circuit shown in Figure 38 can be used to measure current
noise density. The formula relating the voltage output to the current
noise density is

S
nOUT
n
R
HznV
G
e
i
2
2
/40
where:
G is a gain of 10,000.
R
S
= 100 kΩ source resistance.
00325-039
OP270
DUT
R1
5
R2
100k
R3
1.24k
OP27E
R5
8.06k
R4
200
e
nOUT
GAIN = 10,000
V
S
= ±15V
TO SPECTRUM ANALYZER
Figure 38. Current Noise Density Test Circuit

OP270FZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Precision Amplifiers VERY LOW-NOISE PRECISION
Lifecycle:
New from this manufacturer.
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