Preliminary Technical Data
ADM1025/ADM1025A
Rev. P5 | Page 13 of 21| www.onsemi.com
TEMPERATURE MEASUREMENT SYSTEM
INTERNAL TEMPERATURE MEASUREMENT
The ADM1025/ADM1025A contains an on-chip band gap
temperature sensor whose output is digitized by the on-chip
ADC. The temperature data is stored in the Local Temperature
Value Register (Address 27h). As both positive and negative
temperatures can be measured, the temperature data is stored in
twos complement format, as shown in Table 6. Theoretically,
the temperature sensor and ADC can measure temperatures
from −128°C to +127°C with a resolution of 1°C, although
temperatures below 0°C and above +100°C are outside the
operating temperature range of the device.
EXTERNAL TEMPERATURE MEASUREMENT
The ADM1025/ADM1025A can measure temperature using an
external diode sensor or diode-connected transistor connected
to Pins 9 and 10.
The forward voltage of a diode or diode-connected transistor,
operated at a constant current, exhibits a negative temperature
coefficient of about −2 mV/°C. Unfortunately, the absolute
value of V
BE
, varies from device to device, and individual
calibration is required to null this out, so the technique is
unsuitable for mass production.
The technique used in the ADM1025/ADM1025A is to measure
the change in V
BE
when the device is operated at two different
currents. This is given by:
)(/
N
InqKT
V
BE
×=
Δ
where:
K is Boltzmanns constant.
q is the charge on the carrier.
T is the absolute temperature in Kelvins.
N is the ratio of the two currents.
Figure 15 shows the input signal conditioning used to measure
the output of an external temperature sensor. This figure shows
the external sensor as a substrate transistor provided for
temperature monitoring on some microprocessors, but it could
equally well be a discrete transistor.
If a discrete transistor is used, the collector will not be grounded
and should be linked to the base. If a PNP transistor is used, the
base is connected to the D− input and the emitter to the D+
input. If an NPN transistor is used, the emitter is connected to
the D− input and the base to the D+ input.
Bit 6 of Status Register 2 (42h) is set if a remote diode fault is
detected. The ADM1025/ADM1025A detects shorts from D+ to
GND or supply, as well as shorts/opens between D+/D−.
Figure 15. Signal Conditioning for External Diode Temperature Sensors
Table 6. Temperature Data Format
Temperature Digital Output
−128°C 1000 0000
−125°C 1000 0011
−100°C 1001 1100
−75°C 1011 0101
−50°C 1100 1110
−25°C 1110 0111
0°C 0000 0000
+10°C 0000 1010
+25°C 0001 1001
+50°C 0011 0010
+75°C 0100 1011
+100°C 0110 0100
+125°C 0111 1101
+127°C 0111 1111
To prevent ground noise interfering with the measurement, the
more negative terminal of the sensor is not referenced to
ground but is biased above ground by an internal diode at the
D− input.
If the sensor is used in a very noisy environment, a capacitor of
value up to 1 nF may be placed between the D+ and D– inputs
to filter the noise.
To measure Δ V
BE
, the sensor is switched between operating
currents of I and N × I. The resulting waveform is passed
through a 65 kHz low-pass filter to remove noise, then to a
chopperstabilized amplifier that performs the functions of
amplification and rectification of the waveform to produce a dc
voltage proportional to ΔV
BE
. This voltage is measured by the
ADC to give a temperature output in 8-bit twos complement
format. To further reduce the effects of noise, digital filtering is
performed by averaging the results of 16 measurement cycles.
An external temperature measurement takes nominally 34.8 ms.
ADM1025/ADM1025A
Preliminary Technical Data
Rev. P5 | Page 14 of 21| www.onsemi.com
LAYOUT CONSIDERATIONS
Digital boards can be electrically noisy environments and care
must be taken to protect the analog inputs from noise,
particularly when measuring the very small voltages from a
remote diode sensor. The following precautions should be
taken:
1.
Place the ADM1025/ADM1025A as close as possible to the
remote sensing diode. Provided that the worst noise
sources, such as clock generators, data/address buses, and
CRTs, are avoided, this distance can be four to eight inches.
2.
Route the D+ and D− tracks close together, in parallel,
with grounded guard tracks on each side. Provide a ground
plane under the tracks if possible.
3.
Use wide tracks to minimize inductance and reduce noise
pickup. 10 mil track minimum width and spacing is
recommended.
Figure 16. Arrangement of Signal Tracks
4. Try to minimize the number of copper/solder joints, which
can cause thermocouple effects. Where copper/solder
joints are used, make sure that they are in both the D+ and
D− path and at the same temperature.
Thermocouple effects should not be a major problem as
1°C corresponds to about 240 μV, and thermocouple
voltages are about 3 μV/°C of temperature difference.
Unless there are two thermocouples with a big temperature
differential between them, thermocouple voltages should
be much less than 200 μV.
5.
Place 0.1 μF bypass and 1 nF input filter capacitors close to
the ADM1025/ADM1025A.
6.
If the distance to the remote sensor is more than eight
inches, the use of twisted pair cable is recommended. This
will work up to about 6 to 12 feet.
7.
For really long distances (up to 100 feet) use shielded
twisted pair, such as Belden #8451 microphone cable.
Connect the twisted pair to D+ and D− and the shield to
GND close to the ADM1025/ADM1025A. Leave the
remote end of the shield unconnected to avoid ground
loops.
Because the measurement technique uses switched current
sources, excessive cable and/or filter capacitance can affect the
measurement. When using long cables, the filter capacitor may
be reduced or removed.
Cable resistance can also introduce errors. 1 Ω series resistance
introduces about 0.5°C error.
LIMIT VALUES
High and low limit values for each measurement channel are
stored in the appropriate limit registers. As each channel is
measured, the measured value is stored and compared with the
programmed limit.
STATUS REGISTERS
The results of limit comparisons are stored in Status Registers 1
and 2. The Status Register bit for a particular measurement
channel reflects the status of the last measurement and limit
comparison on that channel. If a measurement is within limits,
the corresponding Status Register bit will be cleared to “0.” If
the measurement is out of limits, the corresponding status
register bit will be set to “1.
The state of the various measurement channels may be polled
by reading the Status Registers over the serial bus. Reading the
Status Registers does not affect their contents. Out-of-limit
temperature/voltage events may also be used to generate an
interrupt so that remedial action, such as turning on a cooling
fan, may be taken immediately. This is described in the section
on
RST
and
INT
.
MONITORING CYCLE TIME
The monitoring cycle begins when a 1 is written to the Start Bit
(Bit 0) of the Configuration Register. The ADC measures each
analog input in turn and as each measurement is completed the
result is automatically stored in the appropriate value register.
This “round-robin” monitoring cycle continues until it is
disabled by writing a 0 to Bit 0 of the Configuration Register.
As the ADC will normally be left to free-run in this manner, the
time taken to monitor all the analog inputs will normally not be
of interest, since the most recently measured value of any input
can be read out at any time.
INPUT SAFETY
Scaling of the analog inputs is performed on-chip, so external
attenuators are normally not required. However, since the
power supply voltages will appear directly at the pins, it is
advisable to add small external resistors in series with the
supply traces to the chip to prevent damaging the traces or
power supplies should an accidental short such as a probe
connect two power supplies together.
Preliminary Technical Data
ADM1025/ADM1025A
Rev. P5 | Page 15 of 21| www.onsemi.com
As the resistors will form part of the input attenuators, they will
affect the accuracy of the analog measurement if their value is
too high. The analog input channels are calibrated assuming an
external series resistor of 500 Ω, and the accuracy will remain
within specification for any value from zero to 1 kΩ, so a
standard 510 Ω resistor is suitable.
The worst such accident would be connecting 0 V to 12 V—a
total of 12 V difference. With the series resistors, this would
draw a maximum current of approximately 12 mA.
LAYOUT AND GROUNDING
Analog inputs will provide best accuracy when referred to a
clean ground. A separate, low impedance ground plane for
analog ground, which provides a ground point for the voltage
dividers and analog components, will provide best performance
but is not mandatory.
The power supply bypass, the parallel combination of 10 μF
(electrolytic or tantalum) and 0.1 μF (ceramic) bypass
capacitors connected between Pin 9 and ground, should also be
located as close as possible to the ADM1025/ADM1025A.
RST
/
INT
OUTPUT
As previously mentioned, Pin 16 is a multifunction pin. Its state
after power-on is latched to set the lowest two bits of the serial
bus address. During NAND tree board-level connectivity
testing, it functions as the output of the NAND tree. It may also
be used as a reset output, or as an interrupt output for out-of-
limit temperature/voltage events.
Pin 16 is programmed as a reset output by clearing Bit 0 of the
Test Register and setting Bit 7 of the VID Register. A low going,
20 ms, reset output pulse can then be generated by setting Bit 4
of the Configuration Register.
If Bit 7 of the VID Register is cleared, Pin 16 can be programmed
as an interrupt output for out-of-limit temperature/voltage
events (
INT
). Desired interrupt operation is achieved by
changing the values of Bits 1 and 0 of the Test Register as shown
in Table 7. Note, however, that Bits 2 to 7 of the Test Register
must be zeros (not don’t cares). If, for example,
INT
is
programmed for thermal and voltage interrupts, then if any
temperature or voltage measurement goes outside its respective
high or low limit, the
INT
output will go low. It will remain low
until Status Register 1 is read, when it will be cleared. If the
temperature or voltage remains out of limit,
INT
will be
reasserted on the next monitoring cycle.
INT
can also be
cleared by issuing an Alert Response Address Call.
Table 7. Controlling the Operation of INT
Test Register
Bit 1 Bit 0 Function
0 0 Interrupts Disabled
0 1 Thermal Interrupt Only
1 0 Voltage Interrupt Only
1 1 Voltage and Thermal Interrupts
Note that Bit 7 of VID register should be zero, and that Bits 2 to
7 of Test Register must be zeros.
When Pin 16 is used as a
RST
or
INT
output, it is open-drain
and requires an external pull-up resistor. This will restrict the
address function on Pin 16 to being high at power-up. If the
RST
or
INT
function is required and two ADM1025/
ADM1025As are to be used on the same serial bus, A1/A0 can
be set to 10 by using a high value pull-up on Pin 16 (100 kΩ or
greater). This will not override the “floating” condition of ADD
during power-up.
Note, however, that the
RST
/
INT
outputs of two or more
devices cannot be wire-ORd, since the devices would then have
the same address. If the
RST
/
INT
outputs need to be connected
to a common interrupt line, they can be ORd together using the
circuit of Figure 17.
If the
RST
or
INT
functionality is not required, a third address
may be used by setting A1/A0 to 00 by using a 1 kΩ pull-down
resistor on Pin 16. Note that this address should not be used if
RST
or
INT
is required, since using this address will cause the
device to appear to be generating resets or interrupts, since
Pin 16 will be permanently tied low.
Figure 17. Using Two ADM1025/ADM1025As on the Same Bus with a
Common Interrupt
GENTERATING AN
SMBALERT
The
INT
output can be used as an interrupt output or can be
used as an
SMBALERT
. One or more
INT
outputs can be
connected to a common
SMBALERT
line connected to the
master. If a devices
INT
line goes low, the following procedure
occurs:
1.
SMBALERT
is pulled low.
2.
Master initiates a read operation and sends the Alert
Response Address (ARA = 0001 100). This is a general call
address that must not be used as a specific device address.

ADM1025ARQZ

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
IC MONITOR SYS/VOLT 5CH 16QSOP
Lifecycle:
New from this manufacturer.
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