HEF4094B_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 3 — 4 July 2013 9 of 18
NXP Semiconductors HEF4094B-Q100
8-stage shift-and-store register
11. Waveforms
Measurement points are given in Table 9.
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 7. Clock to outputs propagation delays, and clock pulse width and maximum frequency
1/f
max
t
W
t
PHL
t
PLH
V
I
GND
V
OH
V
OL
QPn, QS1 output
CP input
V
M
V
M
001aaf113
t
PHL
t
PLH
V
OH
V
OL
QS2 output
V
M
Table 9. Measurement points
Supply voltage Input Output
V
DD
V
M
V
M
V
X
V
Y
5 V to 15 V 0.5V
DD
0.5V
DD
0.1V
DD
0.9V
DD
Measurement points are given in Table 9.
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 8. Strobe to output propagation delays, and strobe pulse width, set up and hold times
t
W
t
PHL
t
PLH
V
I
GND
V
OH
V
OL
QPn output
STR input
V
M
V
M
001aaj058
HEF4094B_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 3 — 4 July 2013 10 of 18
NXP Semiconductors HEF4094B-Q100
8-stage shift-and-store register
Measurement points are given in Table 9.
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 9. 3-state output enable and disable times for OE input
001aai545
t
PLZ
t
PHZ
outputs
disabled
outputs
enabled
outputs
enabled
output
LOW-to-OFF
OFF-to-LOW
output
HIGH-to-OFF
OFF-to-HIGH
OE input
V
M
V
I
V
OL
V
OH
GND
V
Y
V
X
t
PZL
t
PZH
V
M
V
M
V
DD
GND
Measurement points are given in Table 9.
Logic levels: V
OL
and V
OH
are typical output voltage levels that occur with the output load.
Fig 10. Data input data set up and hold times
001aaf115
GND
GND
t
h
t
su
t
h
t
su
V
M
V
M
V
M
V
I
V
OH
V
OL
V
I
QPn, QS1, QS2 output
CP input
D input
HEF4094B_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 3 — 4 July 2013 11 of 18
NXP Semiconductors HEF4094B-Q100
8-stage shift-and-store register
a. Input waveform
b. Test circuit
Test data is given in Table 10.
Definitions for test circuit:
DUT = Device Under Test.
C
L
= load capacitance including jig and probe capacitance.
R
L
= load resistance.
R
T
= termination resistance should be equal to the output impedance Z
o
of the pulse generator.
Fig 11. Test circuit
V
M
V
M
t
W
t
W
10 %
90 %
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
90 %
10 %
t
f
t
r
t
r
t
f
001aaj781
001aaj915
V
EXT
V
DD
V
I
V
O
DUT
C
L
R
T
R
L
G
Table 10. Test data
Supply voltage Input V
EXT
Load
V
DD
V
I
t
r
, t
f
t
PHL
, t
PLH
t
PHZ
, t
PZH
t
PLZ
, t
PZL
C
L
R
L
5 V to 15 V V
SS
or V
DD
20 ns open V
SS
V
DD
50 pF 1 k

HEF4094BT-Q100J

Mfr. #:
Manufacturer:
Nexperia
Description:
Counter Shift Registers HEF4094BT-Q100/SO16/REEL 13" Q
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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