FDH50N50

©2004 Fairchild Semiconductor Corporation
1
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FDH50N50 / FDA50N50 Rev. A
FDH50N50 / FDA50N50 500V N-Channel MOSFET
UniFET
TM
FDH50N50 / FDA50N50
500V N-Channel MOSFET
Features
48A, 500V, R
DS(on)
= 0.105 @V
GS
= 10 V
Low gate charge ( typical 105 nC)
Low C
rss
( typical 45 pF)
Fast switching
100% avalanche tested
Improved dv/dt capability
Description
These N-Channel enhancement mode power field effect transis-
tors are produced using Fairchild’s proprietary, planar stripe,
DMOS technology.
This advanced technology has been especially tailored to mini-
mize on-state resistance, provide superior switching perfor-
mance, and withstand high energy pulse in the avalanche and
commutation mode. These devices are well suited for high effi-
cient switched mode power supplies and active power factor
correction.
Absolute Maximum Ratings
Thermal Characteristics
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S
D
G
G
S
D
TO-247
FDH Series
GSD
TO-3P
FDA Series
Symbol Parameter FDH50N50/FDA50N50 Unit
V
DSS
Drain-Source Voltage 500 V
I
D
Drain Current - Continuous (T
C
= 25°C)
- Continuous (T
C
= 100°C)
48
30.8
A
A
I
DM
Drain Current - Pulsed
(Note 1)
192 A
V
GSS
Gate-Source voltage ±20 V
E
AS
Single Pulsed Avalanche Energy
(Note 2)
1868 mJ
I
AR
Avalanche Current
(Note 1)
48 A
E
AR
Repetitive Avalanche Energy
(Note 1)
62.5 mJ
dv/dt Peak Diode Recovery dv/dt
(Note 3)
4.5 V/ns
P
D
Power Dissipation (T
C
= 25°C)
- Derate above 25°C
625
5
W
W/°C
T
J,
T
STG
Operating and Storage Temperature Range -55 to +150 °C
T
L
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
300 °C
Symbol Parameter Min. Max. Unit
R
θJC
Thermal Resistance, Junction-to-Case -- 0.2 °C/W
R
θCS
Thermal Resistance, Case-to-Sink 0.24 -- °C/W
R
θJA
Thermal Resistance, Junction-to-Ambient -- 40 °C/W
2
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FDH50N50 / FDA50N50 Rev. A
FDH50N50 / FDA50N50 500V N-Channel MOSFET
Package Marking and Ordering Information
Electrical Characteristics
T
C
= 25°C unless otherwise noted
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 1.46mH, I
AS
= 48A, V
DD
= 50V, R
G
= 25, Starting T
J
= 25°C
3. I
SD
48A, di/dt 200A/µs, V
DD
BV
DSS
, Starting T
J
= 25°C
4. Pulse Test: Pulse width 300µs, Duty Cycle 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
Device Marking Device Package Reel Size Tape Width Quantity
FDH50N50 FDH50N50 TO-247 - - 30
FDA50N50 FDA50N50 TO-3P - - 30
Symbol Parameter Conditions Min. Typ. Max Units
Off Characteristics
BV
DSS
Drain-Source Breakdown Voltage V
GS
= 0V, I
D
= 250µA 500 -- -- V
BV
DSS
/ T
J
Breakdown Voltage Temperature
Coefficient
I
D
= 250µA, Referenced to 25°C--0.5--V/°C
I
DSS
Zero Gate Voltage Drain Current V
DS
= 500V, V
GS
= 0V
V
DS
= 400V, T
C
= 125°C
--
--
--
--
25
250
µA
µA
I
GSSF
Gate-Body Leakage Current, Forward V
GS
= 20V, V
DS
= 0V -- -- 100 nA
I
GSSR
Gate-Body Leakage Current, Reverse V
GS
= -20V, V
DS
= 0V -- -- -100 nA
On Characteristics
V
GS(th)
Gate Threshold Voltage V
DS
= V
GS
, I
D
= 250µA3.0--5.0V
R
DS(on)
Static Drain-Source
On-Resistance
V
GS
= 10V, I
D
= 24A -- 0.089 0.105
g
FS
Forward Transconductance V
DS
= 40V, I
D
= 48A
(Note 4)
-- 20 -- S
Dynamic Characteristics
C
iss
Input Capacitance V
DS
= 25V, V
GS
= 0V,
f = 1.0MHz
-- 4979 6460 pF
C
oss
Output Capacitance -- 760 1000 pF
C
rss
Reverse Transfer Capacitance -- 50 65 pF
C
oss
Output Capacitance V
DS
= 400V, V
GS
= 0V, f = 1.0MHz -- 161 -- pF
C
oss
eff. Effective Output Capacitance V
DS
= 0V to 400V, V
GS
= 0V -- 342 -- pF
Switching Characteristics
t
d(on)
Turn-On Delay Time V
DD
= 250V, I
D
= 48A
R
G
= 25
(Note 4, 5)
-- 105 220 ns
t
r
Turn-On Rise Time -- 360 730 ns
t
d(off)
Turn-Off Delay Time -- 225 460 ns
t
f
Turn-Off Fall Time -- 230 470 ns
Q
g
Total Gate Charge V
DS
= 400V, I
D
= 48A
V
GS
= 10V
(Note 4, 5)
-- 105 137 nC
Q
gs
Gate-Source Charge -- 33 -- nC
Q
gd
Gate-Drain Charge -- 45 -- nC
Drain-Source Diode Characteristics and Maximum Ratings
I
S
Maximum Continuous Drain-Source Diode Forward Current -- -- 48 A
I
SM
Maximum Pulsed Drain-Source Diode Forward Current -- -- 192 A
V
SD
Drain-Source Diode Forward Voltage V
GS
= 0V, I
S
= 48A -- -- 1.4 V
t
rr
Reverse Recovery Time V
GS
= 0V, I
S
= 48A
dI
F
/dt =100A/µs
(Note 4)
-- 580 -- ns
Q
rr
Reverse Recovery Charge -- 10 -- µC
3
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FDH50N50 / FDA50N50 Rev. A
FDH50N50 / FDA50N50 500V N-Channel MOSFET
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
10
-1
10
0
10
1
10
-1
10
0
10
1
10
2
V
GS
Top : 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
Bottom : 5.5 V
Notes :
1. 250
µ
s Pulse Test
2. T
C
= 25
o
C
!
I
D
, Drain Current [A]
V
DS
, Drain-Source Voltage [V]
45678910
0.1
1
10
100
Notes :
1. V
DS
= 40V
2. 250
µ
s Pulse Test
-55
o
C
!
150
o
C
!
25
o
C
!
I
D
, Drain Current [A]
V
GS
, Gate-Source Voltage [V]
0 25 50 75 100 125 150 175
0.0
0.1
0.2
0.3
0.4
V
GS
= 20V
V
GS
= 10V
Note : T
J
= 25
o
C
R
DS(ON)
[
],
Drain-Source On-Resistance
I
D
, Drain Current [A]
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
0
40
80
120
160
25
o
C
150
o
C
Notes :
1. V
GS
= 0V
2. 250
µ
s Pulse Test
I
DR
, Reverse Drain Current [A]
V
SD
, Source-Drain Voltage [V]
10
-1
10
0
10
1
10
2
0
2,000
4,000
6,000
8,000
10,000
12,000
C
iss
= C
gs
+ C
gd
(C
ds
= shorted)
C
oss
= C
ds
+ C
gd
C
rss
= C
gd
Notes :
1. V
GS
= 0 V
2. f = 1 MHz
C
rss
C
oss
C
iss
Capacitance [pF]
V
DS
, Drain-Source Voltage [V]
0 20 40 60 80 100 120
0
2
4
6
8
10
12
V
DS
= 250V
V
DS
= 100V
V
DS
= 400V
Note : I
D
= 48A
V
GS
, Gate-Source Voltage [V]
Q
G
, Total Gate Charge [nC]

FDH50N50

Mfr. #:
Manufacturer:
ON Semiconductor / Fairchild
Description:
MOSFET 500V N-Channel UniFET
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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