LM321
www.onsemi.com
2
Table 1. ABSOLUTE MAXIMUM RATINGS (Over operating free-air temperature, unless otherwise stated)
Parameter
Rating Unit
Supply Voltage 36 V
INPUT AND OUTPUT PINS
Input Voltage
V
EE
– 0.3 to 32 V
Input Current ±10 mA
Output Short Circuit Duration (Note 1) Continuous
TEMPERATURE
Operating Temperature
–40 to +125 °C
Storage Temperature –65 to +150 °C
Junction Temperature –65 to +150 °C
ESD RATINGS (Note 2)
Human Body Model (HBM)
200 V
Charged Device Model (CDM) 800 V
Machine Model (MM) 100 V
OTHER RATINGS
Latch-Up Current (Note 3)
100 mA
MSL Level 1
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Short circuits can cause excessive heating and eventual destruction.
2. This device series incorporates ESD protection and is tested by the following methods:
ESD Human Body Model tested per JEDEC standard: JESD22−A114
ESD Machine Model tested per JEDEC standard: JESD22−A115
3. Latch-up Current tested per JEDEC standard: JESD78
Table 2. THERMAL INFORMATION (Note 4)
Parameter Symbol Package Value Unit
Junction to Ambient
q
JA
TSOP−5/SOT23−5 235 °C/W
4. As mounted on an 80 × 80 × 1.5 mm FR4 PCB with 650 mm
2
and 2 oz (0.034 mm) thick copper heat spreader. Following JEDEC
JESD/EIA 51.1, 51.2, 51.3 test guidelines.
Table 3. RECOMMENDED OPERATING CONDITIONS
Parameter Symbol Range Unit
Supply Voltage (V
CC
− V
EE
) V
S
3 to 32 V
Specified Operating Range T
A
−40 to 85 °C
Common Mode Input Voltage Range V
CM
V
EE
to V
CC
−1.7 V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
