5962-8777101MCA

STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87771
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
G
SHEET
4
DSCC FORM 2234
APR 97
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 as specified herein, or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Schematic diagram. The schematic diagram shall be as specified on figure 2.
3.2.4 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of
MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime’s agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 49 (see MIL-PRF-38535, appendix A).
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87771
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
G
SHEET
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55C T
A
+125C
V
CC
= 15 V
Group A
subgroups
Device
type
Limits
Unit
unless otherwise specified Min Max
Input offset voltage
V
IO
1 01 -150 +150
V
2, 3 -270 +270
M,D,P,L,R 1 -150 +150
Input offset current
I
IO
V
CM
= 0 V
1 01 -1.0 +1.0 nA
2, 3 -2.5 +2.5
M,D,P,L,R 1 -2.5 +2.5
Input bias current
I
IB
V
CM
= 0 V
1 01 -3.0 +3.0 nA
2, 3 -5.0 +5.0
M,D,P,L,R 1 -20.0 +20.0
Input voltage range
+I
VR
2/
1, 2, 3 01 +12 V
-I
VR
-12
Common mode rejection
ratio
CMRR
V
CM
= 12 V
1 01 120 dB
2, 3 115
M,D,P,L,R 1 115
Power supply rejection ratio PSRR
V
CC
= 3 V and 18 V
1 01 1.8
V/V
2, 3 3.2
M,D,P,L,R 1 3.2
Supply current
I
SY
No load 3/
1 01 2.9 mA
2, 3 3.1
M,D,P,L,R 1 3.1
Large signal voltage gain
A
VS
V
OUT
= 10 V, R
L
= 2 k
4 01 2000 V/mV
5, 6 1000
M,D,P,L,R 4 2000
V
OUT
= 10 V, R
L
= 10 k
4 5000
5, 6 3000
M,D,P,L,R 4 5000
Output voltage swing
+V
OP
R
L
= 2 k
4, 5, 6 01 +11 V
M,D,P,L,R 4 +11
R
L
= 10 k
4,5,6 +12
M,D,P,L,R 4 +12
-V
OP
R
L
= 2 k
4,5,6 -11
M,D,P,L,R 4 -11
R
L
= 10 k
4,5,6 -12
M,D,P,L,R 4 -12
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87771
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
G
SHEET
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - continued.
Test
Symbol
Conditions 1/
-55C T
A
+125C
V
CC
= 15 V
Group A
subgroups
Device
type
Limits
Unit
unless otherwise specified Min Max
Input noise voltage density
e
N
f
O
= 10 Hz, T
A
= +25C 4/
7 01 22 nV /
f
O
= 1000 Hz,
T
A
= +25C 4/
22
Hz
Input noise voltage
e
NT
1 Hz to 100 Hz,
T
A
= +25C
7 01 438 nVRMS
Slew rate SR
A
V
= +1, T
A
= +25C
7 01 0.05
V/s
Average input offset voltage
drift
TC
VIO
8 01 1.2
V/C
1/ Devices supplied to this drawing have been characterized through all levels M, D, P, L, R of irradiation and tested at the
“R” level. Pre and Post irradiation values are identical unless otherwise specified in Table I. When performing post
irradiation electrical measurements for any RHA level, T
A
= +25C.
These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,
method 1019, condition A.
2/ IVR guaranteed by CMRR test.
3/ I
SY
limit = total all four amplifiers.
4/ e
N
at f
O
= 10 Hz and f
O
= 1000 Hz is guaranteed by e
NT
test.
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
(2) T
A
= +125C, minimum.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.

5962-8777101MCA

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Operational Amplifiers - Op Amps QUAD LOW-OFFSET/ POWER IC
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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