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M74HC299B1R
P1-P3
P4-P6
P7-P9
P10-P12
P13-P13
M74HC299
7/13
CAPACITIVE CHARA
CT
ERISTICS
1)
C
PD
is
d
efined
as
t
he valu
e of the I
C’s int
ernal eq
uiva
lent capa
citan
ce whic
h is calc
ulate
d from t
he oper
ating cur
rent c
onsu
mption
w
ith
ou
t
lo
ad. (Ref
er to Tes
t
C
ircui
t). Aver
age ope
ratin
g curre
nt can be ob
tained
by the
f
ollowi
ng equa
tion. I
CC(opr)
= C
PD
x V
CC
x f
IN
+ I
CC
TEST CIRCUIT
C
L
= 50p
F/150p
F or equiv
alent (in
clu
des jig and
p
robe c
apacit
ance)
R
1
= 1K
Ω
or
equiva
lent
R
T
= Z
OUT
of pu
ls
e
generator (typically 50
Ω
)
Symbo
l
Param
eter
T
est Conditi
on
V
alue
Unit
V
CC
(V)
T
A
= 25°
C
-40 to 8
5°C
-55 to 1
25°C
Min.
T
yp.
Max.
Min.
Max.
Mi
n.
M
ax.
C
IN
Input Ca
pacitance
5
.
0
5
1
01
01
0
p
F
C
PD
Power D
issipation
Capacita
nce (note
1)
5.0
170
pF
TEST
SWITCH
t
PL
H
, t
PHL
Open
t
PZL
, t
PLZ
V
CC
t
PZH
, t
PHZ
GND
M74HC299
8/13
WAV
E
FORM 1
:
PROPAGATION DELAY TIM
E
S, M
I
NIMUM
PULSE WIDTH
(f
=1MHz; 50% du
t
y cycle)
WAV
E
F
O
RM
2
: SETUP AND HOLD
T
IMES
(f=1
MHz; 50% d
uty cycle
)
M74HC299
9/13
WAV
E
FORM
3 :PROPAGATION
DELAY AND REM
O
VAL
TIME, MINIMUM PULSE WIDT
H
(f=1MHz;
50% duty
cycle)
WAV
E
FORM 4: OUTPUT ENABLE AND DISABLE T
IM
E
S
(f=
1
M
Hz; 50%
duty c
ycle)
P1-P3
P4-P6
P7-P9
P10-P12
P13-P13
M74HC299B1R
Mfr. #:
Buy M74HC299B1R
Manufacturer:
STMicroelectronics
Description:
IC UNIV SHIFT REGISTER 20DIP
Lifecycle:
New from this manufacturer.
Delivery:
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