Obsolete Product(s) - Obsolete Product(s) Obsolete Product(s) - Obsolete Product(s)
DC and AC characteristics M27C160
16/26
Figure 8. Word-Wide Read Mode AC Waveforms
Note: BYTE
V
PP
= V
IH
.
Table 10. Read Mode AC Characteristics
(1)
(-90, -100, -120 and -150)
1. V
CC
must be applied simultaneously with or before VPP and removed simultaneously or after V
PP
.
Symbol Alt Parameter
Test
Condition
M27C160
Unit-90
(2)
2. Speed obtained with High Speed AC measurement conditions.
-100
(2)
-120/-150
(2)
Min. Max. Min. Max. Min. Max.
t
AVQV
t
ACC
Address Valid to Output
Valid
E = V
IL
,
G = V
IL
90 100 120 ns
t
BHQV
t
ST
BYTE High to Output
Valid
E = V
IL
,
G
= V
IL
90 100 120 ns
t
ELQV
t
CE
Chip Enable Low to
Output Valid
G
= V
IL
90 100 120 ns
t
GLQV
t
OE
Output Enable Low to
Output Valid
E
= V
IL
45 50 60 ns
t
BLQZ
(3)
3. Sampled only, not 100% tested.
t
STD
BYTE Low to Output Hi-
Z
E = V
IL
,
G
= V
IL
30 40 50 ns
t
EHQZ
(3)
t
DF
Chip Enable High to
Output Hi-Z
G
= V
IL
030040050ns
t
GHQZ
(3)
t
DF
Output Enable High to
OutputHi-Z
E
= V
IL
030040050ns
t
AXQX
t
OH
Address Transition to
Output Transition
E = V
IL
,
G = V
IL
555ns
t
BLQX
t
OH
BYTE Low to
Output Transition
E = V
IL
,
G
= V
IL
555ns
AI00741B
tAXQX
tEHQZ
A0-A19
E
G
Q0-Q15
tAVQV
tGHQZ
tGLQV
tELQV
VALID
Hi-Z
VALID
Obsolete Product(s) - Obsolete Product(s) Obsolete Product(s) - Obsolete Product(s)
M27C160 DC and AC characteristics
17/26
Figure 9. Byte-Wide Read Mode AC Waveforms
Note: BYTE
V
PP
= V
IL
.
Figure 10. BYTE
Transition AC Waveforms
Note: Chip Enable (E
) and Output Enable (G) = V
IL
.
AI00742B
tAXQX
tEHQZ
A–1,A0-A19
E
G
Q0-Q7
tAVQV
tGHQZ
tGLQV
tELQV
VALID
Hi-Z
VALID
AI00743C
tAXQX
tBHQV
A0-A19
BYTEV
PP
tAVQV
tBLQX
tBLQZ
VALID
Hi-Z
A–1
DATA OUT
DATA OUT
VALID
Q0-Q7
Q8-Q15
Obsolete Product(s) - Obsolete Product(s) Obsolete Product(s) - Obsolete Product(s)
DC and AC characteristics M27C160
18/26
T
A
= 25 °C; V
CC
= 6.25V ± 0.25V; V
PP
= 12.5V ± 0.25V
Figure 11. Programming and Verify Modes AC Waveforms
Table 11. Programming Mode AC Characteristics
(1)
1. V
CC
must be applied simultaneously with or before VPP and removed simultaneously or after V
PP
.
Symbol Alt Parameter Test Condition Min Max Unit
t
AVEL
t
AS
Address Valid to Chip Enable Low 2 µs
t
QVEL
t
DS
Input Valid to Chip Enable Low 2 µs
t
VPHAV
t
VPS
V
PP
High to Address Valid 2 µs
t
VCHAV
t
VCS
V
CC
High to Address Valid 2 µs
t
ELEH
t
PW
Chip Enable Program Pulse Width 45 55 µs
t
EHQX
t
DH
Chip Enable High to Input Transition 2 µs
t
QXGL
t
OES
Input Transition to Output Enable Low 2 µs
t
GLQV
t
OE
Output Enable Low to Output Valid 120 ns
t
GHQZ
(2)
2. Sampled only, not 100% tested.
t
DFP
Output Enable High to Output Hi-Z 0 130 ns
t
GHAX
t
AH
Output Enable High to Address
Transi tio n
0ns
tAVEL
VALID
AI00744
A0-A19
Q0-Q15
BYTEV
PP
V
CC
G
DATA IN DATA OUT
E
tQVEL
tVPHAV
tVCHAV
tEHQX
tELEH
tGLQV
tQXGL
tGHQZ
tGHAX
PROGRAM VERIFY

M27C160-100B1

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
EPROM 2Mx8 or 1Mx16 100ns
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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