Sensors
4 Freescale Semiconductor
MC145010
Table 3. AC Electrical Characteristics
Reference Timing Diagram Figure 6 and Figure 7. (T
A
= 25°C, V
DD
= 9.0 V, Component values from Figure 8: R1 = 100.0 K,
C3 = 1500.0 pF, R2 = 10.0 M.)
No. Characteristics Symbol Clocks Min Max Unit
1 Oscillator Period
(1)
Free-Running Sawtooth Measured at Pin 12
1. Oscillator Period T (= T
r
+ T
f
) is determined by the external components R1, R2, and C3 where T
r
= (0.6931) R
2
x C
3
and
T
f
= (0.6031) R
1
x C
3
.
The other timing characteristics are some multiple of the oscillator timing shown in the table.
1/f
OSC
1 9.5 11.5 ms
2
3
4
LED Pulse Period
No Local Smoke, and No Remote Smoke
Remote Smoke, but No Local Smoke
Local Smoke or Push Button Test
t
LED
4096
64
38.9
0.60
47.1
0.74
s
5 LED Pulse Width and Strobe Pulse Width t
w(LED)
,
t
w(STB)
1 9.5 11.5 ms
6
7
8
IRED Pulse Period
Smoke Test
Chamber Sensitivity Test without Local Smoke
Push Button Test
t
IRED
1024
4096
32
9.67
38.9
0.302
11.83
47.1
0.370
s
9 IRED Pulse Width t
w(IRED)
T
f
1
94 116 µs
10 IRED Rise Time
IRED Fall Time
t
r
t
f
30
200
µs
11 Silver and Brass Modulation Period
Local or Remote Smoke
t
MOD
297 363
ms
11
12
Silver and Brass Duty Cycle
Local or Remote Smoke
t
ON
/t
MOD
73 77
%
13 Silver and Brass Chirp Pulse Period
Low Supply or Degraded Chamber Sensitivity
t
CH
4096 38.9 47.1
s
14 Silver and Brass Chirp Pulse Width
Low Supply or Degraded Chamber Sensitivity
tw
(CH)
1 9.5 11.5
ms
15 Rising Edge on I/O to Smoke Alarm Response Time
Remote Smoke, No Local Smoke
t
RR
800
ms
16
17
18
19
Strobe Out Pulse Period
Smoke Test
Chamber Sensitivity Test without Local Smoke
Low Supply Test without Local Smoke
Push Button Test
t
STB
1024
4096
4096
9.67
38.9
38.9
0.302
11.83
47.1
47.1
0.370
s
Sensors
Freescale Semiconductor 5
MC145010
Table 4. Pin Description
Pin Symbol Description
1 C1 A capacitor connected to this pin, shown in Figure 8, determines the gain of the on-chip photo amplifier during push button
test and chamber sensitivity test (high gain). The capacitor value is chosen such that the alarm is tripped from background
reflections in the chamber during push button test.
A
v
ª 1 + (C1/10) where C1 is in pF. CAUTION: The value of the closed-loop gain should not exceed 10,000.
2 C2 A capacitor connected to this pin as shown in Figure 8 determines the gain of the on-chip photo amplifier except during
push button or chamber sensitivity tests. A
v
1 + (C2/10) where C2 is in pF. This gain increases about 10% during the
IRED pulse, after two consecutive local smoke detections.
Resistor R14 must be installed in series with C2. R14 [1/(12C2)] - 680 where R14 is in ohms and C2 is in farads.
3 DETECT This input to the high-gain pulse amplifier is tied to the cathode of an external photodiodes. The photodiodes should have
low capacitance and low dark leakage current. The diode must be shunted by a load resistor and is operated at zero bias.
The Detect input must be ac/dc decoupled from all other signals, V
DD
, and V
SS
. Lead length and/or foil traces to this pin
must be minimized, also. See Figure 9.
4 STROBE This output provides a strobed, regulated voltage referenced to V
DD
. The temperature coefficient of this voltage is ± 0.2%/
°C maximum from - 10° to 60°C. The supply-voltage coefficient (line regulation) is ± 0.2%/V maximum from 6 to 12 V.
Strobe is tied to external resistor string R8, R9, and R10.
5 V
DD
This pin is connected to the positive supply potential and may range from +6 to +12 V with respect to V
SS
. CAUTION: In
battery-powered applications, reverse-polarity protection must be provided externally.
6 IRED This output provides pulsed base current for external NPN transistor Q1 used as the infrared emitter driver. Q1 must have
β 100. At 10 mA, the temperature coefficient of the output voltage is typically + 0.5%/°C from - 10° to 60°C. The supply-
voltage coefficient (line regulation) is ± 0.2%/V maximum from 6 to 12 V. The IRED pulse width (active-high) is determined
by external components R1 and C3. With a 100 k/1500 pF combination, the nominal width is 105 µs. To minimize noise
impact, IRED is not active when the visible LED and horn outputs are active. IRED is active near the end of Strobe pulses
for Smoke Tests, Chamber Sensitivity Test, and Push button Test.
7 I/O This pin can be used to connect up to 40 units together in a wired-OR configuration for common signaling. V
SS
is used as
the return. An on-chip current sink minimizes noise pick up during non-smoke conditions and eliminates the need for an
external pull-down resistor to complete the wired-OR. Remote units at lower supply voltages do not draw excessive current
from a sending unit at a higher supply voltage.
I/O can also be used to activate escape lights, auxiliary alarms, remote alarms, and/or auto-dialers.
As an input, this pin feeds a positive-edge-triggered flip-flop whose output is sampled nominally every 625 ms during
standby (using the recommended component values). A local-smoke condition or the push button-test mode forces this
current-limited output to source current. All input signals are ignored when I/O is sourcing current. I/O is disabled by the
on-chip power-on reset to eliminate nuisance signaling during battery changes or system power-up. If unused, I/O must
be left unconnected.
8 BRASS This half of the push-pull driver output is connected to the metal support electrode of a piezoelectric audio transducer and
to the horn-starting resistor. A continuous modulated tone from the transducer is a smoke alarm indicating either local or
remote smoke. A short beep or chirp is a trouble alarm indicating a low supply or degraded chamber sensitivity.
9 SILVER This half of the push-pull driver output is connected to the ceramic electrode of a piezoelectric transducer and to the horn-
starting capacitor.
10 FEEDBA
CK
This input is connected to both the feedback electrode of a self-resonating piezoelectric transducer and the horn-starting
resistor and capacitor through current-limiting resistor R4. If unused, this pin must be tied to V
SS
or V
DD
.
11 LED This active-low open-drain output directly drives an external visible LED at the pulse rates indicated below. The pulse width
is equal to the OSC period.
The load for the low-supply test is applied by this output. This low-supply test is non-coincident with the smoke tests,
chamber sensitivity test, push button test, or any alarm signals.
The LED also provides a visual indication of the detector status as follows, assuming the component values shown in
Figure 8: Standby (includes low-supply and chamber sensitivity tests) - Pulses every 43 seconds (nominal) Local Smoke
- Pulses every 0.67 seconds (nominal) Remote Smoke - No pulses
Push button Test - Pulses every 0.67 seconds (nominal)
12 OSC This pin is used in conjunction with external resistor R2 (10 M) to V
DD
and external capacitor C3 (1500 pF) to V
DD
to
form an oscillator with a nominal period of 10.5 ms.
13 R1 This pin is used in conjunction with resistor R1 (100 k) to pin 12 and C3 (1500 pF, see pin 12 description) to determine
the IRED pulse width. With this RC combination, the nominal pulse width is 105 µs.
14 VSS This pin is the negative supply potential and the return for the I/O pin. Pin 14 is usually tied to ground.
15 LOW-
SUPPLY
TRIP
This pin is connected to an external voltage which determines the low-supply alarm threshold. The trip voltage is obtained
through a resistor divider connected between the V
DD
and LED pins. The low-supply alarm threshold voltage (in volts)
(5R7/R6) + 5 where R6 and R7 are in the same units.
Sensors
6 Freescale Semiconductor
MC145010
Figure 3. AC Characteristics vs. Supply
Figure 4. AC Characteristics vs. Temperature
Figure 5. RC Component Variation Overtemperature
16 TEST This input has an on-chip pull-down device and is used to manually invoke a test mode. The Push Button Test mode is
initiated by a high level at pin 16 (usually depression of a S.P.S.T. normally-open push button switch to V
DD
). After one
oscillator cycle, IRED pulses approximately every 336 ms, regardless of the presence of smoke. Additionally, the amplifier
gain is increased by automatic selection of C1. Therefore, the background reflections in the smoke chamber may be
interpreted as smoke, generating a simulated-smoke condition. After the second IRED pulse, a successful test activates
the horn-driver and I/O circuits. The active I/O allows remote signaling for system testing. When the Push Button Test
switch is released, the Test input returns to V
SS
due to the on-chip pull-down device. After one oscillator cycle, the amplifier
gain returns to normal, thereby removing the simulated-smoke condition. After two additional IRED pulses, less than a
second, the IC exits the alarm mode and returns to standby timing.
Table 4. Pin Description (Continued)
Pin Symbol Description
Pulse width of IRED
Period or pulse width
of other parameters
AC Parameter (Normalized To 9.0 V Value)
V
DD
, Power Supply Voltage (V)
1.02
0.98
0.96
1.00
1.04
6.0 7.0 8.0 9.0 10.0 12.0
11.0
Pulse width of IRED
Period or pulse width
of other parameters
AC Parameter (Normalized To 25°C Value)
T
A
, Ambient Temperature (°C)
-10 0 10 20 40 50 60
1.02
1.01
0.99
0.98
1.00
30
V
DD
= 9.0 V
10 MCarbon composition
100 kMetal Film
1500 pF Dipped MICA
Component Value (Normalized To
25 C Value)
°
T
A
, Ambient Temperature (°C)
-10 0 10 20 30 40 50 60
1.03
1.02
1.01
1.00
0.99
0.98
Note: These components were used to generate
Figure 3.

MC145010ED

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
IC SMOKE DETECT PHOTOELEC 16-DIP
Lifecycle:
New from this manufacturer.
Delivery:
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