SpecNo.JELF243A-0140A-01 P.10/10
MURATA MFG.CO.,LTD
Reference Only
(1) Residual elements and stray elements of test fixture can be described by F-parameter shown in following.
(2) The impedance of chip coil Zx and measured value Zm can be described by input/output current/voltage.
Zm=
V
1
， Zx=
V
2
I
1
I
2
(3) Thus,the relation between Zx and Zm is following;
Zx= α
Zm-β where, α= D / A =1
1-ZmΓ β= B / D =Zsm-(1-Yom Zsm)Zss
Γ= C / A =Yom
Zsm : measured impedance of short chip
Zssa: residual impedance of short chip (0.556nH)
Yom: measured admittance when opening the fixture
(4) Lx shall be calculated with the following equation.
Lx=
Im(Zx) Lx :
Inductance of chip coil
2πf f :
Measuring frequency
V
1
=
A B
V
2
I
1
C D
I
2
A
B
C
D
Zm
Zx
V
1
2
1
2
ProductTest fixtureTest Head
I
I
V
<Electrical Performance:Measuring Method of Inductance >
