KAI−1003
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7
PERFORMANCE SPECIFICATIONS
Table 6. PERFORMANCE SPECIFICATIONS
(All values measured at 40°C and 30 fps (integration time = 33 ms, f
H
= 20 MHz) for nominal operating parameters unless otherwise
noted. These parameters exclude defective pixels.)
Description Symbol Min. Nom. Max. Unit
Saturation Charge Capacity with Blooming Control Q
SAT
170 ke
Output Gain 6.5 7.5 8.5
mV/e
Output Voltage at the Saturation Level V
SAT
1.3 V
Quantum Efficiency at 500 nm 32 %
Quantum Efficiency at 540 nm 30 %
Quantum Efficiency at 600 nm 24 %
CCD Readout Noise with CDS 40 50 e
rms
Dark Current I
DARK
0.25 0.45 nA/cm
2
Anti-Blooming Factor (Notes 1, 2) X
AB
100
Vertical Smear (Notes 2, 6) 0.005 0.01 %
Non-Uniformity of Sensitivity (Notes 3, 4) 0.3 0.5 % rms
Non-Uniformity of Dark Current (Note 4) 14 e
rms
Output Signal Non-Linearity (Note 5) 1 2 %
Gain Difference between the Two Video Outputs (Note 5) 10 %
Non-Uniformity of Gain between the Two Outputs (Note 5) 0.5 1.5 %
1. The illumination required to bloom the image sensor reported as a multiple of the saturation intensity. Blooming is defined as doubling the
vertical height of a spot that is 10% of the vertical CCD height at the saturation intensity.
2. Measured with continuous green light centered at 550 nm, F/4 optics and a spot size that is 10% of the vertical CCD height.
3. Measured at 90% of 150 ke
output.
4. Measured in the center 50 × 50 pixels.
5. Between 10% and 90% of 150 ke
output.
6. Measured without electronic shutter operation.
Typical Quantum Efficiency
Figure 5. Quantum Efficiency Spectrum
0.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
0.40
0.45
0.50
400 500 600 700 800 900 1000 1100
Wavelength (nm)
Absolute Quantum Efficiency
With Cover Glass
KAI−1003
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8
Angular Dependance of Quantum Efficiency
For the curve marked “Horizontal”, the incident light angle is varied in a plane parallel to the HCCD.
Figure 6. Angular Dependance of Quantum Efficiency
0
10
20
30
40
50
60
70
80
90
100
0 5 10 15 20 25 30 35 40 45
Horizontal
Angle (Degrees)
Relative Quantum Efficiency (%)
KAI−1003
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9
DEFECT SPECIFICATIONS
Defect Test Conditions
Temperature: 40°C
Integration Time: 33 ms (20 MHz HCCD Frequency, No Binning, 30 fps Frame Rate)
Light Source: Continuous Green Light Centered at 550 nm
Operation: Nominal Voltages and Timing
Table 7. DEFECT DEFINITIONS
Name
Maximum
Number
Definition
Major Defective Pixel 20 A pixel whose signal deviates by more than 25 mV from the mean value of all active pixels
under dark field condition or by more than 8% from the mean value of all active pixels
under uniform illumination at 105 ke
output signal.
Minor Defective Pixel 100 A pixel whose signal deviates by more than 8 mV from the mean value of all active pixels
under dark field condition.
Cluster Defect 4 A group of 2 to 6 contiguous major defective pixels, but no more than 2 adjacent defects
horizontally.
Column Defect 0 A group of more than 6 contiguous major defective pixels along a single column.
Defect Proximity
Minimum Distance between Defective Clusters: 2 Pixels in All Directions without Major Pixel Defects
Minimum Distance between Defective Columns: 3 Columns without Column Defects or Cluster Defects

KAI-1003-AAA-CR-B2

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
Image Sensors INTERLINE CCD IMAGE SENSOR
Lifecycle:
New from this manufacturer.
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