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TLP152(TPL,E

P1-P3P4-P6P7-P9P10-P10
TLP152
4
9.
9.
9.
9. Electrical Characteristics (Note)
Electrical Characteristics (Note)
Electrical Characteristics (Note)
Electrical Characteristics (Note)
(Unless otherwise specified, T
(Unless otherwise specified, T
(Unless otherwise specified, T
(Unless otherwise specified, T
a
a
a
a
= -40 to 100
= -40 to 100
= -40 to 100
= -40 to 100
)
)
)
)
Characteristics
Input forward voltage
Input forward voltage
temperature coefficient
Input reverse current
Input capacitance
Peak high-level output current
Peak low-level output current
High-level output voltage
Low-level output voltage
High-level supply current
Low-level supply current
Threshold input current (L/H)
Threshold input voltage (H/L)
Supply voltage
UVLO threshold voltage
UVLO hysteresis
Symbol
V
F
∆V
F
/∆T
a
I
R
C
t
I
OPH
I
OPL
V
OH
V
OL
I
CCH
I
CCL
I
FLH
V
FHL
V
CC
V
UVLO
+
V
UVLO
-
UVLO
HYS
Note
(Note 1)
(Note 1)
Test
Circuit
Fig.
12.1.1
Fig.
12.1.2
Fig.
12.1.3
Fig.
12.1.4
Fig.
12.1.5
Fig.
12.1.6
Test Condition
I
F
= 10 mA, T
a
= 25
I
F
= 10 mA
V
R
= 5 V, T
a
= 25
V = 0 V, f = 1 MHz, T
a
= 25
I
F
= 10 mA, V
CC
= 15 V,
V
6-5
= 4 V
I
F
= 10 mA, V
CC
= 15 V,
V
6-5
= 10 V
I
F
= 0 mA, V
CC
= 15 V,
V
5-4
= 2 V
I
F
= 0 mA, V
CC
= 15 V,
V
5-4
= 10 V
I
F
= 10 mA, V
CC
= 10 V,
I
O
= -100 mA
V
F
= 0.8 V, V
CC
= 10 V,
I
O
= 100 mA
I
F
= 10 mA, V
CC
= 10 to 30 V,
V
O
= Open
I
F
= 0 mA, V
CC
= 10 to 30 V,
V
O
= Open
V
CC
= 15 V, V
O
> 1 V
V
CC
= 15 V, V
O
< 1 V
I
F
= 5 mA , V
O
> 2.5 V
I
F
= 5 mA, V
O
< 2.5 V
I
F
= 5 mA , V
O
> 2.5 V
Min
1.40
1.0
2.0
6.0
0.8
10
7.5
7.5
Typ.
1.57
-1.8
45
-2.2
-3.4
2.4
3.5
8.5
0.1
1.9
1.8
1.5
1.47
8.7
8.4
0.3
Max
1.80
10
-1.0
-2.0
1.0
3.0
3.0
7.5
30
9.5
9.5
Unit
V
mV/
µA
pF
A
V
mA
V
Note: All typical values are at T
a
= 25.
Note: This device is designed for low power consumption, making it more sensitive to ESD than its predecessors.
Extra care should be taken in the design of circuitry and pc board implementation to avoid ESD problems.
Note 1: I
O
application time ≤ 50 µs, single pulse.
10.
10.
10.
10. Isolation Characteristics (Unless otherwise specified, T
Isolation Characteristics (Unless otherwise specified, T
Isolation Characteristics (Unless otherwise specified, T
Isolation Characteristics (Unless otherwise specified, T
a
a
a
a
= 25
= 25
= 25
= 25
)
)
)
)
Characteristics
Total capacitance (input to output)
Isolation resistance
Isolation voltage
Symbol
C
S
R
S
BV
S
Note
(Note 1)
(Note 1)
(Note 1)
Test Conditions
V
S
= 0 V, f = 1 MHz
V
S
= 500 V, R.H. ≤ 60%
AC, 1 min
AC, 1 s, in oil
DC, 1 min, in oil
Min
1×10
12
3750
Typ.
0.35
10
14
10000
10000
Max
Unit
pF
Ω
Vrms
Vdc
Note 1: This device is considered as a two-terminal device: Pins 1 and 3 are shorted together, and pins 4, 5 and 6 are
shorted together.
2012-09-14
Rev.3.0
TLP152
5
11.
11.
11.
11. Switching Characteristics (Note)
Switching Characteristics (Note)
Switching Characteristics (Note)
Switching Characteristics (Note)
(Unless otherwise specified, T
(Unless otherwise specified, T
(Unless otherwise specified, T
(Unless otherwise specified, T
a
a
a
a
= -40 to 100
= -40 to 100
= -40 to 100
= -40 to 100
)
)
)
)
Characteristics
Propagation delay time
(L/H)
Propagation delay time
(H/L)
Propagation delay time
(L/H)
Propagation delay time
(H/L)
Propagation delay skew
(device to device)
Pulse width distortion
Rise time
Fall time
Common-mode transient
immunity at output high
Common-mode transient
immunity at output low
Symbol
t
pLH
t
pHL
t
pLH
t
pHL
t
psk
|t
pHL
-t
pLH
|
t
r
t
f
CM
H
CM
L
Note
(Note 1)
(Note 1)
(Note 1)
(Note 1)
(Note 1)
(Note 4)
(Note 1)
(Note 1)
(Note 1)
(Note 2)
(Note 3)
Test
Circuit
Fig.
12.1.7
Fig.
12.1.8
Test Condition
I
F
= 0 → 10 mA, V
CC
= 30 V,
R
g
= 20 Ω, C
g
= 10 nF,T
a
= 25
I
F
= 10 → 0 mA, V
CC
= 30 V,
R
g
= 20 Ω, C
g
= 10 nF,T
a
= 25
I
F
= 0 → 10 mA, V
CC
= 30 V,
R
g
= 20 Ω, C
g
= 10 nF
I
F
= 10 → 0 mA, V
CC
= 30 V,
R
g
= 20 Ω, C
g
= 10 nF
I
F
= 0 ←→ 10 mA, V
CC
= 30 V,
R
g
= 20 Ω, C
g
= 10 nF
I
F
= 0 ←→ 10 mA, V
CC
= 30 V,
R
g
= 20 Ω, C
g
= 10 nF
I
F
= 0 → 10 mA, V
CC
= 30 V,
R
g
= 20 Ω, C
g
= 10 nF
I
F
= 10 → 0 mA, V
CC
= 30 V,
R
g
= 20 Ω, C
g
= 10 nF
V
CM
= 1000 V
p-p
, I
F
= 10 mA,
V
CC
= 30 V, T
a
= 25,
V
O(min)
= 26 V
V
CM
= 1000 V
p-p
, I
F
= 0 mA,
V
CC
= 30 V, T
a
= 25,
V
O(max)
= 1 V
Min
50
50
-85
±20
±20
Typ.
95
110
95
110
15
18
22
Max
145
165
170
190
85
50
Unit
ns
kV/µs
Note: All typical values are at T
a
= 25.
Note 1: Input signal ( f = 125 kHz, duty = 50%, t
r
= t
f
= 5 ns or less ).
CL is approximately 15 pF which includes probe and stray wiring capacitance.
Note 2: CM
H
is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage
in the logic high state (V
O
> 26 V).
Note 3: CM
L
is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in
the logic low state (V
O
< 1 V).
Note 4: The propagation delay skew, t
psk
, is equal to the magnitude of the worst-case difference in t
pHL
and/or t
pLH
that will be seen between units at the same given conditions (supply voltage, input current, temperature, etc).
2012-09-14
Rev.3.0
TLP152
6
12.
12.
12.
12. Test Circuits and Characteristics Curves
Test Circuits and Characteristics Curves
Test Circuits and Characteristics Curves
Test Circuits and Characteristics Curves
12.1.
12.1.
12.1.
12.1. Test Circuits
Test Circuits
Test Circuits
Test Circuits
Fig.
Fig.
Fig.
Fig. 12.1.1
12.1.1
12.1.1
12.1.1 I
I
I
I
OPH
OPH
OPH
OPH
Test Circuit
Test Circuit
Test Circuit
Test Circuit Fig.
Fig.
Fig.
Fig. 12.1.2
12.1.2
12.1.2
12.1.2 I
I
I
I
OPL
OPL
OPL
OPL
Test Circuit
Test Circuit
Test Circuit
Test Circuit
Fig.
Fig.
Fig.
Fig. 12.1.3
12.1.3
12.1.3
12.1.3 V
V
V
V
OH
OH
OH
OH
Test Circuit
Test Circuit
Test Circuit
Test Circuit Fig.
Fig.
Fig.
Fig. 12.1.4
12.1.4
12.1.4
12.1.4 V
V
V
V
OL
OL
OL
OL
Test Circuit
Test Circuit
Test Circuit
Test Circuit
Fig.
Fig.
Fig.
Fig. 12.1.5
12.1.5
12.1.5
12.1.5 I
I
I
I
CCH
CCH
CCH
CCH
Test Circuit
Test Circuit
Test Circuit
Test Circuit Fig.
Fig.
Fig.
Fig. 12.1.6
12.1.6
12.1.6
12.1.6 I
I
I
I
CCL
CCL
CCL
CCL
Test Circuit
Test Circuit
Test Circuit
Test Circuit
Fig.
Fig.
Fig.
Fig. 12.1.7
12.1.7
12.1.7
12.1.7 Switching Time Test Circuit and Waveform
Switching Time Test Circuit and Waveform
Switching Time Test Circuit and Waveform
Switching Time Test Circuit and Waveform
Fig.
Fig.
Fig.
Fig. 12.1.8
12.1.8
12.1.8
12.1.8 Common-Mode Transient Immunity Test Circuit and Waveform
Common-Mode Transient Immunity Test Circuit and Waveform
Common-Mode Transient Immunity Test Circuit and Waveform
Common-Mode Transient Immunity Test Circuit and Waveform
2012-09-14
Rev.3.0
P1-P3P4-P6P7-P9P10-P10

TLP152(TPL,E

Mfr. #:
Buy TLP152(TPL,E
Manufacturer:
Toshiba
Description:
Logic Output Optocouplers Gate Drive Phcplr 3750 Vrms
Lifecycle:
New from this manufacturer.
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