MC74AC646, MC74ACT646
www.onsemi.com
4
MAXIMUM RATINGS
Symbol Parameter Value Unit
V
CC
DC Supply Voltage (Referenced to GND) −0.5 to +7.0 V
V
IN
DC Input Voltage (Referenced to GND) −0.5 to V
CC
+0.5 V
V
OUT
DC Output Voltage (Referenced to GND) (Note 1) −0.5 to V
CC
+0.5 V
I
IK
DC Input Diode Current ±20 mA
I
OK
DC Output Diode Current ±50 mA
I
OUT
DC Output Sink/Source Current ±50 mA
I
CC
DC Supply Current, per Output Pin ±50 mA
I
GND
DC Ground Current, per Output Pin ±100 mA
T
STG
Storage Temperature Range *65 to )150
_C
T
L
Lead temperature, 1 mm from Case for 10 Seconds 260
_C
T
J
Junction Temperature Under Bias 140
_C
q
JA
Thermal Resistance (Note 2) 59.8
_C/W
MSL Moisture Sensitivity Level 1
F
R
Flammability Rating Oxygen Index: 30% − 35% UL 94 V−0 @ 0.125 in
V
ESD
ESD Withstand Voltage Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
> 2000
> 200
> 1000
V
I
Latchup
Latchup Performance Above V
CC
and Below GND at 85_C (Note 6)
±100 mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. I
OUT
absolute maximum rating must be observed.
2. The package thermal impedance is calculated in accordance with JESD 51−7.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Min Typ Max Unit
V
CC
Supply Voltage
′AC 2.0 5.0 6.0
V
′ACT 4.5 5.0 5.5
V
in
, V
out
DC Input Voltage, Output Voltage (Ref. to GND) 0 − V
CC
V
t
r
, t
f
Input Rise and Fall Time (Note 1)
′AC Devices except Schmitt Inputs
V
CC
@ 3.0 V − 150 −
V
CC
@ 4.5 V − 40 − ns/V
V
CC
@ 5.5 V − 25 −
t
r
, t
f
Input Rise and Fall Time (Note 2)
′ACT Devices except Schmitt Inputs
V
CC
@ 4.5 V − 10 −
ns/V
V
CC
@ 5.5 V − 8.0 −
T
A
Operating Ambient Temperature Range −40 25 85 °C
I
OH
Output Current − High − − −24 mA
I
OL
Output Current − Low − − 24 mA
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
1. V
in
from 30% to 70% V
CC
; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. V
in
from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
