TLP754F
4
9.
9.
9.
9. Electrical Characteristics (Note)
Electrical Characteristics (Note)
Electrical Characteristics (Note)
Electrical Characteristics (Note)
(Unless otherwise specified, T
(Unless otherwise specified, T
(Unless otherwise specified, T
(Unless otherwise specified, T
a
a
a
a
= -40 to 125
= -40 to 125
= -40 to 125
= -40 to 125
, V
, V
, V
, V
CC
CC
CC
CC
= 4.5 to 30 V)
= 4.5 to 30 V)
= 4.5 to 30 V)
= 4.5 to 30 V)
Characteristics
Input forward voltage
Input forward voltage
temperature coefficient
Input reverse current
Input capacitance
High-level output current
Low-level output voltage
High-level supply current
Low-level supply current
Output current
Threshold input current (H/L)
Threshold input voltage (L/H)
Symbol
V
F
V
F
/T
a
I
R
C
t
I
OH
V
OL
I
CCH
I
CCL
I
O
I
FHL
V
FLH
Note Test Circuit
Fig. 12.1.1
Fig. 12.1.2
Fig. 12.1.3
Fig. 12.1.4
Fig. 12.1.5
Test Condition
I
F
= 10 mA, T
a
= 25
I
F
= 10 mA
V
R
= 5 V, T
a
= 25
V = 0 V, f = 1 MHz
V
F
= 0.8 V, V
O
< V
CC
I
F
= 10 mA, I
O
= 2.4 mA
I
F
= 0 mA
I
F
= 10 mA
I
F
= 10 mA, V
O
= 0.6 V
I
O
= 0.75 mA, V
O
< 0.8 V
I
O
= 0.75 mA, V
O
> 2.0 V
Min
1.45
4.0
0.8
Typ.
1.55
-2.0
60
0.2
1.0
1.0
1.5
Max
1.7
10
50
0.6
1.3
1.3
5.0
Unit
V
mV/
µA
pF
µA
V
mA
V
Note: All typical values are at T
a
= 25 .
10.
10.
10.
10. Isolation Characteristics (Unless otherwise specified, T
Isolation Characteristics (Unless otherwise specified, T
Isolation Characteristics (Unless otherwise specified, T
Isolation Characteristics (Unless otherwise specified, T
a
a
a
a
= 25
= 25
= 25
= 25
)
)
)
)
Characteristics
Total capacitance (input to output)
Isolation resistance
Isolation voltage
Symbol
C
S
R
S
BV
S
Note
(Note 1)
(Note 1)
(Note 1)
Test Conditions
V
S
= 0 V, f = 1 MHz
V
S
= 500 V, R.H. 60 %
AC, 60 s
AC, 1 s in oil
DC, 60 s in oil
Min
1 × 10
12
5000
Typ.
1.0
10
14
10000
10000
Max
Unit
pF
Vrms
Vdc
Note 1: This device is considered as a two-terminal device: Pins 1, 2, 3 and 4 are shorted together, and pins 5, 6, 7
and 8 are shorted together.
11.
11.
11.
11. Switching Characteristics (Note)
Switching Characteristics (Note)
Switching Characteristics (Note)
Switching Characteristics (Note)
(Unless otherwise specified, T
(Unless otherwise specified, T
(Unless otherwise specified, T
(Unless otherwise specified, T
a
a
a
a
= -40 to 125
= -40 to 125
= -40 to 125
= -40 to 125
, V
, V
, V
, V
CC
CC
CC
CC
= 15 V)
= 15 V)
= 15 V)
= 15 V)
Characteristics
Propagation delay time (H/L)
Propagation delay time (L/H)
Pulse width distortion
Propagation delay skew
(device to device)
Common-mode transient
immunity at output high
Common-mode transient
immunity at output low
Symbol
t
pHL
t
pLH
|t
pHL
-
t
pLH
|
t
psk
CM
H
CM
L
Note
(Note 1)
(Note 1)
(Note 1)
(Note 1),
(Note 2)
Test
Circuit
Fig.
12.1.6
Fig.
12.1.7
Test Condition
I
F
= 0 10 mA, R
L
= 20 k,
C
L
= 100 pF
I
F
= 0 10 mA, R
L
= 20 k,
C
L
= 10 pF
I
F
= 10 0 mA, R
L
= 20 k,
C
L
= 100 pF
I
F
= 10 0 mA, R
L
= 20 k,
C
L
= 10 pF
I
F
= 10 mA, R
L
= 20 k,
C
L
= 100 pF
V
CM
= 1500 V
p-p
, I
F
= 0 mA,
R
L
= 20 k, T
a
= 25 ,
C
L
= 10 pF or 100 pF
V
CM
= 1500 V
p-p
, I
F
= 10 mA,
R
L
= 20 k, T
a
= 25 ,
C
L
= 10 pF or 100 pF
Min
30
150
-50
±20
±20
Typ.
150
70
350
110
±25
±25
Max
400
550
400
450
Unit
ns
kV/µs
Note: All typical values are at T
a
= 25 .
Note 1: Input signal (f = 10 kHz, duty = 10 %, input current t
r
= t
f
= 5 ns or less )
Note 2: The propagation delay skew, t
psk
, is defined as the propagation delay time of the largest or smallest t
pLH
minus
the largest or smallest t
pHL
of multiple samples. Evaluations of these samples are conducted under identical
test conditions (supply voltage, input current, temperature, etc).
2016-02-29
Rev.4.0
©2016 Toshiba Corporation
TLP754F
5
12.
12.
12.
12. Test Circuits and Characteristics Curves
Test Circuits and Characteristics Curves
Test Circuits and Characteristics Curves
Test Circuits and Characteristics Curves
12.1.
12.1.
12.1.
12.1. Test Circuits
Test Circuits
Test Circuits
Test Circuits
Fig.
Fig.
Fig.
Fig. 12.1.1
12.1.1
12.1.1
12.1.1 I
I
I
I
OH
OH
OH
OH
Test Circuit
Test Circuit
Test Circuit
Test Circuit Fig.
Fig.
Fig.
Fig. 12.1.2
12.1.2
12.1.2
12.1.2 V
V
V
V
OL
OL
OL
OL
Test Circuit
Test Circuit
Test Circuit
Test Circuit
Fig.
Fig.
Fig.
Fig. 12.1.3
12.1.3
12.1.3
12.1.3 I
I
I
I
CCH
CCH
CCH
CCH
Test Circuit
Test Circuit
Test Circuit
Test Circuit Fig.
Fig.
Fig.
Fig. 12.1.4
12.1.4
12.1.4
12.1.4 I
I
I
I
CCL
CCL
CCL
CCL
Test Circuit
Test Circuit
Test Circuit
Test Circuit
Fig.
Fig.
Fig.
Fig. 12.1.5
12.1.5
12.1.5
12.1.5 I
I
I
I
O
O
O
O
Test Circuit
Test Circuit
Test Circuit
Test Circuit
Fig.
Fig.
Fig.
Fig. 12.1.6
12.1.6
12.1.6
12.1.6 Switching Time Test Circuit and Waveform
Switching Time Test Circuit and Waveform
Switching Time Test Circuit and Waveform
Switching Time Test Circuit and Waveform
Fig.
Fig.
Fig.
Fig. 12.1.7
12.1.7
12.1.7
12.1.7 Common-Mode Transient Immunity Test Circuit and Waveform
Common-Mode Transient Immunity Test Circuit and Waveform
Common-Mode Transient Immunity Test Circuit and Waveform
Common-Mode Transient Immunity Test Circuit and Waveform
2016-02-29
Rev.4.0
©2016 Toshiba Corporation
TLP754F
6
12.2.
12.2.
12.2.
12.2. Characteristics Curves (Note)
Characteristics Curves (Note)
Characteristics Curves (Note)
Characteristics Curves (Note)
Fig.
Fig.
Fig.
Fig. 12.2.1
12.2.1
12.2.1
12.2.1 I
I
I
I
F
F
F
F
- V
- V
- V
- V
F
F
F
F
Fig.
Fig.
Fig.
Fig. 12.2.2
12.2.2
12.2.2
12.2.2 I
I
I
I
FHL
FHL
FHL
FHL
- T
- T
- T
- T
a
a
a
a
Fig.
Fig.
Fig.
Fig. 12.2.3
12.2.3
12.2.3
12.2.3 I
I
I
I
CCL
CCL
CCL
CCL
- T
- T
- T
- T
a
a
a
a
Fig.
Fig.
Fig.
Fig. 12.2.4
12.2.4
12.2.4
12.2.4 I
I
I
I
CCH
CCH
CCH
CCH
- T
- T
- T
- T
a
a
a
a
Fig.
Fig.
Fig.
Fig. 12.2.5
12.2.5
12.2.5
12.2.5 I
I
I
I
O
O
O
O
- T
- T
- T
- T
a
a
a
a
Fig.
Fig.
Fig.
Fig. 12.2.6
12.2.6
12.2.6
12.2.6 Normalized I
Normalized I
Normalized I
Normalized I
O
O
O
O
- T
- T
- T
- T
a
a
a
a
2016-02-29
Rev.4.0
©2016 Toshiba Corporation

TLP754(F)

Mfr. #:
Manufacturer:
Toshiba
Description:
High Speed Optocouplers Photo-IC 30V VCC 5000 Vrms 1.3mA
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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