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Table 4. Electrical Characteristics
1
(Temperature range -40°C to +85°C) All the parameters are specified @ Vdd =3.3V, T=25°C unless oth-
erwise noted
Notes: 1. The product is factory calibrated at 3.3V.
2. Typical specifications are not guaranteed
3. Minimum resonance frequency Fres=1.5kHz. Sensor bandwidth=1/(2*π*110K*Cload) with Cload>1nF
3 Absolute Maximum Rating
Stresses above those listed as “absolute maximum ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the device under these conditions is not implied.
Exposure to maximum rating conditions for extended periods may affect device reliability.
Table 5. Absolute Maximum Rating
Symbol Parameter Test Condition Min.
Typ.
2
Max. Unit
Vdd Supply Voltage 2.4 3.3 3.6 V
Idd Supply Current mean value
PD pin connected
to GND
0.85 1.5 mA
IddPdn Supply Current in Power
Down Mode
rms value
PD pin connected
to Vdd
25µA
Vst Self Test Input Logic 0 level 0 0.8 V
Logic 1 level 2.2 Vdd V
Rout Output Impedance 80 110 140 k
Cload
Capacitive Load Drive
3
320 pF
Ton Turn-On Time at exit from
Power Down mode
Cload in µF 550*Cload+0.3 ms
Symbol Ratings Maximum Value Unit
Vdd Supply Voltage -0.3 to 7 V
Vin Input Voltage on any control pin (FS, PD, ST) -0.3 to Vdd +0.3 V
A
POW
Acceleration (Any axis, Powered, Vdd=3.3V) 3000g for 0.5 ms
10000g for 0.1 ms
A
UNP
Acceleration (Any axis, Not powered) 3000g for 0.5 ms
10000g for 0.1 ms
T
STG
Storage Temperature Range -40 to +125 °C
ESD Electrostatic Discharge Protection 2 (HBM) kV
200 (MM) V
1500 (CDM) V
This is an ESD sensitive device, improper handling can cause permanent damages to the part
This is a Mechanical Shock sensitive device, improper handling can cause permanent damages to the part
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LIS3L02AS4
3.1 Terminology
3.1.1 Sensitivity
Describes the gain of the sensor and can be determined by applying 1g acceleration to it. As the sensor
can measure DC accelerations this can be done easily by pointing the axis of interest towards the center
of the earth, note the output value, rotate the sensor by 180 degrees (point to the sky) and note the output
value again thus applying ±1g acceleration to the sensor. Subtracting the larger output value from the
smaller one and dividing the result by 2 will give the actual sensitivity of the sensor. This value changes
very little over temperature (see sensitivity change vs. temperature) and also very little over time. The Sen-
sitivity Tolerance describes the range of Sensitivities of a large population of sensors.
3.1.2 Zero-g level
Describes the actual output signal if there is no acceleration present. A sensor in a steady state on an
horizontal surface will measure 0g in X axis and 0g in Y axis whereas the Z axis will measure +1g. The
output is ideally for a 3.3V powered sensor Vdd/2 = 1650mV. A deviation from ideal 0-g level (1650mV in
this case) is called Zero-g offset. Offset of precise MEMS sensors is to some extend a result of stress to
the sensor and therefore the offset can slightly change after mounting the sensor onto a printed circuit
board or exposing it to extensive mechanical stress. Offset changes little over temperature - see "Zero-g
Level Change vs. Temperature" - the Zero-g level of an individual sensor is very stable over lifetime. The
Zero-g level tolerance describes the range of zero-g levels of a population of sensors.
3.1.3 Self Test
Self Test allows to test the mechanical and electric part of the sensor, allowing the seismic mass to be moved
by means of an electrostatic test-force. The Self Test function is off when the ST pin is connected to GND. When
the ST pin is tied at Vdd an actuation force is applied to the sensor, simulating a definite input acceleration. In
this case the sensor outputs will exhibit a voltage change in their DC levels which is related to the selected full
scale and depending on the Supply Voltage through the device sensitivity. When ST is activated, the device
output level is given by the algebraic sum of the signals produced by the acceleration acting on the sensor and
by the electrostatic test-force. If the output signals change within the amplitude specified inside Table 3, than
the sensor is working properly and the parameters of the interface chip are within the defined specification.
3.1.4 Output impedance
Describes the resistor inside the output stage of each channel. This resistor is part of a filter consisting of
an external capacitor of at least 320pF and the internal resistor. Due to the high resistor level only small,
inexpensive external capacitors are needed to generate low corner frequencies. When interfacing with an
ADC it is important to use high input impedance input circuitries to avoid measurement errors. Note that
the minimum load capacitance forms a corner frequency beyond the resonance frequency of the sensor.
For a flat frequency response a corner frequency well below the resonance frequency is recommended.
In general the smallest possible bandwidth for an particular application should be chosen to get the best
results.
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4 Functionality
The LIS3L02AS4 is a high performance, low-power, analog output three axes linear accelerometer packaged
in a SO24 package. The complete device includes a sensing element and an IC interface able to take the infor-
mation from the sensing element and to provide an analog signal to the external world.
4.1 Sensing element
A proprietary process is used to create a surface micro-machined accelerometer. The technology allows to carry
out suspended silicon structures which are attached to the substrate in a few points called anchors and are free
to move in the direction of the sensed acceleration. To be compatible with the traditional packaging techniques
a cap is placed on top of the sensing element to avoid blocking the moving parts during the moulding phase of
the plastic encapsulation.
When an acceleration is applied to the sensor the proof mass displaces from its nominal position, causing an
imbalance in the capacitive half-bridge. This imbalance is measured using charge integration in response to a
voltage pulse applied to the sense capacitor.
At steady state the nominal value of the capacitors are few pF and when an acceleration is applied the maximum
variation of the capacitive load is up to 100fF.
4.2 IC Interface
In order to increase robustness and immunity against external disturbances the complete signal processing
chain uses a fully differential structure. The final stage converts the differential signal into a single-ended one to
be compatible with the external world.
The signals of the sensing element are multiplexed and fed into a low-noise capacitive charge amplifier that im-
plements a Correlated Double Sampling (CDS) at its output to cancel the offset and the 1/f noise. The output
signal is de-multiplexed and transferred to three different S&Hs, one for each channel and made available to
the outside.
The low noise input amplifier operates at 200 kHz while the three S&Hs operate at a sampling frequency of 66
kHz. This allows a large oversampling ratio, which leads to in-band noise reduction and to an accurate output
waveform.
All the analog parameters (zero-g level, sensitivity and self-test) are ratiometric to the supply voltage. Increasing
or decreasing the supply voltage, the sensitivity and the offset will increase or decrease almost linearly. The self
test voltage change varies cubically with the supply voltage
4.3 Factory calibration
The IC interface is factory calibrated for Sensitivity (So) and Zero-g Level (Voff). The trimming values are stored
inside the device by a non volatile structure. Any time the device is turned on, the trimming parameters are
downloaded into the registers to be employed during the normal operation. This allows the user to employ the
device without further calibration.
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E-LIS3L02AS4

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
Accelerometers 3 Axis 2g/6g Linear
Lifecycle:
New from this manufacturer.
Delivery:
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