DAC8043
Rev. E | Page 4 of 16
Parameter Symbol Conditions Min Typ Max Unit
POWER SUPPLY
Supply Voltage V
DD
4.75 5 5.25 V
Supply Current I
DD
Digital inputs = V
IH
or V
IL
500 μA
Digital inputs = 0 V or V
DD
100 μA
1
±1/2 LSB = ±0.012% of full scale.
2
All grades are monotonic to 12 bits over temperature.
3
Using internal feedback resistor.
4
Guaranteed by design and not tested.
5
Applies to I
OUT
; all digital inputs = 0 V.
6
V
REF
= 10 V; all digital inputs = 0 V.
7
Calculated from worst-case R
REF
: I
ZSE
(in LSBs) = (R
REF
× I
LKG
× 4096)/V
REF
.
8
Absolute temperature coefficient is less than 300 ppm/°C.
9
I
OUT
load = 100 Ω , C
EXT
= 13 pF, digital input = 0 V to V
DD
or V
DD
to 0 V. Extrapolated to ½ LSB; t
S
= propagation delay (t
PD
) + 9τ
where τ = measured time constant of the final RC decay.
10
V
REF
= 0 V, all digital inputs = 0 V to V
DD
or V
DD
to 0 V.
11
All digit inputs = 0 V.
12
Calculations from en = √4K TRB
where:
K = Boltzmann constant, J/°K,
R = resistance, Ω,
T = resistor temperature, °K,
B = bandwidth, Hz.
13
Digital inputs are CMOS gates; I
IN
is typically 1 nA at 25°C.
14
Tested at V
IN
= 0 V or V
DD
.
WAFER TEST LIMITS
V
DD
= 5 V, V
REF
= 10 V; I
OUT
= GND = 0 V, T
A
= 25°C.
Table 2.
DAC8043GBC Limit
Parameter
1
Symbol Conditions Min Typ Max Unit
STATIC ACCURACY
Resolution N 12 Bits
Integral Nonlinearity INL ±1 LSB
Differential Nonlinearity DNL ±1 LSB
Gain Error G
FSE
Using internal feedback resistor ±2 LSB
Power Supply Rejection Ratio PSRR ΔV
DD
= ±5% ±0.002 %/%
Output Leakage Current (I
OUT
) I
LKG
Digital inputs = V
IL
±5 nA
REFERENCE INPUT
Input Resistance
R
IN
7
15
kΩ
DIGITAL INPUTS
Digital Input High V
IH
2.4 V
Digital Input Low V
IL
0.8 V
Input Leakage Current I
IL
V
IN
= 0 V to V
DD
±1 μA
POWER SUPPLY
Supply Current I
DD
Digital inputs = V
IN
or V
IL
500 μA
Digital inputs = 0 V or V
DD
100 μA
1
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult a factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
