IRF7509TRPBF

IRF7509PbF
PD - 95397
l Generation V Technology
l Ultra Low On-Resistance
l Dual N and P Channel MOSFET
l Very Small SOIC Package
l Low Profile (<1.1mm)
l Available in Tape & Reel
l Fast Switching
l Lead-Free
HEXFET
®
Power MOSFET
N- Ch P-Ch
V
DSS
3 0 V -30V
R
DS(on)
0.11 0.20
6/15/04
Micro8
Fifth Generation HEXFETs from International Rectifier utilize advanced
processing techniques to achieve extremely low on-resistance per silicon
area. This benefit, combined with the fast switching speed and ruggedized
device design that HEXFET Power MOSFETs are well known for, provides the
designer with an extremely efficient and reliable device for use in a wide variety
of applications.
The new Micro8 package, with half the footprint area of the standard SO-8,
provides the smallest footprint available in an SOIC outline. This makes the
Micro8 an ideal device for applications where printed circuit board space is at
a premium. The low profile (<1.1mm) of the Micro8 will allow it to fit easily into
extremely thin application environments such as portable electronics and
PCMCIA cards.
Description
D1
D1
D2
D2
G1
S2
G2
S1
Top View
8
1
2
3
4
5
6
7
N-CHANNEL MOSFET
P-CHANNEL MOSFET
www.irf.com 1
Parameter Max. Units
N-Channel P-Channel
V
DS
Drain-Source Voltage 30 -30 V
I
D
@ T
A
= 25°C Continuous Drain Current, V
GS
2.7 -2.0
I
D
@ T
A
= 70°C Continuous Drain Current, V
GS
2.1 -1.6 A
I
DM
Pulsed Drain Current 21 -16
P
D
@T
A
= 25°C Maximum Power Dissipation 1.25 W
P
D
@T
A
= 70°C Maximum Power Dissipation 0.8 W
Linear Derating Factor 10 mW/°C
V
GS
Gate-to-Source Voltage ± 20 V
V
GSM
Gate-to-Source Voltage Single Pulse tp<10µS 30 V
dv/dt Peak Diode Recovery dv/dt 5.0 V/ns
T
J
, T
STG
Junction and Storage Temperature Range -55 to + 150 °C
Soldering Temperature, for 10 seconds 240 (1.6mm from case)
Thermal Resistance
Parameter Max. Units
R
θJA
Maximum Junction-to-Ambient 100 °C/W
Absolute Maximum Ratings
IRF7509PbF
2 www.irf.com
Parameter Min. Typ. Max. Units Conditions
N-Ch 30 V
GS
= 0V, I
D
= 250µA
P-Ch -30 V
GS
= 0V, I
D
= -250µA
N-Ch 0.059 Reference to 25°C, I
D
= 1mA
P-Ch -0.039 Reference to 25°C, I
D
= -1mA
0.09 0.110 V
GS
= 10V, I
D
= 1.7A
0.14 0.175 V
GS
= 4.5V, I
D
= 0.85A
0.17 0.20 V
GS
= -10V, I
D
=-1.2A
0.30 0.40 V
GS
= -4.5V, I
D
=-0.6A
N-Ch 1.0 V
DS
= V
GS
, I
D
= 250µA
P-Ch -1.0 V
DS
= V
GS
, I
D
= -250µA
N-Ch 1.9 V
DS
= 10V, I
D
= 0.85A
P-Ch 0.92 V
DS
= -10V, I
D
= -0.6A
N-Ch 1.0 V
DS
= 24 V, V
GS
= 0V
P-Ch -1.0 V
DS
= -24V, V
GS
= 0V
N-Ch 25 V
DS
= 24 V, V
GS
= 0V, T
J
= 125°C
P-Ch -25 V
DS
= -24V, V
GS
= 0V, T
J
= 125°C
I
GSS
Gate-to-Source Forward Leakage N-P  ±100 V
GS
= ± 20V
N-Ch 7.8 12
P-Ch 7.5 11
N-Ch  1.2 1.8
P-Ch 1.3 1.9
N-Ch  2.5 3.8
P-Ch 2.5 3.7
N-Ch 4.7
P-Ch 9.7
N-Ch 10
P-Ch 12
N-Ch 12
P-Ch 19
N-Ch 5.3
P-Ch 9.3
N-Ch 210
P-Ch 180
N-Ch 80 pF
P-Ch 87
N-Ch 32
P-Ch 42
V
(BR)DSS
Drain-to-Source Breakdown Voltage
V
(BR)DSS
/T
J
Breakdown Voltage Temp. Coefficient
R
DS(ON)
Static Drain-to-Source On-Resistance
V
GS(th)
Gate Threshold Voltage
g
fs
Forward Transconductance
I
DSS
Drain-to-Source Leakage Current
Q
g
Total Gate Charge
Q
gs
Gate-to-Source Charge
Q
gd
Gate-to-Drain ("Miller") Charge
t
d(on)
Turn-On Delay Time
t
r
Rise Time
t
d(off)
Turn-Off Delay Time
t
f
Fall Time
C
iss
Input Capacitance
C
oss
Output Capacitance
C
rss
Reverse Transfer Capacitance
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 21 )
Notes:
N-Channel I
SD
1.7A, di/dt 120A/µs, V
DD
V
(BR)DSS
, T
J
150°C
P-Channel I
SD
-1.2A, di/dt 160A/µs, V
DD
V
(BR)DSS
, T
J
150°C
Parameter Min. Typ. Max. Units Conditions
N-Ch 1.25
P-Ch -1.25
N-Ch 21
P-Ch -16
N-Ch 1.2 T
J
= 25°C, I
S
= 1.7A, V
GS
= 0V
P-Ch -1.2 T
J
= 25°C, I
S
= -1.8A, V
GS
= 0V
N-Ch 40 60
P-Ch 30 45
N-Ch 48 72
P-Ch 37 55
Electrical Characteristics @ T
J
= 25°C (unless otherwise specified)
Source-Drain Ratings and Characteristics
V
V/°C
V
S
µA
nC
ns
N-Channel
I
D
= 1.7A, V
DS
= 24V, V
GS
= 10V
P-Channel
I
D
= -1.2A, V
DS
= -24V, V
GS
= -10V
N-Channel
V
DD
= 15V, I
D
= 1.7A, R
G
= 6.1Ω,
R
D
= 8.7
P-Channel
V
DD
= -15V, I
D
= -1.2A, R
G
= 6.2,
R
D
= 12
N-Channel
V
GS
= 0V, V
DS
= 25V,  = 1.0MHz
P-Channel
V
GS
= 0V, V
DS
= -25V,  = 1.0MHz
N-Ch
P-Ch
I
S
Continuous Source Current (Body Diode)
I
SM
Pulsed Source Current (Body Diode)
V
SD
Diode Forward Voltage
t
rr
Reverse Recovery Time
Q
rr
Reverse Recovery Charge
A
V
ns
nC
N-Channel
T
J
= 25°C, I
F
= 1.7A, di/dt = 100A/µs
P-Channel
T
J
= 25°C, I
F
= -1.2A, di/dt = -100A/µs
Pulse width 300µs; duty cycle 2%.
Surface mounted on FR-4 board, t 10sec.
IRF7509PbF
www.irf.com 3
Fig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
Fig 2. Typical Output Characteristics
0.1
1
10
100
0.1 1 10
20µs PULSE WIDTH
T = 25°C
A
J
DS
V , Drain-to-Source Voltage (V)
3.0V
VGS
TOP 15V
10V
7.0V
5.5V
4.5V
4.0V
3.5V
BOTTOM 3.0V
D
I , Drain-to-Source Current (A)
0.1
1
10
100
0.1 1 10
A
DS
V , Drain-to-Source Voltage (V)
D
I , Drain-to-Source Current (A)
20µs PULSE WIDTH
T = 150°C
J
3.0V
VGS
TOP 15V
10V
7.0V
5.5V
4.5V
4.0V
3.5V
BOTTOM 3.0V
0.1
1
10
100
3.0 3.5 4.0 4.5 5.0 5.5 6.0
T = 25°C
T = 150°C
J
J
GS
V , Gate-to-Source Voltage (V)
D
I , Drain-to-Source Current (A)
A
V = 10V
20µs PULSE WIDTH
DS
Fig 4. Typical Source-Drain Diode
Forward Voltage
0.1
1
10
100
0.4 0.8 1.2 1.6 2.0
T = 25°C
T = 150°C
J
J
V = 0V
GS
V , Source-to-Drain Voltage (V)
I , Reverse Drain Current (A)
SD
SD
A
Fig 5. Normalized On-Resistance
Vs. Temperature
0.0
0.5
1.0
1.5
2.0
-60 -40 -20 0 20 40 60 80 100 120 140 160
J
T , Junction Temperature (°C)
R , Drain-to-Source On Resistance
DS(on)
(Normalized)
V = 10V
GS
A
I = 1.7A
D
Fig 6. Typical On-Resistance Vs. Drain
Current
0 2 4 6 8 10
0.060
0.100
0.140
0.180
0.220
R , Drain-to-Source On Resistance
I , Drain Current (A)
D
DS (on)
VGS = 10V
VGS = 4.5V
N - Channel

IRF7509TRPBF

Mfr. #:
Manufacturer:
Infineon / IR
Description:
MOSFET MOSFT DUAL N/PCh 30V 2.4A Micro 8
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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