ESD8011MUT5G

ESD8011
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4
TYPICAL CHARACTERISTICS
Figure 2. Positive TLP I−V Curve
Figure 3. Negative TLP I−V Curve
V
C
, VOLTAGE (V)
201814128420
0
2
6
8
10
14
18
20
TLP CURRENT (A)
4
12
16
610 16 2224
0
2
10
4
6
8
V
IEC
, EQUIVALENT (kV)
V
C
, VOLTAGE (V)
201814128420
0
−2
−6
−8
−10
−14
−18
−20
TLP CURRENT (A)
−4
−12
−16
610 16 2224
0
2
10
4
6
8
V
IEC
, EQUIVALENT (kV)
ESD8011
www.onsemi.com
5
Latch−Up Considerations
ON Semiconductors 8000 series of ESD protection
devices utilize a snap−back, SCR type structure. By using
this technology, the potential for a latch−up condition was
taken into account by performing load line analyses of
common high speed serial interfaces. Example load lines for
latch−up free applications and applications with the
potential for latch−up are shown below with a generic IV
characteristic of a snapback, SCR type structured device
overlaid on each. In the latch−up free load line case, the IV
characteristic of the snapback protection device intersects
the load−line in one unique point (V
OP
, I
OP
). This is the only
stable operating point of the circuit and the system is
therefore latch−up free. In the non−latch up free load line
case, the IV characteristic of the snapback protection device
intersects the load−line in two points (V
OPA
, I
OPA
) and
(V
OPB
, I
OPB
). Therefore in this case, the potential for
latch−up exists if the system settles at (V
OPB
, I
OPB
) after a
transient. Because of this, ESD8011 should not be used for
HDMI applications − ESD8104 or ESD8040 have been
designed to be acceptable for HDMI applications without
latch−up. Please refer to Application Note AND9116/D for
a more in−depth explanation of latch−up considerations
using ESD8000 series devices.
I
I
V
V
ESD8011 Latch−up free:
USB 2.0 LS/FS, USB 2.0 HS, USB 3.0 SS,
DisplayPort
V
OP
V
DD
I
SSMAX
I
OP
ESD8011 Potential Latch−up:
HDMI 1.4/1.3a TMDS
V
OPB
V
OPA
V
DD
I
SSMAX
I
OPB
I
OPA
Figure 4. Example Load Lines for Latch−up Free Applications and Applications with the Potential for Latch−up
Table 1. SUMMARY OF SCR REQUIREMENTS FOR LATCH−UP FREE APPLICATIONS
Application
VBR (min) IH (min) VH (min) ON Semiconductor ESD8000 Series
(V) (mA) (V) Recommended PN
HDMI 1.4/1.3a TMDS 3.465 54.78 1.0 ESD8104, ESD8040
USB 2.0 LS/FS 3.301 1.76 1.0 ESD8004, ESD8011
USB 2.0 HS 0.482 N/A 1.0 ESD8004, ESD8011
USB 3.0 SS 2.800 N/A 1.0 ESD8004, ESD8006, ESD8011
DisplayPort 3.600 25.00 1.0 ESD8004, ESD8006, ESD8011
ESD8011
www.onsemi.com
6
IEC 61000−4−2 Spec.
Level
Test Volt-
age (kV)
First Peak
Current
(A)
Current at
30 ns (A)
Current at
60 ns (A)
1 2 7.5 4 2
2 4 15 8 4
3 6 22.5 12 6
4 8 30 16 8
I
peak
90%
10%
IEC61000−4−2 Waveform
100%
I @ 30 ns
I @ 60 ns
t
P
= 0.7 ns to 1 ns
Figure 5. IEC61000−4−2 Spec
Transmission Line Pulse (TLP) Measurement
Transmission Line Pulse (TLP) provides current versus
voltage (I−V) curves in which each data point is obtained
from a 100 ns long rectangular pulse from a charged
transmission line. A simplified schematic of a typical TLP
system is shown in Figure 6. TLP I−V curves of ESD
protection devices accurately demonstrate the product’s
ESD capability because the 10s of amps current levels and
under 100 ns time scale match those of an ESD event. This
is illustrated in Figure 7 where an 8 kV IEC 61000−4−2
current waveform is compared with TLP current pulses at
8 A and 16 A. A TLP I−V curve shows the voltage at which
the device turns on as well as how well the device clamps
voltage over a range of current levels.
Figure 6. Simplified Schematic of a Typical TLP
System
DUT
L
S
÷
Oscilloscope
Attenuator
10 MW
V
C
V
M
I
M
50 W Coax
Cable
50 W Coax
Cable
Figure 7. Comparison Between 8 kV IEC 61000−4−2 and 8 A and 16 A TLP Waveforms

ESD8011MUT5G

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
TVS Diodes / ESD Suppressors ULTRA LOW CAP SCR
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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