BAT46WJ All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 2 — 8 November 2011 7 of 12
NXP Semiconductors
BAT46WJ
Single Schottky barrier diode
8. Test information
The current ratings for the typical waveforms as shown in Figure 7, 8 and 9 are
calculated according to the equations: with I
M
defined as peak current,
at DC, and with I
RMS
defined as RMS current.
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
(1) I
R
=1mA
Input signal: reverse pulse rise time t
r
= 0.6 ns; reverse voltage pulse duration t
p
= 100 ns; duty cycle =0.05
Oscilloscope: rise time t
r
=0.35ns
Fig 10. Reverse recovery time test circuit and waveforms
t
rr
(1)
+ I
F
t
output signal
t
r
t
p
t
10 %
90 %
V
R
input signal
V = V
R
+
I
F
×
R
S
R
S
= 50
Ω
I
F
D.U.T.
R
i
= 50
Ω
SAMPLING
OSCILLOSCOPE
mga881
Fig 11. Duty cycle definition
t
1
t
2
P
t
006aaa812
duty cycle δ =
t
1
t
2