PESD3V3X1BL_1 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 01 — 6 January 2009 5 of 11
NXP Semiconductors
PESD3V3X1BL
Ultra low capacitance bidirectional ESD protection diode
Fig 4. ESD clamping test setup and waveforms
006aab413
50 Ω
R
Z
C
Z
DUT
(DEVICE
UNDER
TEST)
GND
GND
450 Ω
RG 223/U
50 Ω coax
ESD TESTER
IEC 61000-4-2 network
C
Z
= 150 pF; R
Z
= 330 Ω
4 GHz DIGITAL
OSCILLOSCOPE
10×
ATTENUATOR
GND
GND
unclamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
clamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network) pin 1 to 2
unclamped −8 kV ESD pulse waveform
(IEC 61000-4-2 network)
clamped −8 kV ESD pulse waveform
(IEC 61000-4-2 network) pin 1 to 2
vertical scale = 2 kV/div
horizontal scale = 15 ns/div
vertical scale = 20 V/div
horizontal scale = 100 ns/div
vertical scale = 20 V/div
horizontal scale = 100 ns/div
vertical scale = 2 kV/div
horizontal scale = 15 ns/div