83908I-02 Data Sheet
©2016 Integrated Device Technology, Inc Revision A March 17, 20167
TABLE 6E. AC CHARACTERISTICS, V
DD
= 2.5V ± 5%, V
DDO
= 1.8V±0.2V, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output Fre-
quency
w/external XTAL 10 40 MHz
w/external CLK 200 MHz
tp
LH
Propagation Delay, Low-to-High;
NOTE 1
1.7 2.6 3.5 ns
tsk(o) Output Skew; NOTE 2 70 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 3 700 ps
tjit(Ø) RMS Phase Jitter, Random; NOTE 4 25MHz XTAL, (12kHz-10MHz) 0.37 ps
t
R
/ t
F
Output Rise/Fall Time 20% to 80% 200 800 ps
odc
Output
Duty Cycle
w/external XTAL
ƒ ≤ 38.88MHz
45 55 %
w/external CLK
ƒ ≤ 133MHz
47 53 %
t
EN
Output Enable Time; NOTE 5 10 ns
t
DIS
Output Disable Time; NOTE 5 10 ns
NOTE 1: Measured from V
DD
/2 of the input to V
DDO
/2 of the output.
NOTE 2: This parameter is defi ned in accordance with JEDEC Standard 65.
NOTE 3: Defi ned as skew between outputs on different devices operating a the same supply voltages and
with equal load conditions. Using the same type of input on each device, the output is measured at V
DDO
/2.
NOTE 4: Phase jitter is dependent on the input source used.
NOTE 5: These parameters are guaranteed by characterization. Not tested in production.
